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Electronics for Si-W calorimeter LCWS06 Bangalore – March, 10 th Gérard Bohner, Pascal Gay, Jacques Lecoq Samuel Manen, Laurent Royer Michel Bouchel, Bernard.

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Presentation on theme: "Electronics for Si-W calorimeter LCWS06 Bangalore – March, 10 th Gérard Bohner, Pascal Gay, Jacques Lecoq Samuel Manen, Laurent Royer Michel Bouchel, Bernard."— Presentation transcript:

1 Electronics for Si-W calorimeter LCWS06 Bangalore – March, 10 th Gérard Bohner, Pascal Gay, Jacques Lecoq Samuel Manen, Laurent Royer Michel Bouchel, Bernard Bouquet, Julien Fleury Christophe de La Taille, Gisèle Martin, Roman Poeschl

2 General introduction

3 General overview of Si-W calo CALICE ECAL proposal (LDC) : Octogonal shape 40 identical structures Active materials in detector slab 30-120 Million channels Depending on pad size (1cm or.5cm) Electronic requirement : Electronic embedded in the slab Ultra-low power consumption (~100µW/Ch) To avoid active cooling Ultra-thin design To reduce moliere radius R&D on a technologic prototype as started

4 EUDET framework European funding for ILC detectors CALICE labs are members of JRA3 (Joint Reasearch Activities for calorimeters) Part of this funding will be used to build a technologic prototype of ECAL EUDET is a 4-year funding program  Technologic prototype is a 2009 deliverable That technologic prototype has to be as close as possible to final design

5 EUDET : ECAL emodule Electromagnetic calorimeter technologic prototype Prototype of a (~ 1/6) module 0 : one line & one column 150 cm long, 12 cm wide 30 layers 1800 + 10800 channels Test full scale mechanics + PCB Can go in test beam Test full integration + edge communications Similar in #channels as physics prototype ©M. Anduze (LLR)

6 R&D on PCBs

7 Thickness considerations Chip in the detector Thickness Ultra-thin PCB Chip burried in PCB FE chip (1mm)Wafer (500µm)PCB (600µm) 1750µm diodes+ FE electronic

8 Length considerations Industry can’t build 1.5m PCB Stitchable PCBs (no room for cables) Feasability prototypes in fab PCB type 1PCB type 2PCB type 3 Glue ? Solder ? 1.5m

9 Front-end chip R&D

10 Requirements for FEE Ultra-low dissipation (100µW/ch) involves : Self-triggered ASIC : Zero-suppress on the chip On chip A/D conversion and memory to buffer outputed data Ultra-thin design involves : Stand-alone ASIC : no room for decoupling capacitance Huge number of channels involves : System on Chip : all features have to be integrated Calibration, ADC, analogue memory, digital memory, BCID, back- end bus, etc.  Chip output : digital formated data

11 Power comsumption & integration The critical issue : power consumption ATLAS FEB 1W/Ch 400*500mm - 1998 FLC physic proto 5mW/Ch 10*10mm - 2002 ILC 100µW/Ch 2010

12 Power flexing : pulsed electronic time Time between two trains: 200ms (5 Hz) Time between two bunch crossing: 337 ns Train length 2820 bunch X (950 us) Acquisition 1ms (.5%) A/D conv..5ms (.25%) DAQ.5ms (.25%) 1% duty cycle IDLE MODE 99% duty cycle 199ms (99%)  See ILC_PHY4 results Based on TESLA TDR

13 On chip formated data ADC result - 12 bit BCID – 12 bit Gain - 2 bit Channel nb - 6 bit Chip ID - x bit PositionEnergyTime  32bits / event without Chip ID

14 Data rates Assuming TESLA like bunch structure Bunch crossing period within bunch train = 176ns ~ 200ns Number of crossings per bunch train = 4886 ~ 5000 Bunch train length = 860µs ~ 1ms Bunch train period =250ms ~ 200ms Raw Data volume 2 bytes Energy data/Channel, 20 Million channels Raw data per bunch train ~ 20M  5000  2 ~ 200GBytes ECAL No way to digitize inside the ~ ms train 10 kbytes/channel/train ~ 50 kbytes/ch/s Physics data rate : 90 Mbytes/train = ~20 bytes/ch/s Zero suppression mandatory 10 3 rate reduction -> drastic for power dissipation Digitize only signals over 1/2MIP with noise < MIP/10 Allow storage in front-end ASIC

15 R&D building blocks

16 High dynamic range structure Low noise charge preamp 3 integration shaper (G. 2, 20 & 100)

17 Functionaality test SimulationMeasurement (Oscilloscope) Gain 2 Gain 20 Gain 100

18 Linearity measurement Gain 2 : NL 4 ‰ Gain 100 : NL 7 ‰ Gain 20 : NL 4 ‰

19 Pipeline ADC Vin b1b2b3b4b5b6b7b10 b9 b8 10 bits ADC → 10 stages Comparator V ref V IN Amplifier Gain=2 V ref Gnd Bit N out To V IN stage N+1 Stage N of pipeline ADC block schema

20 Pipeline ADC measurement  Gain : 2.015 instead of 2  Offset : 18mV (cumulated)  1.5 bit/stage correction  integral non linearity ±2 LSB

21 ILC_PHY4 : a first step toward final ASIC 18 channels Multi gain charge preamp (167mV/pC  2.5V/pC) Dual shaper gain 1&10 2 track and hold Switchable calibration injection capacitance 2 analogue multiplexers 18  1 One for gain 1 and one for gain 10 The two MUX output are MUX to a single output 1 ADC – 12 bit / 1MSPS – IP from AMS (founder) An internal bias device including : Internal decoupling on current sources Idle mode on whole analogue parts of the chip

22 ILC_PHY4 layout & status -Chip produced & packaged -Test board produced - Missing test board firmware  Ready before summer Test to be performed April/May 06 12 bits ADC IP

23 Power pulsing on ILC_PHY4 Tested on a stand-alone preamp Switching from idle current (i/1000) to nominal On-setting time < 20 µs Pulse amplitude and noise identical in pulsed mode than in steady mode Allows to reduce power by 99% with beams 2ms/200ms Target power of 100 µW/channel appears within reach : to be validated in testbeam in 2006 with ILC_PHY4 ASIC ON signal Ready for pulse RFCFRFCF 20 µs Log scales !

24 Schedule Multi channel prototype foundry planned in spring06 including : Analogue front-end Power pulsed Self-biased Self-trigger Pipeline ADC (LPCC) Stitchable PCB planned for october06

25 Conclusions CALICE collaboration help by EUDET (european funding) will built a technological prototype as close as possible to the final detector. That technological prototype will validate the feasibility of the full detector Many ASIC R&D are performed to have all the building blocks before the end of the year Thin stitchible PCBs are currently in design.

26 Spare slides

27 Test plans

28 Front-end ASIC in a EM shower Summer 06 @CERN with FLC_PHY3 + FEV3

29 A/D conversion on chip ILC_PHY4 test to check mixed chip performance New foundry LPC+LAL with LPC 12-bit pipeline ADC


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