1. MS IPHC-LBL phone meeting, May 29, 2012 1 1 1 Ladder Testing at IPHC (Preliminary Results)

2. MS IPHC-LBL phone meeting, May 29, 2012 2 2 2 Outline Running conditions Threshold scan repeatability (initial) Noise and FPN performance Additional studies (normal RDO mode) Noise and FPN in two operating states Threshold offset in two operating states Summary

3. MS IPHC-LBL phone meeting, May 29, 2012 3 3 Running conditions Using EX354RT lab power supply for VDD ladder and VDD buffers. 9 × 100 nF decoupling capacitors on VDD (1 per sensor, except for sensor 5) Bypassed bond wires for VDD and GND NEW: 2 × 100 nF decoupling capacitors on VCLP (sensors 3 (C7) and 4 (D3)

4. MS IPHC-LBL phone meeting, May 29, 2012 4 4 Threshold scan repeatability (initial) chiprunsnoiseOffset D3204 x 2.1 mV vs. 1.3 mV4 x up to 5 DAC E220OK B610OKup to 2 DAC C210OK3 x up to 6 DAC C7102 x 2.1 mV vs. 1.5 mV3 x up to 5 DAC (2,3,4,5) D510OKup to 2 DAC D710OK1 x up to 5 DAC VCLP D3 (LOW)20OK2 x up to 5 DAC D3 (HIGH)20OK1 x up to 5 DAC C7 (LOW)202 x 2 mV vs. 1.5 mV3 x up to 4 DAC C7 (HIGH)20OK4 x up to 3 DAC D5, C7 signle D3 signle OK

5. MS IPHC-LBL phone meeting, May 29, 2012 5 5 Noise and FPN performance

6. MS IPHC-LBL phone meeting, May 29, 2012 6 6 Additional studies (normal RDO mode) ALL LOWALL HIGHALL LOW PATT ALL HIGH PATTsingle 3.28 Vsingle 3.68 V ALL LOW PATT 2 JTAGALL LOW PATT seq. STARTALL LOW seq. START

7. MS IPHC-LBL phone meeting, May 29, 2012 7 7 Additional studies (normal RDO mode) ALL LOW seq. START& JTAGALL LOW PATT (GND)ALL LOW (GND) ALL LOW (GND) seq. START&JTAGALL LOW (8 hrs, only 1 RSTB)

8. MS IPHC-LBL phone meeting, May 29, 2012 8 8 Noise and FPN in two operating states (Other 9 sensors LOW thresholds (VREF1=0))

9. MS IPHC-LBL phone meeting, May 29, 2012 9 9 Threshold offset in two operating states

10. MS IPHC-LBL phone meeting, May 29, 2012 10 Summary We observe offset and noise instability in certain sensors running in a ladder configuration – RSTB is what sends the sensor(s) into other states – Noise variation ~ 0.6  – Offset variation < 6 (8) DAC <2 mV – No such effects observed when operating only one sensor Are there additional tests that can help characterize this behavior in hopes of understanding if it is an aspect of the sensor design? We need to understand the impact of these variations on the PXL detector performance. We will be running the thinned ladder remotely from IPHC and doing a similar set of testing

11. MS IPHC-LBL phone meeting, May 29, 2012 11 Backup – Previous results: noise + FPN Offset variation – Offset change  lower noise?

12. MS IPHC-LBL phone meeting, May 29, 2012 12 Noise  FPN

13. MS IPHC-LBL phone meeting, May 29, 2012 13 Offset variation

14. MS IPHC-LBL phone meeting, May 29, 2012 14 Offset change  lower noise?