Daniel Červenkov, Peter Kodyš, Ján Scheirich, IPNP, Charls University in Prague 12 th – 15 th June 2013 Ringberg Castle Upgrade of the Mini-matrix Test System

Mini-matrix Test System DEPFET prototypes Pulse laser source 660/1060 nm Positioning platform –Automated measurements Thermal stabilization Computer controlled power supplies Radioactive sources for calibration Block Diagram of the Test System Photo of the Test System - 1

Front-end and Steering Electronics Steering Pulse Generator Front-end Amplifier Amplifier Board Motherboard - 2

System Upgrade Previous system had only 8 drain channels –PXD6 4-fold layout -> 2 columns Upgrade for 16 drain channels –PXD6 4-fold layout -> 4 columns –ADC card with 16 channels would be costly Multiplexing 2:1 Reusing old system Only new motherboard and amplifier cards were designed The DEPFET matrix has to have 16 drain channels bonded –New matrix had been prepared (MPI) - 3 Motherboard V3 Motherboard V2

Test System Upgrade 16 amplifier card –2 cards are time multiplexed in one output Backward compatible with previous system version –Trig3 is used for multiplexer Internal gate is the memory unit Compression of two channels in one using different time-slots Photo of the New Electronics Time Multiplex in Channel Compression - 4

5 Drain Currents

First Results Test of functionality of the system IR laser Operational voltages and laser weren’t optimized –Very bad homogeneity - 6

Conclusions and Outlook Upgrade of the system was done –DEPFET active area was doubled –A lot of system components were re-used –Software was modified Further voltage optimization is necessary, but system functionality was proven System in the MPI is being upgraded as well - 7