1. A Survey of Fault Tolerant Methodologies for FPGA’s Gökhan Kabukcu 2006703357

2. Outline  Introduction to FPGA’s  Device-Level Fault Tolerance Methods  Configuration Level Fault Tolerance Methods  Comparison of Methodologies  Conclusion

3. Introduction (FPGA)  A field programmable gate array is a semiconductor device containing programmable logic components and programmable interconnects  Consists of regular arrays of processing logic blocks (PLBs)  Programmable routing matrix  Configuration of FPGA includes The functionality of the FPGA Which PLBs will be used The functionality of the PLBs Which wire segments will be used for connecting PLBs

4. Introduction (FPGA)  PLB’s are multi-input, multi-output circuits and allow: Sequential Designs Combinational Designs  PLB’s include: Look Up Tables (LUTs or small ROMs) Multiplexers Flip-Flops

5. Introduction (FPGA)  Look Up Tables (LUTs): 4 input-1 output units Can be used as:  RAM  ROM  Shift Register  Functional Unit Configured by an 16-bit “INIT” function

6. Introduction (FPGA)  An Example: y=(x1+x2)*x3+x4 Create truth table Assign “INIT” to the LUT Since there are 4 inputs and 1 output, 1 LUT is enough to represent the equation The LUT can be put into any PLB in the FPGA x1x2x3x4y 00000 00011 00100 00111 01000 01011 01101 01111 10000 10011 10101 10111 11000 11011 11101 11111

7. Introduction (FPGA)  Another Example: y=(x1+x2)*x3+x4 z=y*x5 Create truth tables Assign “INIT”s to LUTs Since there are 5 inputs and 1 output, 2 LUTs needed to represent the equation The LUTs can be put into any PLBs in the FPGA A1 and A0 are “don’t care”s x1x2x3x4y 00000 00011 00100 00111 01000 01011 01101 01111 10000 10011 10101 10111 11000 11011 11101 11111 yx5z 000 010 100 111

8. Introduction (FPGA)  An example of a full design on an FPGA

9. Fault Tolerance  Device-Level Fault Tolerance Attempts to deal with faults at the level of FPGA hardware Select redundant HW, replace faulty one Solution with extra HW resources  Configuration-Level Fault Tolerance Tolerates faults at the level of FPGA configuration When a circuit is placed, fault-free resources are selected Status of the resources is considered each time a circuit is placed-and-routed Solution with extra reconfiguration time

10. Device-Level FT Methods(1)  Extra Rows One extra spare row is added Selection Logic is added to bypass the defective row Vertical wire segments are increased by one row Faults in one row can be tolerated More than 1 spare row needed to tolerate faults in multiple rows

11. Device-Level FT Methods(2)  Reconfiguration Network Four architectural changes  Additional routing resources (bypass lines)  Reconfiguration Memory to store locations of faulty resources  On-chip circuitry for reconfiguration routing  Additional column of PLBs

12. Device-Level FT Methods(2)  Reconfiguration Network Test and identify faulty resources Create fault map Load map into Reconfiguration Memory On-board router avoids faulty resources The network is constructed by shifting all PLBs in the fault- containing row towards the right Method can tolerate 1 fault in each row if there is one extra spare column.

13. Device-Level FT Methods(3)  Self-Repairing Architecture Sub-arrays of PLBs Routers between sub-arrays Extra columns of PLBs PLBs constantly test themselves If a fault is detected,  Column of affected PLB is shifted one position to the right  The inter-array routers are adjusted Area overhead of this method is significant If there is 1 spare column and N sub- arrays in vertical, method can tolerate N faults at a time

14. Device-Level FT Methods(4)  Block-Structured Architecture Goal: tolerate larger and denser patterns of defects efficiently Blocks of PLBs FPGA is configured by a loading arm. The block at the end of loading arm is configured

15. Device-Level FT Methods(4)  Block-Structured Architecture A block is selected by the loading arm and tested If the test is passed, it is configured, otherwise designated as faulty Loading arm configures blocks one by one If the arm cannot extend any further in a path, it’s retracted by one block Fault tolerance is provided by redundant rows and/or columns Area overhead is significant

