XIS Calibration on the Ground Status Report K. Hayashida (Osaka University) and the XIS-team

XIS Components XIS-Sensors XIS-Sensors CCID41-FI CCD CCID41-FI CCD EU (Engineering Unit) EU (Engineering Unit) FM FI0,FI1,FI2,FI3 FM FI0,FI1,FI2,FI3 CCID41-BI CCDCCID41-BI CCD FM BI0,BI1FM BI0,BI1 AE/TCE AE/TCE FM AE/TCE01,23 FM AE/TCE01,23 EM AE/TCE EM AE/TCE DE DE FM 4PPU+MPU FM 4PPU+MPU FM Spare before Launch

Calibration Task Share ComponentsLocation X-ray Source QE reference Chip level CSR/MIT Fluorescent X-rays (C,O,F,Al,Si,P,Ti,Mn,Cu) ACIS chips calibrated at BESSY Camera without OBF +FM AE Osaka Grating Spectrometer keV Polypro-window Gas PC & XIS- EU Kyoto Fluorescent X-rays (Al,Cl,Ti,Mn,Fe,Zn,Se) Window-less SSD OBF Synchrotron Facility Synchrotron X-rays + monochrometer (Transmission measurement with PIN diode) Camera onboard the satellite ISAS/JAXA55Fe

XIS Data Reduction Frame Data /8sec Frame Data /8sec Dark-level Subtraction Dark-level Subtraction Event Pickup (PH(E)>Event Threshold) Event Pickup (PH(E)>Event Threshold) 5x5 mode, 3x3 mode or 2x2 mode 5x5 mode, 3x3 mode or 2x2 mode Event data Event data Charge Trail Correction Charge Trail Correction Grading / PHA-reproduction for PH(i)>Split Threshold Grading / PHA-reproduction for PH(i)>Split Threshold PHA-dependent Split Threshold for BI PHA-dependent Split Threshold for BI Bad Columns Filter Bad Columns Filter Spectrum / Image / Light Curve Spectrum / Image / Light Curve Onboard DE On the ground XIS Response depends on the reduction procedure * :Newly introduced

Event Grades Grades are used as X-ray events. Grades are used as X-ray events. grade0 grade1 grade2 grade3 grade4 grade5 grade6 grade7 Pixel level is maximum among 3x3 area and larger than Event threshold Pixel level is larger than Split threshold and added to the PHA Pixel level is larger than Split threshold but NOT added to the PHA

PH(2),PH(7) distribution ＰＨ（２） = preceding pixel ，ＰＨ（７） =trailing pixel PH [ADU] Near readout node Far from readout node BI1 5.9keV X-ray incidence RAWY d c b a a b cd

Amount of Charge in the Trail ＢＩ１ PH(7)Center [ADU] CTI = (4.5±0.3)×10 [ /Transfer ] -6 Slope ↓ CTI estimated from this trailing charge Mn K Number of V-Transfer in the Imaging Area *) temperature dependence was observed

Incident X-ray Energy Dependence VCTI= (1.72 ・ 10 )×E － 0.5 －4－4 HCTI= (6.06 ・ 10 )×E － 0.5 －4－4 We can tell the amount of charge deposited in PH(7) and PH(5) => Charge Trail Correction V-transfer H-transfer

PH(2),PH(7) Distribution before/after Charge Trail Correction PH(2),PH(7) Distribution before/after Charge Trail Correction PH [ADU]

Effects of Charge Trail Correction Correct Grade Branching Ratio and PH() Correct Grade Branching Ratio and PH() Reduce Grade7 events due to Charge Trail. 10%-20% increase in Grade02346 ratio at high energies. Reduce Grade7 events due to Charge Trail. 10%-20% increase in Grade02346 ratio at high energies. Restore Non-uniformity in effective QE. Restore Non-uniformity in effective QE. (Partial) Restoration in the Energy Scale. (Partial) Restoration in the Energy Scale. Traps with Other time scales are not negligible. Traps with Other time scales are not negligible.

Optimization of Split Threshold for BI1 G02346 event number G02346 event number FWHM (eV) FWHM (eV) Spth (ADU)

PHA-dependent SpTh PHA-dependent Split Threshold for BI

Bad (CTE) Columns Bad CTE Bad CTE Typically long trail in each event. Typically long trail in each event. Sometimes flickering pixel is observed. Sometimes flickering pixel is observed. Rows near the readout node can be used. Rows near the readout node can be used. Identification logic without accumulating 10^7events was developed. Identification logic without accumulating 10^7events was developed. EU= 21 bad columns/chip EU= 21 bad columns/chip FI0=14, FI1=12, FI2=17,FI3=24 FI0=14, FI1=12, FI2=17,FI3=24 BI0=23, BI1=50 BI0=23, BI1=50 How should we do for adjacent columns ? How should we do for adjacent columns ? X-ray image (number of events /pixel)

Kyoto Cal System Fluorescent X-rays (Al,Cl,Ti,Mn,Fe,Zn,Se) Fluorescent X-rays (Al,Cl,Ti,Mn,Fe,Zn,Se) Windowless Si-SSD is used as the reference counter, assuming 100% efficiency >1.5keV Windowless Si-SSD is used as the reference counter, assuming 100% efficiency >1.5keV XIS FI-CCD is assumed XIS FI-CCD is assumed

Detector Chamber Manson Soft X-ray Generator Hetrick Spectrometer Calibration Facility in the Osaka Clean Room

Dispersion (Grating) Spectrum X-ray image X-ray image O-Kα （ 0.53ke V ） C-Kα (0.28keV ) X-ray energy Number of events/columns Dispersion direction projection FWHM ～ 5eV

