Pad Crater Project “Definition Stage” Joe Smetana Alcatel-Lucent Asia Meeting 5/18/2011.

Slides:



Advertisements
Similar presentations
What determines impedance ?
Advertisements

Sierra Proto Express Introducing our Micro Electronics Division.
OMG Fidelity ELECTROLESS NICKEL IMMERSION GOLD
ASE Flip-Chip Build-up Substrate Design Rules
Phase II Total Fatigue Life (Crack Initiation + Crack Propagation) SAE FD&E Current Effort 30 October 2012 at Peoria, IL.
Design of Machine Elements
High Temperature Composites Rutgers University Federal Aviation Administration Advanced Materials Flammability Atlantic City, NJ October 24, 2001.
High Frequency Test Methods for Laminate Materials (HF) Project
SAC Aging “2” Project “Definition Stage” Ready to go to “Implementation Stage” Joe Smetana November 8, 2010.
Tony Smith LHCb Velo Hybrid Meeting CERN 29/07/04 1 VELO HYBRID STATUS CONSTRUCTION of composite SUBSTRATE – best flatness obtained with TPG central core.
MECHANICAL PROPERTIES OF MATERIALS
Pressure Sensitive Adhesive Tapes for Sales and Marketing Professionals Tape University Basics May 11, 2009 Testing.
Electro-Chemical Migration Definition Stage Project Wallace Ables - Dell HDP User Group Member Meeting Host: Oracle Santa Clara, CA. Feb Presented.
Electro-Chemical Migration Definition Stage Project Wallace Ables - Dell HDP User Group Member Meeting Host: Panasonic Bennington, Vermont September 25,
STATUS OF THE CRESCENT FLEX- TAPES FOR THE ATLAS PIXEL DISKS G. Sidiropoulos 1.
Ormet Circuits, Inc. Technology Overview Presentation
Layout Considerations of Non-Isolated Switching Mode Power Supply
VELO upgrade electronics – HYBRIDS Tony Smith University of Liverpool.
Electro-Chemical Migration Going to Implementation Stage Mike Bixenman HDP User Group Member Meeting Host: Flextronics Santa Clara, CA February 26, 2014.
Deposition of Solder Paste into High Density Cavity Assemblies
RO400FC Forced convection hot air reflow oven. In a flexible production, what do you need for soldering of  Complex PCB’s  Soldering of fine pitch on.
Current ILC work at Fermilab Electrical Engineering Dept.
Click to edit Master subtitle style 4/25/12 Thermal Management By using PLPCB technology with HEAVY Copper in PCB Pratish Patel CEO, Electronic Interconnect.
FCBGA Package Warpage Definition Stage Project
© International Rectifier DirectFET  MOSFETs Double Current Density In High Current DC-DC Converters With Double Sided Cooling.
“PCB” -AMIT NIKAM -ASHI NAGARIYA.
IPC Physical Test Concerns Printed board assembly functional test equipment is usually very expensive and requires highly skilled personnel.
0 iNEMI Board and System Manufacturing Test TIG Update Phil Geiger 2008 IEEE Board Test Workshop Sep 08.
HBD FEM Overall block diagram Individual building blocks Outlook ¼ detector build.
FCBGA Package Warpage ØII Definition Stage Project Kirk Van Dreel, Plexus HDP User Group Member Meeting Host: Engent Atlanta, Ga. September 9, 2015 © HDP.
PXL Cable Options LG 1HFT Hardware Meeting 02/11/2010.
Going to Implementation Stage
Trace connecting two pads! More than 45 degree bends Traces too close together Rule of thumb: traces at least 40 mil apart.
SAC Aging III Idea Stage Project Richard J. Coyle HDP User Group Member Meeting Host: Engent Atlanta Ga, USA Sept 9, 2015 © HDP User Group International,
ITER In-Vessel Coils (IVC) Interim Design Review Thermal Structural FEA of Feeders A Brooks July 27, 2010 July 26-28, 20101ITER_D_353BL2.
Technology Road Map Imaging And Etching Trace / Space Outers * Current
Electro-Chemical Migration Definition Stage Project
Future HDI Project – Definition Stage
Resistive protections Rui de Oliveira 09/12/15
M.Nuzaihan DMT 243 – Chapter 5 Fundamental Design For Reliability What is Design for Reliability, Microsystems Failure & Failure Mechanisms, Fundamental.
PHF110: Basic Physics and Materials Dr Mark A. E. Jepson Room: S227
IPC Part Support All parts weighing 5.0 gm, or more, per lead shall be supported by specified means, which will help ensure that their soldered.
MEMS Packaging ד " ר דן סתר תכן וייצור התקנים מיקרומכניים.
Upgrade PO M. Tyndel, MIWG Review plans p1 Nov 1 st, CERN Module integration Review – Decision process  Information will be gathered for each concept.
WP7&8 Progress Report ITS Plenary meeting, 10 June 2014 LG, PK, VM, JR.
DUNE APA Overview for SBND Synergy Discussion Lee Greenler University of Wisconsin Physical Sciences Lab September 2, 2015.
Viscoelasticity.
PACKAGE FABRICATION TECHNOLOGY Submitted By: Prashant singh.
Precision Technology. WHY TEST AT HIGH SPEED? Typical manufacturing and end use failures.
Definition Stage Project
Effects of Component Rework on Reliability rev01 Khaw Mei Ming - Keysight HDP User Group Project Meeting 4 th May 2016 © HDP User Group International,
Improving Dimensional Stability of Microelectronic Substrates by Tuning of Electric Artworks Parsaoran Hutapea Composites Laboratory Department of Mechanical.
Effects of Component Rework on Reliability rev02 Khaw Mei Ming - Keysight HDP User Group Project Meeting 2 nd June 2016 © HDP User Group International,
Digital Speckle Correlation
HDPUG Project Proposal Determining a better CAF acceleration equation
Sierra Assembly Technology Inc.
Digital Image Correlation Idea Phase Project
Introduce PCB Products of KC
Printed Circuit Board Design
High-Speed Serial Link Layout Recommendations –
CAF Resistant, Low CTE FR-4 Dielectric Substrate
ob-fpc: Flexible printed circuits for the alice tracker
Joint Meeting SPS Upgrade Study Group and SPS Task Force
What determines impedance ?
Solder Fatigue Analysis
Documenting low layer count impedance controlled stacks with Speedstack VMM Professional documentation of low layer count stacks using Speedstack’s Virtual.
SAS-3 12G Connector Drive Power Pin Configuration
Microcontroller Interfacing: Selected Topics
Power Temp Cycle Information
IPC Compliance Testing (DPA) Methodology
Presentation transcript:

Pad Crater Project “Definition Stage” Joe Smetana Alcatel-Lucent Asia Meeting 5/18/2011

The issue(s) Pad Cratering defects are a significant challenge with Pb-free PCB materials and/or Pb-free solders, particularly associated with large BGA devices Pad Pull or Ball shear testing has not shown to consistently represent the actual propensity for pad cratering of a material and in some cases can give misleading and/or opposite results from what actually occurs in real assemblies A way is needed to rank order materials that is directly related to actual pad cratering

Project Overview Create a relatively simple test vehicle with a single large BGA assembled in the middle – 6 or 8 layers, thickness.093 Fabricate the bare boards from multiple different materials – Include a significant variety of materials, filled and unfilled – Include materials that have also done “well” in HDPUG Pb-free materials projects – Don’t test materials that have done poorly in HDPUG Pb-free materials projects – Other materials as suggested by members Perform bend to break testing to rank order the materials – Design TV to virtually ensure trace breaks simultaneous with laminate (Electrical break) – Spherical bend testing preferred or 4-point bend? – Will need to include some amount of strain gage measurements – Both Single Bend to Break and Repeated Load to Break On the same boards ALSO perform Cold Ball Pull testing for a correlation to actual pad cratering. – Intel will support this Other Possibilities – AE (Acoustic Emission) Testing – identifies actual onset of pad cratering (Anurag Bansal – Cisco) Challenges – need to understand test equipment/test and evaluation – Charpy Impact testing – Doug Sober taking lead on how to get this done. Bob Nevis (Microtek) will support testing. Suggested by Shengyi Could correlate extent of impact damage to pad cratering propensity Promising idea since may track with fracture toughness/pad cratering – If it does – can readily also test this at higher temperatures (200C) Key question – how to design to QUANTIFY results

What this Project will Provide Rank order of materials to Pad Cratering in mechanical bend testing – At selected strain rate uε/sec (sweet spot) – At single bend to break – At repeated load to break 60-70%? (TBD) lowest single bend to break load Correlation or lack thereof of HPP testing to mechanical bend to break testing – Currently no support for this Correlation of AE to Electrical open? Correlation of AE and/or Electrical open to Charpy Impact test?