16. Device-Level FT Methods(5)  Fault Tolerant Segments/Grids Fault Tolerant Segments:  Adds one track of spare segment to each wiring channel  If a faulty segment is found, segment is shifted to spare  Single fault can be tolerated Fault Tolerant Grids:  An entire spare routing grid is added  No additional elements in routing channel, no extra time delay

17. Device-Level FT Methods(6)  SRAM Shifting Based on shifting the entire circuit on the FPGA PLBs should be placed in 2 ways:  King Allocation: 8 PLBs uses one spare, circuit can move in 8 directions  Horse Allocation: 4 PLBs uses one spare, circuit can move in 4 directions Testing determines the faulty cells, feeds information to the shifter circuitry on the FPGA.

18. Device-Level FT Methods(6)  SRAM Shifting Additional spare PLBs surrounding the FPGA Horse Allocation used in the figure The circuit is shifted up and right Advantages of the Method:  No external reconfiguration algorithm is required  The timing of the circuit is almost fixed Any single fault can be tolerated

19. Configuration-Level FT Methods(1)  Pebble Shifting Find an initial circuit configuration, then move pieces from faulty units Occupied PLBs are called pebbles Pair pebbles on faulty cells with unique, unused cells such that sum of weighted Manhattan distance is minimized Start shifting pebbles If a pebble finds an empty cell other than the intended cell, this empty cell becomes the destination No limit to the number of faults that can be tolerated

20. Configuration-Level FT Methods(1)  Pebble Shifting Example: 1 and 6 are on faulty cells Using a minimum-cost, maximum matching algorithm, pairings are: 1->v 11 and 6->v 32 Element 1 is shifted its position To move 6, we shift 3,8 and 7 Now all elements are on non-faulty cells and allocation is done

21. Configuration-Level FT Methods(2)  Mini-Max Grid Matching Uses a grid matching algorithm to match faulty logic to empty, non-faulty locations Like Pebble Shifting, uses minimum cost, maximum matching algorithm Minimizes the maximum distance between the pairings, since the circuit’s performance is set by the critical (longest) path Can tolerate faults until there are no unused cells

22. Configuration-Level FT Methods(3)  Node-Covering and Cover Segments When a fault is discovered, nodes are shifted along the chain (row) towards the right The last PLB of a chain is reserved as a spare One fault in a row can be tolerated Needs no reconfiguration if local routing configurations are present

23. Configuration-Level FT Methods(4)  Tiling Partition FPGA into tiles Precompiled configurations of tiles are stored in memory Each tile contains system function, some spare logic and interconnect resources When a logic fault occurs in a tile, the configuration of the tile is replaced by a configuration that does not use the faulty resources Many logic faults can be tolerated Local interconnect faults can be tolerated, but global ones can’t be tolerated

24. Configuration-Level FT Methods(5)  Cluster-Based Intracluster tolerance in a PLB Basic Logic Elements (BLEs or LUTs) For simple LUT faults, preferred solution is to use another LUT in the PLB Instead of changing PLB, try to find a solution in the same PLB In example, T is faulty and 4 th PLB is used instead of 2 nd PLB

25. Configuration-Level FT Methods(6)  Column-Based Treats the design as a set of functional units, each unit is a column Like Tiling, less cost precompiled configurations At least one column should be spare If there is a faulty cell in a column, the column is shifted toward the spare column Method can tolerate m faulty columns, where m is the number of columns not occupied by system functions

26. Comparison of Methodologies(1)  Device Level (DL) Methods need extra HW and have more area cost  DL Methods use one initial reconfiguration and no extra reconfiguration cost  Configuration Level Methods needs more than one reconfiguration and sometimes result in high time cost  CL Methods don’t need extra HW and no additional area cost

27. Comparison of Methodologies(2)  DL Methods are less flexible, therefore less able to improve reliability  CL Methods usually tolerate more faults than DL Methods  Performance impact of fault tolerance is less for DL Methods than CL Methods

28. Conclusion  No single Fault Tolerance methodology is better than the others in all cases.  DL Techniques has less impact on performance, but not flexible  CL Methods tolerates more faults but have more impact on performance