R NASA STEP for Aerospace Workshop at Jet Propulsion Laboratory January 27, 2000 Thomas Thurman Rockwell Collins Inc. PDES Inc. Electro-mechanical Pilot

R Exchange of data is performed using IGES or/and IDF or/and DXF. IDF and DXF is company proprietary. Requirements Circuit Board Assembly Product Package Product Dumb data EE Process Track Outlines Board Picture Isometric MCAD ECAD Mechanical Process IGES 2D IDF Smart data Electrical Mechanical Interface DXF Current Process Flow

R Exchange of data independent of process or tools. Frequency controlled by unique Business needs. Exchange of intelligent data. Requirements Circuit Board Assembly Product Package ECAD MCAD Quality Product STEP Data for Exchange AP 210 AP 203/ AP 210 Proposed Design Process Electrical Mechanical Interface Integrated 3D/2D EE/ ME library

R Configuration Managed Data Clear Definition of View Ownership Identified Relationships between mechanical and electrical views for significant product data aspects Has to be at least as good as IDF Success Criteria for Pilot

R Approach Investigate mapping between 203 & 210 Investigate mapping between IDF &210 Investigate data ownership issues between EE & ME domains vs. design life cycle using scenarios. Develop an IDF 2.0 to AP 210 translator Develop an AP 210 Assembly Viewer

R Mechanical Systems Electrical Systems CATIA Application AP203 cc 2/6 Dassault (IBM) Unigraphics Application Unigraphics Solutions (Delco/Rockwell) AP203 cc 2/6 CR-5000 PWS Application Zuken-Redac (Rockwell) IDF to AP203 cc 2 Allegro Application Cadence (IBM) IDF to AP203 cc 2 Board Station Application Mentor Graphics (Boeing/Delco) AP210 to AP203 cc 2 Solid Edge Application AP203 cc 6 Unigraphics Solutions (Boeing) ECD 2/26/99 Working with minor problems Data Transfer Between Systems

R Current Status IDF to STEP xlator developed and tested IDF to AP 210 xlator developed and tested AP 210 viewer developed and tested AP AP 203 split merge issues being studied for consensus approach

R AP 210 PWA Viewer

R Lessons Learned 203 to 210 mapping exposed issue of differences of opinion about ownership –EE driven (ground based test equipment) –ME driven (vehicle electronics) IDF to 210 translator proved that 210 can handle more significant data issues that IDF can’t. (I.e., package orientation synchronization)

R Lessons Learned Library Synchronization and data hiding issues - Not all data in libraries are proprietary. AP 210 helps distinguish proprietary and non-proprietary data. User Processes differ from casual to formal. Users want Viewers

R Model Quality Lessons AP 210 provides opportunity for model quality issues to be captured. AP 210 provides opportunity to qualify data transfer technical characteristics. –GD&T –Connectivity STEP Topology, Geometry –Impedance –Manufacturing Capabilities Design Intent