Line profile against O-K line incidence Astro-E1 (FI) XIS Astro-E1 (FI) XIS 5 kV PHA(ADU) XIS1 (H.Katayama master thesis) FI2 Astro-E2 (FI) XIS Astro-E2 (FI) XIS

Line Profile model （１） Main Peak ： Absorption in Depletion Layer （２） Sub Peak ： Lost charge below Split- threshold （３） Triangle Comp. ： Channel Stop origin （４） Constant Comp. ： Partial absorption in SiO 2 parameters ： T1 (normalization), C1(center), S1(sigma) T2 (relative to T1), C2(spth/2, fixed), S2 (1.78×S1, fixed) T3 (relative to T1), F3( 三角形の幅, 0.5×C1) T4 (T1 で規格化した面積 ) → フリーパラメタ 6 個 でフィット F3 BI structure

Line profile for FI1 sensor T2=0.033, T4= T2=0.020, T4= (Seg.B) O-K line E=0.525keV Se-L line E=1.379keV

Line profile for BI1 sensor O-K line E=0.525keV T2=0.19, T4=0.015T2=0.071, T4=0.011T2=0.078, T4=0.016 Al-K line E=1.487keV C-K line E=0.277keV

スペクトルの比較 BI1 g02346 カウント 数 エネルギー分解能 [eV] 補正前 ±0.6 補正後 ±0.6 補正＋バッドコラム除去 ±0.6

Energy and Pulse-height Linearity BI1, Seg.C FI1, Seg.C

Energy Resolution (FWHM) FI-1, Seg.C BI-1, Seg.C

Quantumn Efficiency Measurement at Osaka Relative Efficiencies of FM- FI0,FI1,FI2,FI3,BI0,BI1 and XIS-EU are measured by irradiating X-rays from the spectrometer to whole the CCD area. Relative Efficiencies of FM- FI0,FI1,FI2,FI3,BI0,BI1 and XIS-EU are measured by irradiating X-rays from the spectrometer to whole the CCD area. Generator beam current is always monitored and stabilized <1%. Generator beam current is always monitored and stabilized <1%. XIS-EU was cross-calibrated to a Gas PC on 2003Dec & 2004Jul. XIS-FM are not installed in the chamber with the Gas PC simultaneously. XIS-EU was cross-calibrated to a Gas PC on 2003Dec & 2004Jul. XIS-FM are not installed in the chamber with the Gas PC simultaneously. The gas PC was calibrated through the slant incident method in 2004 January. The gas PC was calibrated through the slant incident method in 2004 January.

X-rays Slant Incident Method: Application to Gas PC We determined to use the Gas PC as the reference counter

Counts PH (ch) 0° 30° 45° Gas PC Spectra for Different Incident Angle

30°/0° 45°/0° Ratio of Counting rate of Gas PC Best fit estimate Poly propylene thickness 1.01±0.06  m H2OH2OH2OH2O 0.281±0.048  m P10gas dead layer 79.6±9.7  m

PC ＱＥ model

XIS-EU and Gas PC cross calibration using a entrance slit

X-rays through Slit ( ~1mm) Dispersion Direction

PC (0.525keV) XIS-EU (0.525keV) PC Spectra and CCD Spectra

Best Fit Estimates SiO ±0.039  m Si 0.205±0.029  m Si3N ±0.03  m Si depletion  m fixed 65  m fixed Constant Factor 0.852± deg offset slant-PC is assumed

Relative QE of FMFI / XIS-EU FI0FI1 FI2 FI3 Red=determined from the line components Long term variability is too high to be precisely corrected

Relative QE of BI0,BI1 to XIS-EU BI0 BI1 ～ keV ～ keV

Best Fit Estimates SiO ±0.039  m Si 0.181±0.029  m Si3N ±0.016  m Si depletion ±1.7  m 68.9±1.7  m Constant Factor 0.857± deg offset slant-PC is assumed

XAFS near the O-Kedge FI-2 E edge = ± keV red.  2 = (d.o.f. = 418)

Best Fit Estimates HfO  m fixed Ag  m fixed SiO ±  m Si depletion ±0.7  m 45.7±0.7  m Constant Factor 0.934± deg offset slant-PC is assumed

Upper limit of Surface dead layer in BI-CCD keV H 2 O on BI1 <0.11 μm Dispersion Spectrum with BI μm (H 2 O)

Absolute QE issues Reconsider the assumptions Reconsider the assumptions 96% at 4.5keV for XIS-FI Check grade7 events ? Gas PC window model Mesh measurement ? ACIS BESSY calibration How was the effective area or normalization calibrated ? How about Channel Stop events ? Hidden dead space in FI ? Adopt the BI1 QE as a reference BI QE should not be 1 (at least a few % grade 7 events) How do we model F_data-reduction ? Application of the Slant Incidence method to BI0 after the Astro-E2 launch. Any other good way for the absolute QE cal ? Energy independent factor of 10% is not a problem. Edge structure of 10% might be a problem.

Summary We have completed the calibration experiments on the ground for XIS flight models. We have completed the calibration experiments on the ground for XIS flight models. Data reduction procedures were updated for Astro-E2 XIS. Data reduction procedures were updated for Astro-E2 XIS. Conversion to FTOOLS will be required. Conversion to FTOOLS will be required. Profile has less tail component than Astro-E1 XIS. Profile has less tail component than Astro-E1 XIS. Relative QE between the XIS sensors were accurately measured <5%?. Relative QE between the XIS sensors were accurately measured <5%?. We need further work on absolute QE. We need further work on absolute QE.