1. Korea Standards Activities
Liaison report
November 2010
Venue, Location, Date

2. Table of Contents Current Structure of Korea Standards Committees
Highlights
Overall TC/WG Updates
Upcoming Events
Regional Staff Contact Information

3. Current Structure of Korea
NARSC
FPD Metrology
Jongseo Lee (Samsung Electronics)
Il-Ho Kim (LMS)
FPD
EHS WG
Seoungjong Ko (Hynix)
K.S. Kim (Samsung Electronics)
Information & Control
Chulhong Ahn (Hynix)
Sammy Jeong (KC Tech)
Gunwoo Lee (Miracom Inc.)
Facilities
Kwang Sun Kim (KUT)
Insoo Cho (Shinsung ENG)

4. Highlights New technical committees formation PV Opportunities
ISC approval on July 15.
Information & Control and Facilities technical committees
PV Opportunities
Korea PV Advisory Committee decided to support PV Standards working group formation at June 30 meeting.
Wafer related measurements will be the discussion starting point.
Wafer roughness measurement
Wafer surface metal measurement
Estimated kick off meeting schedule is Dec.9, 2010.

5. FPD Metrology Committee Information & Control Committee
Overall TC/WG Updates
Org. Name
Last met on:
Progress (p) / Concern (c) /
Ballot to be issued (b) / Others (o)
FPD Metrology Committee
Oct. 15, 2010
(p) Reviewed 2 ballots
5054 (Test Method of Perceptual Motion Blur in LCD ballot ) failed.
4858A (Test Method of Spatial Contrast Ratio for FPD ballot) failed.
(p) Approved a ballot in Cycle 7-10
4858B (Test Method for Measuring the Spatial Contrast Ratio for FPD) for cycle 7, 2010
(p) Approved revised 4858 SNARF title to;
Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display
Information & Control Committee
Oct. 21, 2010
(Planning meeting)
(p) E5 revision ballot (SECS) whish is co-working with NA GEM300 TF issued on C6-10 and it will be reviewed NA Fall I&C Committee meeting
(p) Drafting Carrier transport prediction document
(O) Planning to have kickoff meeting at Jan.27, 2011
Facilities Committee
(Kickoff)
(P) Approved Equipment Cleanness TF and two SNARFs which were under NA Facilities & Gas committee
(p) Approved two ballots in Cycle 1 or 2-11
Specification for Equipment Fan Filter Unit
Test Method for Equipment Fan Filter Unit

6. Upcoming meetings & Events
Event Name
Event Type
Contents
SEMICON Korea 2011
Standards Meetings
Coex, Seoul, Korea
Korea FPD Metrology Committee meeting
Korea Information & Control committee meeting
Korea Facilities committee Fall meeting
Seminar
STEP – GEM300/SECS
STEP – EHS (TBD)
3D Display
SEMI F47 Seminar
2010 Semiconductor Standards Seminar
Nov. El Tower, Seoul, Korea
Co-organized with Korea Semiconductor Industry Association, KSIA.
2 sessions, I&C and EHS (1 day program)

7. Regional Staff Contact Information
Name
Natalie Shim
Phone
Office Address
#4005 Trade Tower, Samsung-dong, Kangnam-ku, Seoul, Korea
Committees
In charge
FPD Metrology, I&C, EHS, Facilities, PV 7
Korea FPD Metrology Committee Liaison Report

8. Backup 8
2019/1/2