MS, LG, XS PXL ladder tests at IPHC, May 1-7, Preliminary Ladder Testing Results (part 2) At IPHC MS, XS, LG
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Outline New running conditions Noise and FPN Offset variation Normal readout mode – Self-induced noise – Ladder induced noise
MS, LG, XS PXL ladder tests at IPHC, May 1-7, New running conditions Using EX354RT lab power supply for VDD ladder and VDD buffers. – Developed noise pickup (?) that triggers overcurrent protection on our standard power modules Added 9 × 100 nF decoupling capacitors on VDD (1 per sensor, except for sensor 5) Bypassed bond wires for VDD and GND
MS, LG, XS PXL ladder tests at IPHC, May 1-7, New running conditions Thick sensor cable HIGH threshold settingsLOW threshold power supply3.68 (term. 3.65) (MTB 3.318) 3.68 (term. XX) (MTB 3.317) Sensor power Driver power Begin low mass section GND8 mV9 mV power End of ladder power End of ladder GND29 mV32 mV
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Noise
MS, LG, XS PXL ladder tests at IPHC, May 1-7, FPN
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Noise FPN
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Offset variation
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Normal mode readout: self-induced noise 9 5×5× -1 mV-2 mV-3 mV A B45233 k2.3 M2.7 M C1.0 k33 k2.3 M2.6 M D k5.6 k5.7 k Sensor 2, others HIGH thresholds (sub-array A fixed 5× )
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Ladder induced noise Sensor 2, others LOW thresholds Sensor 2 thresholds: 5× , - 1 mV, -2 mV
MS, LG, XS PXL ladder tests at IPHC, May 1-7, Summary Significant improvement with 9 decoupling capacitors Additional testing needed with full capacitor complement – Including repeatability Implications for ladder design: – TBD but likely a separate-power cable version