Hybrid & Module Testing Status

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Presentation transcript:

Hybrid & Module Testing Status Week of 4/11-4/15

UCSB Hybrid Testing Status Weekly Cumulative   Pass Fail % Pass L12pd 0.00% L34p 40 1 254 3 98.83% L56p 46 344 8 97.73% R5N 65 2 97.01% R5S 100.00% R6 87 98.86% R7 Total 796 14 98.27% Failing Hybrids Over-counted

UCSB Hybrid Testing Failures This Week 1 with short in PA Cumulative 6 with Shorts in PA Repairable 1 Major Scratch in PA 1 Smashed APV-PA Bonds 2 Failed Inspection Never should have sent 1 Broken Ceramic 1 Bad Bond Feet 1 Weak Wirebonds 1 with unknown failure

UCSB Hybrid Testing Issues Need to finish validation of new software Bruno contacted about bugs/features Need to add automatic upload of data to new software Hybrids with shorts need repairing Once repaired need to keep bookkeeping straight

FNAL Hybrid Testing Status Weekly Cumulative Hybrid ID Rec’ed Pass Fail %Pass PLL (%) 2.2.1.220 R2S 2.2.2.210 R2D 2.2.1.520 R5S 2.2.2.510 R5D 2.1.1.600 R6U 3.2.1.500 L56p 233 230 3 98.71 78 (33.48) 3.1.1.110 L34p&L12pu 267 91 4 256 11 95.88 89 (33.33) 3.1.2.110 L12pd 3.1.2.120 L12su L12sd Total 500 486 14 97.20 167 (33.40) 86 hybrids received last week not included

Fermilab Hybrid Testing Failures This Week 1 with Shorts in PA 2 all chips noisy & shorted 1 2 open, 3 noisy channels (may pass if eliminate edge channels) Cumulative 5 with Shorts in PA 7 Noisy channels-usually entire chip or chips 1 a few open and noisy channels

FNAL PLL Statistics No obvious correlation

Fermilab Hybrid Testing Issues Running 7_2 ARCS code (original) Need the version (6.1) on new PC working I would like to try a few things to shorten run time Run takes 55 minutes! Noisy edge channels —> re-testing, raised noise cut from 1.3 to 1.6 ADC counts Cooling to –17, using mid-range temp sensor shortened time

UCSB ARCS Testing Status Weekly Cumulative   A B F % A or B L12pu 0.00% L12pd L12su L12sd L34p 85 1 2 97.73% L56p 49 194 98.98% R5N 6 32 97.06% R5S R6 3 9 100.00% R7 Total 58 320 5 98.48%

UCSB ARCS Testing Failures This Week 1 with >20 mA Bias Current Scratched sensor Cumulative 1 with >2% Bad Channels Debris on sensor 1 Bad DCU 1 HV Shorted to CF Frame 2 with >20 mA Bias Current 1 leaky pinhole 1 scratched sensor

UCSB ARCS Testing Issues Need to confirm cuts on TEC modules Getting some confusion between 1SO/2SO Have not produced TEC R6 modules in a year Still need to validate ARCS 8.0 Currently using ARCS 7.2bugfix

UCSB Module Quality On 328 modules using HPK modules: 18 pinholes 47 shorts 45 noisy channels 86 opens Percentage of bad channels: 0.09%

FNAL ARCS Testing Status Weekly Cumulative   A B F % A or B L12pu 0.00% L12pd L12su L12sd L34p L56p 46 2 152 1 3 98.1% R5N R5S R6 6 R7 Total

FNAL ARCS Testing Failures This Week (7949-7996) one unexpected pinhole - pulled (mod 7955 # 768) 7972 – no readout (does not find APVs) 7970 - breakdown current behavior @430V (see plots) Cumulative (7835-7996) 1 grade “B” (mishandling) 2 HV or high current problems 1 – no readout Total of 7 pinholes so far

IVs for module 7970 Test 1: 19mA Graded as “A” 23mA Test 2: Graded as “F” Unstable current beyond 400 V No high noise channel found Graded “A/F”

UCSB LT Testing Status Weekly Cumulative Pass Fail % Pass L12pu 0.00%   Pass Fail % Pass L12pu 0.00% L12pd L12su L12sd L34p 84 100.00% L56p 47 185 R5N 15 27 R5S R6 6 R7 Total 62 302

UCSB LT Testing Issues We are seeing a low level problem with low noise/mis-initialization of modules Found that there is usually a resistive connection between extender and backplane Reseating extender always fixes problem Will need to watch to see if problem is worsening with time

FNAL LT Testing Issues Modules 30200020007883 – 7990 were tested during April 5 – April 18 period. Modules 30200020007883-7889 30200020007979-7990 passed LT testing successfully with grade A. Rest of all runs have problems with cold and last records. Data cannot be processed: afs backup, xml uploading. 80+ modules need to be retested. Problem is being investigated with help from P. Gartung

FNAL LT Testing Issues Details: Problem occurs lt scenario: -10 ChangeCool -20 dummy -60 TempReached dummy dummy -10 HardReset analoff analoff -10 CheckEnv dummy dummy -3600 CheckEnv dummy dummy -10 HardReset pllinit pllinit -10 PedRun i2cpedpeak pedpeak -10 CalProfRun i2ccalpeak calpeak Problem occurs sometime between these lines. While switching the APV modes, FEC Server generates I2C errors for all modules.

FNAL LT Testing Issues Details: Checked: DAQ HW connections, LV power, extension connectors resistance, switching modules slot positions, crosscheck with 4 APV modules from Dec2004-Jan2005 HPK production... Problem is temperature related? Patrick's suggestion: temperature is unstable (too cold), APV's can't initialize ( the reason to put “HardReset analoff” in the scenario ) tried: 12 hrs scenario with -15C in cold result: same I2C errors ( after switching in Deconv mode during CalProfRun ) Problem can be solved by putting extra HardResets? Tried: HardReset before each change of APV's mode result: same I2C errors, but slightly in a different way ( now before PedRun in Peak mode )

FNAL LT Testing Issues Current situation: Rolled back to original 12hrs scenario (without HardResets before each mode switching ), testing 6 modules per run, performed 3 runs: 1 failed, 2 last passed. Patrick suggested to remove HardResets at all. Wim Beaumont is informed, received several suggestions... First records for all tested modules is OK, no difference with ARCS data. Other news: LT chiller fixed and tested with water for leaking, LT stand safety procedure in progress, two technicians trained to reload LT box and run the software.

FNAL LT Testing Status Cumulative Weekly 99.40% 1 168 19 Total 0.00% 19 Total 0.00% R7 R6 R5S R5N 100.00% 71 L56p 98.95% 995 L34p L12sd L12su 12 L12pd L12pu % Pass fFail Pass Fail   Cumulative Weekly