DARE180U Platform Improvements in Release 5.6

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Presentation transcript:

DARE180U Platform Improvements in Release 5.6 Giancarlo Franciscatto

OUTLINE Introduction Design flow History Platform updates Libraries and IP Future work

DARE180U PLATFORM INTRODUCTION Radiation hardened ASIC design platform Commercial UMC 0.18µm CMOS technology Space and high-energy physics applications up to 1 Mrad Supported by ESA ITAR free components “DARE library”  DARE180U platform Libraries, IP and design services Cost efficient -> commercial technology Flexible -> users can build their own IP (ADK) Known as “DARE180 library” Not just libraries, but a design platform => combines libraries, IP and services

DARE180U PLATFORM DESIGN FLOW RTL Netlist DARE180U Libraries Front-end design DARE180U IP Third-party IP DARE180U Libraries Optional service provided by imec IC-link Back-end design imec IC-link only  rad hard design verification Fabrication Assembly Optional support services provided by imec IC-link Synthesis can be done by imec or user/customer Physical implementation done at imec to validate it for radhard Test & Qualification

DARE180U PLATFORM HISTORY Release 5.6 (imec) 2002 2010 2011 2013 2017 2018 Release 1.0 (ESA) CORE I/O SRAM LVDS PLL DARE+ project (ESA) Release 5.5 Release 5.6 (imec) Release 4.1 First flight models KNUT chip (TESAT) TRL-9 status achievement Hispasat36W-1 satellite launch KNUT chip + antenna chip (Arquimea) First publication in 2002 First flight model in 2010 by TESAT Major review under ESA project DARE+ -> ended up with release 5.5 Flight mission qualification in 2017 with Hispasat launch -> TRL-9 status -> flight heritage

PLATFORM UPDATES General updates common to all libraries

Platform Updates ADK CALIBRATED ELT model DARE180U ADK ELT Pcell + simulation models + verification and extraction rules Equivalent W/L CERN model Good fit for drive strength Underestimates gate capacitances (∝ W*L) for small transistors Assumes symmetric drain/source overlap capacitances Improvements in version 5.6 Validated equivalent W/L with test measurements Accurate for NMOS -5% deviation for PMOS with small B and H Gate channel and overlap capacitances calculation based on inner/outer geometries DARE180U uses ELT for high TID threshold Test measurements done in DARE+ test chip

Platform Updates Analog-on-top design support Aid customer IP design using DARE180U library building blocks Full layout cell replacement and radiation/physical verification done by imec Delivered views OpenAccess symbols for schematic design Encrypted netlists for simulation Abstracts and netlists for black-box LVS

Libraries and IP

Libraries AND IP SUMMARY CORE library I/O library LVDS library Bond pad library (new in 5.6) SRAM compiler Other IP (PLL, ADC, POR...)  later

Libraries AND IP CORE Library SEU hardened sequential cells SET hardened cells for asynchronous and clock trees Regular combinational cells for data paths New in version 5.6 Optimized cell layouts for sensitive area Added SET-hardened voter cell for TMR support (60 MeV.cm2/mg) New timing characterization data Calibrated ELT model  slower PMOS + higher gate capacitance ~ 10% delay degradation

Libraries AND IP CORE Library Layout optimization for sensitive area More efficient ELT aspect ratio Using outer diffusion nodes for less critical nodes Chip Design # Cells Area v.5.5 Area v.5.6 Difference A 377769 40.146 mm2 39.803 mm2 -0.85% B 206548 20.994 mm2 20.904 mm2 -0.43% C 195267 14.819 mm2 14.634 mm2 -1.25% Improved sensitive area while keeping same cell area

Libraries AND IP I/O AND LVDS Libraries 3.3V digital and analog I/O Standard LVDS receiver and driver cells Support to multi-domain I/O rings New in version 5.6 Extended support to multi-domain I/O rings New breaker cell types Better support for analog and mixed-signal New 1.8V analog I/O and supply cells  isolated 1.8V analog I/O domains New 3.3V analog I/O cell variants Improved reliability through better metallization Mainly to extend support to multi-domain and mixed signal For the first time, 1.8V analog I/O cells

Libraries AND IP BOND PAD LIBRARY Previously distributed in I/O and LVDS libraries New separate library in version 5.6 New bond pad opening size options Added IP specific double bond pad cells Reduced parasitic capacitance by 40% Incorporated bond pads from I/O and LVDS cells

Libraries AND IP SRAM Compiler Single and dual port blocks 256 to 256K bits Write-mask option Bit interleaving 4, 8, 16, 32 or 64  MBU immunity SEU insensitive possible with EDAC New in version 5.6 Optimized top-level supply routing Better decoupling and reliability New timing characterization data with calibrated ELT model Automated top-level supply routing for optimal rail count and decoupling

FUTURE WORK

Future WORK Version 5.7 1.8V digital I/O cells Distributed Power-On Control GPIO cells LVDS cold-spare and failsafe

Questions? dare_support@imec.be Hispasat36W-1 launch Kourou, French Guyana January 28th, 2017 Questions? dare_support@imec.be