prototype PCB for on detector chip integration

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Presentation transcript:

prototype PCB for on detector chip integration D.Cuisy, J. Fleury, C. de La Taille

Introduction This presentation is addressing PCB issues from the detector to the edge of the slab The issues are : Keep active layer thin for moliere Radius For ECAL thickness and coil cost Keep crosstalk around .1% Keep cost low or at least reasonnable Ensure a good assembling yield

The TDR option Si Wafer PCB Front-end Lenght >1.5m Very front end electronic on the edge of every slab Single long PCB for each detection layer (1.5m long) Long lines carriing isgnals to the VFE electronic Crosstalk issues Noise issues Thickness issues Si Wafer PCB Front-end Lenght >1.5m

The physic prototype (2003) Can’t extrapolate to a full detector length 6 active wafers Made of 36 silicon PIN diodes 216 channels per board Each diode is a 1cm² square 12 FLC_PHY2 front-end chip 18 channels per chip 13 bit dynamic range Line buffers To DAQ part Differential 14 layers 2.1 mm thick Made in korea

Embedded chip - the cooled option (2004) Tungsten Si Wafers PCB VFE chip Cooling 8.5mm

The not-cooled option (2005) Due to power pulsing first encouraging results Power consumption divided by 100 in the slab Cooling can be done without liquid Thinner Simpler Cheaper FE chip (1mm) Wafer (500µm) PCB (600µm) 1750µm Pictures : M. Anduze

The not cooled not packaged option (FEV4)

FEV4 : New PCB description Compatible physics prototype Same size as FEV3 1 active wafer (instead of 2 for FEV3) Chip buried in the PCB

FEV4 – stack up description SIG/GND GND VCC PADS TOP L2 Single sided L3 Double sided L4 Double sided 950µm L5 L6 Double sided L7 BOT Single sided ILC_PHY4

FEV4 – signal density Difficulty are already foreseen to carry signals from one stitchable PCB to another

FEV4 duty Chip on board test Thin PCB coupling measurement First prototype of chip in board Thin PCB coupling measurement Chip in beam test Technology is 0.35µ Analog part is very close to final version Digital missing Power pulsing test

FEV4 – missing features 5*5 mm² pads Stitching Daisy chain Flat buried chip ILC_PHY4

conclusion PCB is a key issue for the eudet module assembling. PCB is not only holding FE and wafer and is a major part for the detector performance. Crosstalk Pickup noise