Fixed Beam Moving Stage using a stitching free exposure strategy.

Slides:



Advertisements
Similar presentations
(GET FAMILIAR WITH EQUIPMENT)
Advertisements

3D Analysis with AASHTOWare Bridge Design and Rating
Laser Speckle Extensometer ME 53
20.6 Force between Two Parallel Wires The magnetic field produced at the position of wire 2 due to the current in wire 1 is: The force this field exerts.
Tutorial 1 Default Cee section in bending Objective To introduce the conventional finite strip method and gain a rudimentary understanding of how to perform.
Shape Editor Programming Example
Technology ICT Core: Desktop Publishing. Desktop Publishing Desktop Publishing - assembly centres for text, graphics etc Starting a Publication: Start.
1 Laser Beam Coherence Purpose: To determine the frequency separation between the axial modes of a He-Ne Laser All sources of light, including lasers,
Chris A. Mack, Fundamental Principles of Optical Lithography, (c) Figure 3.1 Examples of typical aberrations of construction.
Pulsed Cathodic Arc Plasma Diagnostics Optical Emission Spectroscopy Results Aluminium.
Concrete Testing Gauge REBAR LOCATOR TC100 CRACK DEPTH GAUGE TC200 CONCRETE TESTING GAUGE TC300 CRACK DEPTH GAUGE TC400.
© Siemens Product Lifecycle Management Software Inc. All rights reserved Siemens PLM Software Solid Edge ST6 Training XpresRoute (tubing)
EBL: Focus & height rev 0, 6/6/08. Electron gun ZrO/W emitter Suppressor First anode Second anode Acceleration electrodes Ground anode First alignment.
Conventional and Computed Tomography
Proximity Effect in EBL Jian Wu Feb. 11, Outline Introduction Physical and quantitative model of proximity effect Reduction and correction of proximity.
Introducing the LEO 1400 Series
Stork Prints Austria GmbH bestIMAGE 5.60 CAM Plus, CAM smart December 2012 Explore the new features of.
BUILDING RICH MEDIA ELEMENTS. Design Decisions Based on Design Specification  Following the design specification will ensure that the application is.
Interactive Input Methods & Graphical User Input
CGMB214: Introduction to Computer Graphics
MODERN SURVEY (FAMILARISATION WITH EQUIPMENTS). Modern equipments EDM – Electronic distance measurement eqp. EDM – Electronic distance measurement eqp.
High-Resolution Interactive Panoramas with MPEG-4 발표자 : 김영백 임베디드시스템연구실.
TAUCHI – Tampere Unit for Computer-Human Interaction Visualizing gaze path for analysis Oleg Špakov MUMIN workshop 2002, Tampere.
Piezoelectric Equations and Constants
The Comparison of PARAMICS ( MODELLER ), GETRAM( TEDI ), CORSIM, and VISSIM Roundabout Construction Interchange Construction Workzone Construction Data.
Page 1 Workshop for Electron Beam Lithography System JBX-6300FS By Nelson LI 13 November 2009 Nanoelectronics Fabrication Facility.
Magnetism1 Review on Magnetism Chapter 28 Magnetism2 Refrigerators are attracted to magnets!
DC & CV Lab. CSIE NTU AOI Automatic Optical Inspection Supports quality control objectives through in-process inspection that identifies critical defects.
Laser-Based Finger Tracking System Suitable for MOEMS Integration Stéphane Perrin, Alvaro Cassinelli and Masatoshi Ishikawa Ishikawa Hashimoto Laboratory.
Area Measurements.
Demonstration of Vulcan Software. Content Demonstration Introduction to Vulcan GUI Project Description Creation of Model Analysis.
Blender Animation Basics I. Animation Basics  Selecting a preset format will set your frame rate correctly.
Strategy Using Strategy1. Scan Path / Strategy It is important to visualize the scan path you want for a feature before you begin taking points on your.
CS TC 22 CT Basics CT Principle Preprocessing. 2 CT Basics CT principle preprocessing CS TC 22 Blockdiagram image processor.
Plan in summer shutdown Magnet -SF1FF -Swap of QEA magnet - Multipole field of Final Doublet IP-BSM improvement.
This talk will explain definition of exposure parameter setting up an exposure details on exposure parameter.
CLIC Beam Physics Working Group CLIC pre-alignment simulations Thomas Touzé BE/ABP-SU Update on the simulations of the CLIC pre-alignment.
© 2010 South-Western / Cengage Learning Century 21 Keyboarding  Cycle 3: Unit 24  Lessons 93 – 98.
W2Laboratories, 2008 A Fiber-Waveguide-Fiber Alignment & Test Station W2Laboratories, 2008.
Observations with AMBER  General overview  P2VM  OB preparation with P2PP P2PP / OB / templates Available templates for observation procedure Typical.
Chapter 7- Basic editing Digitize new features from a paper map or scanned map. Construct new features from survey descriptions. Map areas or objects based.
Copyright 2013 by Raith Pattern Writing with the NanoSuite Software.
25/05/2007POSIPOL FOUR MIRRORS Fabry Perot resonator at LAL-Orsay Y. Fedala With help of F. Zomer, R.Cizeron.
Conventional features 1.High definition images for diagnosis 2. Multifocal layer technology for achieving an optimal focal layer position. 3. High speed.
SPM Users Basic Training August 2010 Lecture VIII – AC Imaging Modes: ACAFM and MAC Imaging methods using oscillating cantilevers.
1) By using hamming code (even – parity), Show the correct binary number that transmitted by the sender if the receiver received binary number.
CI-202 Leaf Area Meter Instrument Training Conducted by: Brienne Meyer
TE-MSC. 07/04/2016 Jose Ferradas TE-MSC-MDT Alejandro Carlon TE-MSC-MDT Juan Carlos Perez TE-MSC-MDT On behalf to MSC-MDT section and Coil working group.
Copyright 2007 by Raith GmbH Adjust and Align Stage Adjustment & Writefield Alignment.
General Engineering Research Institute
Mapping EP4.
LayoutBeamer, from GenISys GmbH
Electron-beam lithography with the Raith EBPG
Adobe Flash Professional CS5 – Illustrated
Applications: Motors Loudspeakers Galvanometers
Electron-beam lithography with the Raith EBPG
Standard Operation Procedure
Living with e-beam drift Part 1: The e-beam is not broken
Advanced e-beam lithography overview
Electron-beam lithography with the Raith EBPG
Basics E-beam lithography
The work of moving ice Chapter 8 Animated snow scene (Difficult)
LITHOGRAPHY Lithography is the process of imprinting a geometric pattern from a mask onto a thin layer of material called a resist which is a radiation.
Title of presentation | Presentation by [Enter details in 'Header & Footer' field 18/05/2019.
Linac Diagnostics Commissioning Experience
Core: Desktop Publishing
Controlling e-beam writing order to avoid stitching and drift problems
Quanta FIB Basic Training xT Microscope Control
Assignment 2 Creating a LOGO.
Presentation transcript:

