ILC meeting 5/14 A large amount of measurement concerning fundamental property of MPPC 光検出器 MPPC の 基礎特性に関する大量測定 University of tsukuba M2 Hiroko koike 1

motivation The purpose of my work was to measure fundamental properties about 10 samples of MPPC. ・ Gain ・ Noise rate ・ Cross talk probability ・ Leak Current ・ Response Curve The measurement ends about Gain, Noise rate, Cross talk probability, Leak Current. 2

Setup ： Gain Clock Generator DiscriminatorGate Generator Width 55ns CAMAC ADC Gate Analog in LED MPPC Thermostatic chamber(25 ℃ ) Voltage source Function Generator ×63 AMP pc PCIRS232C delay 1kHz ７５．６～７９． ０ V ΔV ＝０．２ V 3

Result:Gain Capacitance : 1.78±0.01[PF] 。 [PF] ＃１０９２ 4

Breakdown voltage : 74.18±0.05[V] The difference between 10 sample is not seen. [V] ＃１０９２ Breakdown voltage 5

Gain Gain[× １０ ５ ] Gain （ 5.34±0.03 ） ×10 ５ Demand v alue ・・・・ OK [sample number] 6

Setup ： Noise rate Clock Generator Discriminator Gate Generator Width 0.5s Scaler 3ch gate analog 1ch MPPC Thermostatic chamber(25 ℃ ) CAMAC Discri Width 15ns NIM ECL Voltage source PCI PC RS232C A GPIB Width 5ns ×61 AMP ×10 AMP ７３．５～７９． ２ V ΔV= ０． ２ V ｔｈ ＝１５ ｍ V ～１００ ０ｍ V 7

Noiserate: 0.5p.e. Over +3V [KHz] Noiserate of 10 samples in the bias of Over+3V is obtained. 0.5p.e. : 997.8±191.5[kHz] 1MHz is exceeded according to the sample. [sample sumber] 8

In the same way, Noiserate of 10 samples in the bias of Over+3V about 1.5p.e. is obtained ±4.83[kHz] [kHz] [sample number] Noiserate: 1.5p.e. 9

Crosstalk probability Crosstalk probability : 9.71±0.13[%] Over+3V 10 [kHz] [sample number]

Setup: Leak current Clock Generator Discriminator Gate Generator Width 0.5s Scaler 3ch gate analog 1ch MPPC Thermostatic chamber(25 ℃ ) CAMAC Discri Width 15ns NIM ECL Voltage source PCI PC RS232C A GPIB Width 5ns ×61 AMP ×10 AMP ７３．５～７９． ２ V ΔV= ０． ２ V ｔｈ ＝１５ ｍ V ～１００ ０ｍ V 11

Leak Current ＃１０９２ Over +3V [nA] [sample number] [nA] Leakcurrent of 10 samples in the bias of Over+3V is 97.8±15.2[nA] The difference between 10 samples was seen. 12

Noiserate is noise which was generated by the career of the dark current generated in heat. Noiserate(0.5p.e. ＆ 1.5p.e.)×Gain×e ＝ Leak Current ( )×10 3 ×5.3×10 5 ×1.6× = × ≒ 92.66×10 -9 =92.66[nA] Leakcurrent of 10 samples in the bias of Over+3V is 97.8±15.2[nA] 13

Setup ： Response Curve Clock Generator NIM Fixed DELAY Laser Source CAMAC RELAY CAMAC RELAY NIM Fixed DELAY Gate Generator Thermostatic chamber(25 ℃ ) Polarized Controller Attenuator 16dB Gate Analog CAMAC ADC H.V Power Supply 700V Voltage Power Supply Over 3V MPPC out in out in out in 200ns polarizing plate PC RS232C PCI 14

No1101 Peak of PMT Relationship between palse hight of Angle of polarizing plate and mean of PMT. No1104 No1092 No １０ ９４ Angle transition frequency （ ×4.5° ） 15

No1099 No1097 No1098 約４９．５ ° から約９９． ０ ° のとき、入ってくる光 量が減少する。 No1094 のサンプルだけ変 化の仕方が違う。 No

No1096 As for sample 1094,1093,1096, the difference was seen in the change in the amount of incident light compared with another. 17

Relationship between palse hight of Angle of polarizing plate and mean of MPPC. No1101 No1104 No1101 No1092 No1094 No

No1099 No1097 No1098 MPPC の分布でも No1094 のみ 角度によって光量の変化の違 いが見られた。 No

No1096 MPPC seems to be different sample 1093,1096,1094 and be different the method of the change from another as well as PMT. ↓ The graph of the response curve is compared. 20

ResponseCurve No1101No1094 Ｘ軸： PMT の ADCcount Ｙ軸： MPPC の応答 p.e. No1096 N01093 No

plan ① A large amount of measurement of response curve of MPPC unit. Remeasuring of responsiveness curve with new laser is important. Two polarizing plates are used. ②A large amount of measurement of response curve when scintillator is passed. ③ Measurement of response curve by temperature change. (scintillator is passed) 22