Bend to Break Testing Meadville to support Bend to Break testing – Need to better define this – uε/sec is the sweet spot to minimize scatter in the results and lower introduces a different failure mode, exhibits twice the scatter in the results... this is typical of behavior seen in a brittle material.

Simplified Bend to Break Test This will not necessarily catch the first break point, but should correlate to it and should properly rank order the materials.

Key Issues Define the test component – Practical Components A-PBGA mm-35mm-DC-LF-305 PBGA x35mm Perimeter+ BGA, 1mm pitch 689 x 689 mil die size Quote of 1000 for $10, Define the materials to be tested – Compare filled vs. unfilled, FR4 – brominated and HF, Selected High speed materials – Look at “cap” technologies – such as Zeta – Select “good” materials (HDPUG Pb-free Materials 1 and 2) Material suppliers need to supply the materials at no cost – First Draft/Proposed Material List follows Define/Design the Test Board (ALU/Meadville) Define the required sample size – 10? Single Bend to Break – 20? Repeated Bend to Break

Proposed Component

Rough Proposed Stackup

Design Rough Header for event detector attach BGA at 45 degrees to allow for either spherical or 4 point bend Need the following specifics defined: Minimum distance from component to board edges? What type of header or board connector is needed the event detector? Edge contacts? BGA pattern duplicated on bottom side using either VIP or SMD pads for comparison

Considerations for Pad Cratering Test Materials – Filled vs Unfilled Hi Tg Phenolic Resin – Halogen Free – Dicy – Mid Tg – High Speed – Cap Layers Resin Content/Glass style effect on outer layers – 106 vs between L1-2 and N-N-1 Pad Size – Normal vs. enlarged solder mask defined pads, – Enlarged pads at corners – Microvia in Pad vs. No Microvia in pad (including Dogbone Microvia vs Dogbone Through Via), – Conformal Microvia vs Filled Micro via Note - With a single design can only do 1 of the options

Preliminary Material List (part 1) High Tg Filled Phenolic FR4s – Isola 370HR – EMC EM-827 – Panasonic R1755V – Shenzen Pacific (PIC) FL-170 – ITEQ IT-180i – Panasonic R2125 – Grace GA-170LE High Tg Non-filled Phenolic FR4s – Isola 370 Turbo – Shengyi S1170 – TUC TU-722 High Tg Halogen Free FR4s – Grace GA-HF-17 – ITEQ IT-170GRA – EMC EM-370(D) or EMC-370 (one but not both) – Panasonic R1577 (Megtron 2) – Shengyi S1165 – Ventec VT-447 – TUC TU-862HF – Hitachi MCL-HE-679G

Preliminary Material List (part 2) Mid-Tg FR4s – ITEQ IT-158 – EMC EM-825 – Isola This a dicy FR4 -OK in low layer count Pb-free High Speed Materials – Isola FR-408HR – Panasonic Megtron 4 – TUC TU-872L or SLK – EMC EM-828 – MGC FL-700 – Panasonic Megtron 6 – Nelco Mercurywave 9350 Cap Materials (over what material?) – Zeta – Shengyi S1160F – Hitachi KS-6600 – Hitachi CUTE

What this Project WILL NOT DO (as currently planned) It will not provide data that necessarily correlates to pad cratering occurring by thermo-mechanical stresses – such in reflow/cooldown as material properties above Tg will be very different from those at room temperature. If Charpy Impact correlates to pad cratering – can repeat on hot boards comparatively easily (Phase 2 – using same boards built as same time in this project?)

Where are we on this Project? Need to resolve – Board design related issues (slide 10) Meadville – Can we do AE? (Cisco) Impact on test location (Cisco or Meadville) – Can we do Charpy Impact Yes probably – who will do it? How to quantify the result (design input?) – Materials list/sample sizes Current funding for 500 parts only Either we increase the funding to get 1000 parts or decrease either – Samples size per material – Number of materials/options

Project Milestones Define the full extent of the Project - Team Define the test vehicle - Team – Component – Board (layers, thickness, size, etc.) Design the Test Vehicle - ALU Determine materials to test - Team Determine the required sample sizes - Team Material suppliers provide materials at no cost in return for rank ordering (coded) Fabricators to build the test vehicle - TBD Procure components – Sun +? Assemble Test vehicles – Celestica/Flextronics? Bend to break testing- Meadville – Include AE testing? (Cisco?) Hot Pin Pull testing (assuming we include this) Charpy Impact? Data analysis and reporting