Tests of CAEN 1190 Multi-hit TDCs Simona Malace Brad Sawatzky and Brian Moffit JLab Hall C Summer Workshop Aug. 15-16 2013, JLab.

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Presentation transcript:

Tests of CAEN 1190 Multi-hit TDCs Simona Malace Brad Sawatzky and Brian Moffit JLab Hall C Summer Workshop Aug , JLab

Scope  CAEN 1190 multi-hit TDCs will be implemented in Hall C for the 12 GeV running in both HMS and SHMS  In an initial bench test we studied the high rate behavior/capabilities of TDC1190 Outline  General remarks on TDC1190  Experimental setup  Data Structure/ Data Decoding/ Data Analysis  Results: resolution, hit maps, measurement histograms  Still to do…

General Remarks on TDC1190  CAEN 1190 multi-hit TDC: 128 independent multi-hit/multi-event time-to-digital conversion channels organized in 4 High Performance TDC (HPTDC) chips (32 channels each)  The data acquisition can be programmed in “EVENTS” (“TRIGGER MATCHING MODE” with a programmable time window) or in “CONTINOUS STORAGE MODE”  It can be enabled to the detection of the rising and/or falling edges of the pulse width  The board houses a 32 kwords deep output buffer that can be readout via VME as single data, block transfer or chained block transfer in an independent way of the acquisition itself

General Remarks on TDC1190 TDC chip architecture  40 MHz input clock but 100 ps resolution can be achieved with PLL multiplication  Each channel can store up to 4 hit measurements before being written into a 256 words deep L1 buffer shared by 8 channels  In trigger matching mode a function will match hits with triggers based on trigger information stored in the Trigger Fifo (bunch id and event id) and a programmable matching window  The read-out FIFO is 256 words deep and enables data to be read out while others are being processed

General Remarks on TDC1190 Power ON: DefaultFor our test: Trigger matching: enabled Matching window width: 900 ns Matching window offset: ns Subtraction trigger time: enabled  time measurements are referred to the beginning of the match window We read the TDC1190 via Block Transfer, Direct Memory Access (BLT DMA)

Experimental Setup ns Beginning of match window match window width = 900 ns -560 ns-300 ns-960 ns This 1 kHz reference pulse goes in select channels:  0, 15, 16, 31 in TDC1  32, 47, 48, 63 in TDC2  64, 79, 80, 95 in TDC3  96, 111, 112, 127 in TDC4 Common stop 1 kHz reference pulse is OR-ed This 1 kHz reference pulse is OR-ed with a variable rate pulse (mimics noise) and goes in all channels Ref. pulses: delayed copies common stop

Data Structure/Data Decoding/Data Analysis dummyfiller Global header TDC1 header TDC1 data TDC1 trailer Global trailer

Data Structure/Data Decoding/Data Analysis  We use the Hall A analyzer; the THaCodaDecoder has been modified to extract information from: global/chip headers and trailers and form measurement words Number of hits Measurement for each hit

Results: Hit Maps  Rate per channel: 1 kHz, 2kHz in select channels (noise = 1mHz)  At very low noise rate by construction we expect 2 hits in select channels 0, 15, 16, 31, 32, 47, 48, 63, 64, 79, 80, 95, 96, 111, 112, 127 and 1 hit only in all the rest

Results: Hit Maps  Rate per channel: 501 kHz, 502 kHz in select channels (noise = 500 kHz)  At 500 kHz noise rate there is a large probability (~45%) to have 3 hits in select channels 0, 15, 16, 31, 32, 47, 48, 63, 64, 79, 80, 95, 96, 111, 112, 127

Results: Hit Maps  Rate per channel: 1.1 MHz, 1.2 MHz in select channels (noise = 1 MHz)  At 1 MHz noise rate there is an even larger probability (~90%) to have 3 hits in select channels 0, 15, 16, 31, 32, 47, 48, 63, 64, 79, 80, 95, 96, 111, 112, 127

Results: Hit Maps  Rate per channel: 5.1 MHz, 5.2 MHz in select channels (noise = 5 MHz)  At 5 MHz noise rate it fails; there should never be events with 0 hits

Results: Raw Measurements  Rate per channel: 1 kHz, 2kHz in select channels (noise = 1mHz) 2 reference pulses at 1 kHz rate I picked this one for subtraction Measurements are reported w.r.t. the start of the match window this farther away from common stop than this

Reference Pulse Subtracted Measurements  Rate per channel: 1 kHz, 2kHz in select channels (noise = 1mHz) Resolution – 0.14 ns

Reference Pulse Subtracted Measurements  Rate per channel: 1 kHz, 2kHz in select channels (noise = 1mHz) Here the chosen reference pulse has been subtracted from all other measurements (ref_pulse - measurement) Chosen reference pulse The other reference pulse

Reference Pulse Subtracted Measurements  Rate per channel: 501 kHz, 502 kHz in select channels (noise = 500 kHz) Here the chosen reference pulse has been subtracted from all other measurements (ref_pulse - measurement) Chosen reference pulse The other reference pulse  The gap is probably generated by the noise and reference pulse “walking” on each other: the leading edge of the noise pulse comes first and there is overlap with the ref. pulse  a gap on the + side the leading edge of the ref. pulse comes first and there is overlap with the noise pulse  a gap on the - side

Reference Pulse Subtracted Measurements  Rate per channel: 1.1 MHz, 1.2 MHz in select channels (noise = 1 MHz) Here the chosen reference pulse has been subtracted from all other measurements (ref_pulse - measurement) Chosen reference pulse The other reference pulse At ~ 1MHz per channel, ~128 MHz integrated rate still looks O.K.

Reference Pulse Subtracted Measurements  Rate per channel: 2.1 MHz, 2.2 MHz in select channels (noise = 2 MHz) Here the chosen reference pulse has been subtracted from all other measurements (ref_pulse - measurement) Chosen reference pulse The other reference pulse At ~ 2MHz per channel, ~256 MHz integrated rate it appears to fail

Summary  We tested the high-rate behavior of CAEN 1190 multi-hit TDCs:  it appears to function properly up to ~ 1 MHz per channel, 128 MHz integrated rate  we programmed the TDC for 100 ps resolution; the measured resolution is ps  Still to do:  sanity checks …. Again!  simulate a “hot wire” input and verify if it fails in a similar fashion as shown here

Unrelated: the maPMT H8500C-03 test results I presented at the last Hall C meeting have been organized into a paper that was accepted this week for publication in the Journal of Instrumentation