Fixed Beam Moving Stage using a stitching free exposure strategy

2 contents  What is FBMS and how does it work?  How do I create structures for this exposure mode?  How do I expose?  results and applications FBMS

3 Stage propagating direction stage travels at constant speed along (curved) paths of any length and shape with stationary beam  avoids stitch field boundaries  effective for extended paths A. Spot Mode = FBMS line B. Shape Mode = FBMS area Stage propagating direction constant dose circle symmetric What is FBMS and how does it work? FBMS

4 What is FBMS and how does it work? FBMS comparison of current value and ideal value ideal value (starting point, end point, speed) current value (measured by laserinterfero- meter) difference? continue correction signal to column noyes

5 technical note: difference between mechanical motion and ideal path compensated by additional beam deflection (special motor control unit) Layout What is FBMS and how does it work?

6 beam current stage speed * calculation width FBMS area dose= dose is defined as charge per area: calculation width =design width speed electrons=charge FBMS line dose= beam current stage speed FBMS single pixel lines use the following definition: FBMS

7 How do I create FBMS structures? GDSII has to contain special FBMS-elements FBMS

8 How do I create FBMS structures? FBMS structure is defined by nodes and their coordinates comparable to standard GDSII- elements: dose factors, structure widths and layers can be defined width definition determines if FBMS element will be exposed as area or line FBMS

9 How do I create FBMS structures? standard GDSII area FBMS elements can be converted from standard GDSII designs layer selection for converted element FBMS

10 How do I create FBMS structures? FBMS element Example: Optical Waveguides type: start type: line type: arcnext element coordinates curvature  See Software Reference Manual for additional information!

11 How do I expose?  FBMS-Alignment necessary → as motorcontrol creates a correction signal in order to correct stage inaccuracies, the deflection signal has to be calibrated (comparable to align writefield procedure)  Scan Manager offers special procedures FBMS

12 How do I expose?  press „preset“ button to get same values as for align writefield as starting values  FBMS-Alignment works the same way as the writefield alignment: stage moves to corners of the writefield beam is deflected to the same corner to scan an image: deflection is not adressed by pattern generator but by motor control image shift from ideal position is determined FBMS

13 How do I expose? FBMS

14 How do I expose?  after FBMS alignment procedure correction values are determined → as motorcontrol can only correct zoom and rotation these correction values are written into Align FBMS window →shift correction is written into Align writefield window as pattern generator directly applies this shift  FBMS alignment parameters are not stored in an ini file FBMS shift zoom & rotation

15 How do I expose? FBMS elements have to be selected in the exposure window (comparable to selection of SPLs or dots) only if FBMS elements are selected the referring tab for the parameter calculation will be visible FBMS

16 How do I expose? value which has been read in by „current“ window (automatically written) clearing dose for the referring structure (has to be typed in) assumed structure width for speed calculation (determined in „details“) calculate necessary stage speed (has to be calculated by pressing button) FBMS

17 How do I expose? FBMS

18 How do I expose? tab for FBMS area exposure → beam makes circular deflection to create designed structure width effective stepsize for circular beam deflection perpendicular to stage movement user can work with comparable values as for standard GDSII areas calculation width necessary for stage speed calculation →software calculates basic speed during exposure calculation width is adapted to design width and speed is recalculated so that dose is kept constant calculation width= minimum design width: basic speed is maximum possible speed for this pattern width should fit to design but will be adapted anyway calculation of maximum writable structure width (only 3400 points within circular deflection possible)→ restriction calculation of deflection cycle time FBMS

19 < 8 nm Line width = 30 nm Pitch = 100 nm stitching error < 20 nm former results with conventional stitching application examples FBMS

20 Line width = 20 nm Pitch = 50 nm new results with FBMS no stitching errors! no settling time from stitching! application examples FBMS

21 typical FBMS applications are extended (curved) paths  with a length several mm or cm  with a fixed width in the range of 20 nm to 20 µm  where stitching errors are crucial for the performance of the device  where a large number of stitching borders would result in long exposure times FBMS applications in general FBMS