EE365 Adv. Digital Circuit Design Clarkson University Lecture #5

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Presentation transcript:

EE365 Adv. Digital Circuit Design Clarkson University Lecture #5 Electrical Behavior of Logic Circuits

Topics Electrical Characteristics Timing Characteristics Noise & Noise Margins Voltage Levels Fan-in Fan-out Output Types Timing Characteristics Transition Delay Lect #5 Rissacher EE365

Logic levels Undefined region is inherent digital, not analog Switching threshold varies with voltage, temp, process, phase of the moon need “noise margin” The more you push the technology, the more “analog” it becomes. Logic voltage levels decreasing with process 5 -> 3.3 -> 2.5 -> 1.8 V Lect #5 Rissacher EE365

Electrical Characteristics Digital analysis works only if circuits are operated in spec: Power supply voltage Temperature Input-signal quality Output loading Must do some “analog” analysis to prove that circuits are operated in spec. Lect #5 Rissacher EE365

Output Specifications Voltage: VOLmax and VOHmin Current: Output sinks current when current flows into the output - max low state output current: IOLmax Output sources current when current flow out of the output - max high state output current: IOHmax Lect #5 Rissacher EE365

DC Loading An output must sink current from a load when the output is in the LOW state. An output must source current to a load when the output is in the HIGH state. Lect #5 Rissacher EE365

Output-voltage drops Resistance of “off” transistor is > 1 Megohm, but resistance of “on” transistor is nonzero, Voltage drops across “on” transistor, V = IR For “CMOS” loads, current and voltage drop are negligible. For TTL inputs, LEDs, terminations, or other resistive loads, current and voltage drop are significant and must be calculated. Lect #5 Rissacher EE365

Output-drive specs VOLmax and VOHmin are specified for certain output-current values, IOLmax and IOHmax No need to know details about the output circuit, only the load. CMOS devices typically have two sets of output drive specs: CMOS loads TTL or other resistive loads Lect #5 Rissacher EE365

Manufacturer’s data sheet Lect #5 Rissacher EE365

Driving Non-Ideals Loads Many typical loads may be represented by a resistive network Find the Thevenin equivalent circuit (review from ES 250) of the load Compute the output current and voltages to determine if they are within specification Lect #5 Rissacher EE365

Example loading calculation Need to know “on” and “off” resistances of output transistors, and know the characteristics of the load. Lect #5 Rissacher EE365

Estimating Values for Internal Resistances Estimate the value of the internal resistances from the specification for maximum output current. Effective p-channel on resistance is Rp = [ VDD - VOHmin ] / | IOHmax | Effective n-channel on resistance is Rn = VOLmax / IOLmax Lect #5 Rissacher EE365

Example Using Estimated Values => Output Specifications for CMOS (HC) driving TTL loads VOHmin = 4.3 v VOLmax = 0.33 v IOHmax = - 4.0 ma IOLmax = 4.0 ma Rp = [5 - 4.3] v / 4 ma = 175. ohms Rn = 0.33 v / 4 ma = 82.5 ohms High State: Iout = - [5 - 3.3] / [175 + 667] = - 2 ma Vout = 5 - ( 0.002 x 175) = 4.65 v High State Model Lect #5 Rissacher EE365

Limitation on DC load If too much load, output voltage will go outside of valid logic-voltage range. VOHmin, VIHmin VOLmax, VILmax Lect #5 Rissacher EE365

Input-loading specs Each gate input requires a certain amount of current to drive it in the LOW state and in the HIGH state. IIL and IIH These amounts are specified by the manufacturer. Lect #5 Rissacher EE365

Fan-out The fan-out of a logic gate is the number of inputs that the gate can drive without exceeding its worst-case loading specs. 1 Fan-out N Lect #5 Rissacher EE365

Computing Fan-out General fan-out is the minimum of high state fan-out low state fan-out In each case, determine max input current of each expected load and max output current of the driving device Fan-out = max outputDEVICE / max inputLOAD Fan-outL = IOLmax/IILmax (for high state L H) Lect #5 Rissacher EE365

In-Class Practice Problem Find the fan-out of the following device when connected to identical devices IOLmax 0.02 mA IOHmax -0.03 mA VOLmax 0.1 V VOHmax 4.4 V IILmax ±1.0 μA IIHmax Lect #5 Rissacher EE365

In-Class Practice Problem Find the fan-out of the following device when connected to identical devices IOLmax 0.02 mA IOHmax -0.03 mA VOLmax 0.1 V VOHmax 4.4 V IILmax ±1.0 μA IIHmax -20 μA / ±1.0 μA = 20 (minimum of two states) Lect #5 Rissacher EE365

Fan-out Note Generally, when driving CMOS devices, fanout is nearly unlimited because CMOS inputs require almost no current When driving TTL devices, this is not the case Lect #5 Rissacher EE365

Fan-in For a given logic family, the maximum number of inputs available on any one gate is called the fan-in. 1 Fan-in N Lect #5 Rissacher EE365

Fan-in Limited in practice by the characteristics of a particular technology. For CMOS, limited by the additive “on” resistance of series transistors in either the PUN or PDN. Typical values are 4 for NOR gates and 6 for NAND gates. No need to calculate Lect #5 Rissacher EE365

