1. Taiwan PV Technical Committee Liaison Report
Updated October 7, 2010
Venue, Location, Date

2. Contents Leadership Update Current Committee Structure
Committee Meeting Information
SC/TF/WG Updates
Regional Staff Contact Information

3. Leadership Update Current Leader’s Name Title (Affiliation Name)
Co-chairs
Jeff Lee
(Chroma)
B.N. Chuang
(CMS-ITRI)
Y.Y. Tsai
(Delsolar)
J.S. Chen
(PVTC-ITRI)
Ray Sung
(UL Taiwan)

4. Taiwan PV Standards Technical Committee
10. 07, 2010

5. Committee Meeting Information
Last meeting
Sep. 30, 2010
ITRI, Hsinchu
Next meeting
Jan. 12, 2011

6. c-Si Cell Appearance TF
Leader
Jeff Lee/Chroma
Charter: Due to increasing demand for quality, c-Si solar cell appearance characteristics such as chipped cell, stain on cell surface, cell color etc., have become standard test requirements for c-Si solar cell manufacturing. However, no standard has been set in this field. As a result, c-Si solar cell manufacturers may receive very different specs from different customers, which dramatically increases the cost and add loading in process control. This standard aims to gather industry consensus and provide a qualification and/or classification criteria for c-Si cell appearance.
Working on draft 4833, Specification for Color reference cell and Detection of c-Si PV cell surface visible defects

7. Vibration Test Method TF
Leader
Teng-Chun Wu/ITRI
Charter: To develop technical standard specifications and guidelines related to vibration test methods and characterization of PV modules due to vibrational stress.
Drafting doc. 4997, Test Method For Mechanical Vibration of c-Si Photovoltaic (PV) Modules In Shipping Environment (ballot in cycle 7-10)

8. PV Wafer Measurement Method TF
Leader
J.C Lin/Chunson
Charter: Due to increasing demand for quality, PV Si Wafer Metrology such as Geometry (Dimensions, TTV, Warp/Sori) Electrical Character (Resistivity, Carrier Lifetime), Visible and Non-Visible Defect, Saw-Mark, Stain on Wafer Surface, etc., have become standard test requirements for c-Si (both Mono- and Multi- ) wafer manufacturing. However, no standard has been set in this field. As a result, c-Si solar wafer manufacturers are confused by very different specs with their customers, which dramatically increases the cost and add loading in process control. This standard aims to gather industry consensus and provide a qualification and/or classification criteria for c-Si Wafer Metrology.
Discussing specific standards topic for wafer measurement

9. Regional Staff Contact Information
Name
Melody Yang
Phone
Fax
Office Address
3F, 49-2, Lane 2, Sec. 2, Kuang-fu Road, Hsinchu 300, Taiwan
Other Committees
In charge
I&C / EHS / FPD / PV Committee