Session Chair: Rob Dubois, Dow Chemical Process Analytical R&D

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Presentation transcript:

NeSSI™ Update Session IFPAC – Arlington Salon V Tuesday, January 13, 2004 PM - II Session Chair: Rob Dubois, Dow Chemical Process Analytical R&D Fort Saskatchewan, Alberta, Canada

NeSSITM Session 1:05 This Dog Don’t Hunt (…or why “classic” 4-20 mA communication and hazardous protection methods are not enablers for miniature, modular, and smart analytical technology) - Rob Dubois - Dow Chemical, Fort Saskatchewan, AB, Canada 1:30 Modular Sampling/Sensor Array for Water Quality Monitoring - David M. Simko, Swagelok Co., Solon, OH, USA 1:55 Sensor Bus Requirements for NeSSI Gen II Systems - David M. Simko, Richard A. Ales, and (Bill Metz), Swagelok Co., Solon, OH, USA

NeSSITM Session 2:20 CFD-based Liquid Flow Calculations for Modular Sample Systems - Tanios Y. Bougebrayel, David M. Simko and John J. Wawrowski, Swagelok Co., Solon, OH, USA 2:45 BREAK – Exhibits Grand Preview – Grand Ballroom 4:00 New Directions in SP76.00.02 Modular Substrate Systems - Steve Doe, Parker-Hannifin Co., Jacksonville, AL, USA 4:25 Proper Elastomeric Seal Material Selection for Process Analyzer Sample Systems - Steve Doe, Parker-Hannifin Co., Jacksonville, AL, USA

NeSSITM Session 4:50 Modular Sample System Top-Mount Components - a Rapidly Growing Selection - Robert E. Sherman, CIRCOR International, Inc., Clifton Park, NY, USA 5:15 Networked Sampling Systems (NeSSI Gen II) Development - Progress and Challenges - John Mosher, Honeywell International, Lodi, CA, USA 5:40 New Low-Flow Measurement and Control Technologies for Process Analytical Applications, in ISA SP76 Footprint – Steve Glaudel, Brooks Instrument, Emerson Process Management, Hatfield, PA, USA

Announcement NeSSI “Open” Workshop Wednesday evening, Jan 14, 6-7:15 PM Room: Arlington Salon V Summary & Thanks! presenters and co-authors CPAC papers will be published on the CPAC web site