Fan-in Cascade Structure for Large Inputs works around the fan-in limitation 8-input CMOS NAND: Lect #4 Lect #5 Rissacher EE365 Rissacher EE365

Non-Ideal Inputs What happens if the gate input is not nearly zero or nearly +5 v ? Can occur if driven by devices of another logic family (e.g. TTL drives CMOS) Inputs may still meet VIHmin or VILmax Lect #5 Rissacher EE365

Non-Ideal Inputs Output High State If Vin = 0 v. => p-channel device conducts n-channel device is off As Vin increases n-channel device begins to turn-on Output Low State If Vin = 5 v => p-channel device is off n-channel device conducts As Vin decreases p-channel device begins to turn-on Lect #5 Rissacher EE365

Non-Ideal Inputs Example: suppose input voltage is ~ 1.3 v instead of 0 v. The p-transistors will have increased resistance The n-transistors will have decreased resistance Result: output voltage will be reduced, but still above VOHmin Also increased current flow from VDD to ground Result: increased power consumption Lect #5 Rissacher EE365

Unused Inputs A three NAND is available, but you only need a two input NAND - what about the unused input? Logically, an unused input should be: a constant logic 1 for a NAND gate a constant logic 0 for a NOR gate identical to any one of the other inputs Lect #5 Rissacher EE365

Unused Inputs Lect #5 Rissacher EE365

Unused Inputs - CMOS Electrically, must NOT be left unconnected Very high input impedance => any noise can cause the apparent input value to change between a logic 0 and a logic 1. Highly susceptible to electrostatic discharge (ESD) Loose devices easily destroyed on a winter’s day in Potsdam ! Lect #5 Rissacher EE365

Unused Inputs - TTL May be left “open” (appears as logic 1) Can be changed by noise If pulled high or low by resistor, must carefully compute resistor value since input current not negligible Lect #5 Rissacher EE365

Dynamics Fanout also limited by dynamic considerations Switching from low to high state or high to low cannot happen instantly - why not ? If the load has any capacitive effects, what do you know about voltage across a capacitor? Lect #5 Rissacher EE365

Dynamics 0 v + 5 v Vout = VDD e -t/ Rn C Lect #5 Rissacher EE365

AC Loading AC loading has become a critical design factor as industry has moved to pure CMOS systems. CMOS inputs have very high impedance, DC loading is negligible. CMOS inputs and related packaging and wiring have significant capacitance. Time to charge and discharge capacitance is a major component of delay. Lect #5 Rissacher EE365

Transition times Lect #5 Rissacher EE365

Circuit for transition-time analysis Lect #5 Rissacher EE365

HIGH-to-LOW transition Lect #5 Rissacher EE365

Exponential rise time Lect #5 Rissacher EE365

LOW-to-HIGH transition Lect #5 Rissacher EE365

Exponential fall time t = RC time constant exponential formulas, e-t/RC Lect #5 Rissacher EE365

Transition-time considerations Higher capacitance ==> more delay Higher on-resistance ==> more delay Lower on-resistance requires bigger transistors Slower transition times ==> more power dissipation (output stage partially shorted) Faster transition times ==> worse transmission-line effects (Chapter 11) Higher capacitance ==> more power dissipation (CV2f power), regardless of rise and fall time Lect #5 Rissacher EE365

Open-drain outputs No PMOS transistor, use resistor pull-up Lect #5 Rissacher EE365

Open-drain transition times Pull-up resistance is larger than a PMOS transistor’s “on” resistance. Can reduce rise time by reducing pull-up resistor value But not too much Lect #5 Rissacher EE365

Power Consumption Static power dissipation - no signal transitions Dynamic power dissipation - signal transitions P = [ CPD + CL ] VDD2 f , where f is the frequency of signal transitions Lect #5 Rissacher EE365

Comparison of Signal Levels CMOS (HC, AC) CMOS (HCT, ACT) TTL (S, LS, AL, ALS, F) 0 v 5 v 5 v 5 v VOH 4.4 v VIH 3.5 v VOH 2.4 v VOH 2.4 v VIH 2.0 v VIH 2.0 v VIL 1.5 v 0.8 v 0.8 v VIL VIL VOL 0.5 v 0.4 v 0.4 v VOL VOL 0 v 0 v Lect #5 Rissacher EE365

TTL Input Specifications Unlike CMOS, TTL gates sink or source current at the input Fanout must examine input currents and output currents Low state input sources current ( it flows out of the device) High state input sinks current LS-TTL: IILmax= -0.4 mA; IIHmax= 20 A Lect #5 Rissacher EE365

TTL Output Specifications Similar to CMOS LS-TTL: IOLmax = 8 mA; IOHmax = -400 A High state fanout = low state fanout = 20 But note that TTL has very asymmetric output drive capability low state output can sink much more than high state output moderate current loads only in low state Lect #5 Rissacher EE365

TTL differences from CMOS Asymmetric input and output characteristics. Inputs source significant current in the LOW state, leakage current in the HIGH state. Output can handle much more current in the LOW state (saturated transistor). Output can source only limited current in the HIGH state (resistor plus partially-on transistor). TTL has difficulty driving “pure” CMOS inputs because VOH = 2.4 V (except “T” CMOS). Lect #5 Rissacher EE365

Next Class Timing Considerations Propagation Delay Hazards Lect #5 Rissacher EE365