1. Traceability Japan TC Chapter Liaison Report
October 27, 2015
R0.1
To: North America Fall 2015 Meetings

2. Traceability Japan TC Chapter
Outline
Leadership
Organization Chart
Meeting Information
Document Review Summary
Approved SNARF
Upcoming Ballot
TF reports
Fall 2015
Traceability Japan TC Chapter

3. Traceability Japan TC Chapter
Leadership
Committee Co-chairs
Yoichi Iga (Self)
Hirokazu Tsunobuchi (Keyence)
Fall 2015
Traceability Japan TC Chapter

4. Traceability Japan TC Chapter Organization Chart
Traceability Committee
Yoichi Iga (Self)
Hirokazu Tsunobuchi (keyence)
Japan PV Traceability TF
Yoichi Iga (Self)
Hirokazu Tsunobuchi (Keyence)
5 Year Review TF
Kazuhiro Tsunobuchi (Keyence)
Fiducial Mark Interoperability TF
I&C Committee: M. Matsuda (Hitachi Kokusai Electric)
PI&C Committee: S. Mashiro (Tokyo Electron)
Silicon Wafer Committee: T. Nakai (SUMCO) Packaging Committee: S. Masuchi (DISCO)
Traceability Committee: H. Tsunobuchi (KEYENCE)
Fall 2015
Traceability Japan TC Chapter

5. Traceability Japan TC Chapter
Meeting Information
Last meeting
December 5, 2014 in conjunction with SEMICON Japan 2014
Tokyo Big Sight Conference Tower, Tokyo, Japan
Next meeting
December 18, 2015 in conjunction with SEMICON Japan 2015
Fall 2015
Traceability Japan TC Chapter

6. Approved SNARF by GCS on June 30, 2015
Doc #
Description TF
5890
Revision to SEMI T “Specification for back surface marking of double-side polished wafers with a two-dimensional matrix code symbol”
Fiducial Mark Interoperability TF
Fall 2015
Traceability Japan TC Chapter 6

7. Traceability Japan TC Chapter
Ballots to be reviewed at Japan Standards Winter 2015 Meetings in conjunction with SEMICON Japan 2015
Cycle
Doc #
Description TF
5890
Revision to SEMI T “Specification for back surface marking of double-side polished wafers with a two-dimensional matrix code symbol”
Fiducial Mark Interoperability TF
Fall 2015
Traceability Japan TC Chapter 7

8. Traceability Japan TC Chapter
Task Force Updates [1/3]
5 years review Task Force
Leader
Hirokazu Tsunobuchi (KEYENCE)
Current activity
T12, T13 and T19 to be reviewed for 5-Year-Review at the next meeting of Traceability Japan TC Chapter on December 18, 2015
Fall 2015
Traceability Japan TC Chapter

9. Traceability Japan TC Chapter
Task Force Updates [2/3]
Japan PV Traceability TF
Co-leaders
Yoichi Iga (Self)
Hirokazu Tsunobuchi (KEYENCE)
Charter
The objective is to define and elaborate several standards to unify PV traceability from the sliced wafer to the end of PV cell life－cycle.
Scope
The activities of the task force will result in the development of several industry standards where equipment suppliers, cell manufacturers, PV module manufacturers, PV users and other involved parties can find conformity, in any technical field of PV traceability. Initial work will focus on
Marking of ID to identify a product
Means to identify as a right product
Security countermeasure to realize other Traceability depending on need
Anti-Counterfeiting
Activity
TF decided to discontinue Doc. 5594, New Standard: Guide for Smart Label for PV Traceability, which was reported at Traceability Japan TC Chapter meeting on Dec. 6 in conjunction with SEMICON Japan 2013
Fall 2015
Traceability Japan TC Chapter

10. Traceability Japan TC Chapter
Task Force Updates [3/3]
Fiducial Mark Interoperability TF
T7 issues
Traceability Japan TC Chapter assigned following up the activity for T7 to Fiducial Mark Interoperability TF
Section 2.1 (T7 adoption of non-silicon materials)
Figure 3 small modification
M20 coordinate system (based on negative to 5752 [withdrawn])
TF decided to delete all position specifications from SEMI T7 because position specifications are also described on SEMI M1 and other related Silicon Standard.
SNARF was approved by GCS. (SNARF 5890)
Document 5890 was submitting to Cycle 7.
To be adjudicated at the next Japan TC Chapter meeting of Traceability Global TC in conjunction with SEMICON Japan 2015.
Others
Silicon: Give up to develop new Standard for 450mm Development Wafer with fiducial Mark
Assembly and Packaging: Discussing backend alignment issues with introducing fiducial mark wafer.
Fall 2015
Traceability Japan TC Chapter

11. Traceability Japan TC Chapter Liaison Report Thank You!
End of
Traceability Japan TC Chapter
Liaison Report
Thank You!
For more information, please contact Chie Yanagisawa at SEMI Japan
Fall 2015
Traceability Japan TC Chapter 11