Hasso Drathen page 1 ARC Conference Orlando January 2004 welcome

Hasso Drathen page 2 ARC Conference Orlando January 2004 NAMUR - the User‘s Voice User requirements and NAMUR recommendations for the interoperability across the manufacturing enterprise in the context of international standards Dr. Hasso Drathen General Manager of NAMUR and Head of Intellectual Property Services of Process Management Technology, Bayer Technology Services

Hasso Drathen page 3 ARC Conference Orlando January Member Companies

Hasso Drathen page 4 ARC Conference Orlando January 2004 Division 1 Engineering and Construction Division 2 Systems and Solutions Division 3 Field Devices Division 4 Maintenance and Services NAMUR Board of ManagementOffice General Assembly -??- VKE Anlage 1 Division 5 Explosion Protection Services Division 6 Project Group List of Characteristics PROLIST European User Association of Measurement, Automation and Process Control Technology in Chemical, Petrochemical and Pharmaceutical Industries

Hasso Drathen page 5 ARC Conference Orlando January 2004 Well known NAMUR Recommendations NE01 Noncontacting Initiators and Accompanying Switching Amplifiers - IEC "Low-voltage switch gear and control gear: Part 5-6: Control Circuit Devices and Switching Elements - Direct Current Interface for Proximity Sensors and Switching Amplifiers (NAMUR)” NE06 Electrical Standard Signals and Device Technology IEC “Analogue signals for process control systems: Part 1 Direct current signals” NE12 Explosion protection of analyser houses IEC 61285: „Industrial-process control - safety of analyzer houses“ NE31 Safety of process plants using process control systems and ISA S84 Programmable Electronic Systems for Use in Safety Applications IEC “Functional Safety - Safety Instrumented Systems for the Process Industry Sector” NE33 Requirements to be met by systems for recipe-based operations and ISA S88 Batch Control Systems IEC “Batch Control” NE58 Execution of process control projects subject to validation, and NE68, NE71, NE72 are part of GAMP - Good Automated Manufacturing Practice - Part 2

Hasso Drathen page 6 ARC Conference Orlando January 2004 NAMUR Recommendation

Hasso Drathen page 7 ARC Conference Orlando January 2004 Requirements and Offers tomorrow today

Hasso Drathen page 8 ARC Conference Orlando January 2004 The Challenges for the Interoperability of Device Data Data sheet with user requirements to instrumentation and systems basic engineering data supply data procurement data device data from the vendor detail engineering data construction data material management data plant maintenance data

Hasso Drathen page 9 ARC Conference Orlando January 2004 Data Flow and Interfaces of the Planning Process in PCE Purchasing department PLANNING PROCESS DOKUMENTATION: Data for a PCE-loop Requirem. & description Equipment data LoopsHook-ups Maintenance

Hasso Drathen page 10 ARC Conference Orlando January 2004 Data Flow and Interfaces of the Planning Process in PCE Purchasing department PLANNING PROCESS DOKUMENTATION: Data for a PCE-loop Requirem. & description Equipment data LoopsHook-ups Maintenance - device data are used See NAMUR NE 55 or ISA S20 Detail engineering Updates, Traceability Vendor Plant maintenance, Material management

Hasso Drathen page 11 ARC Conference Orlando January 2004 Using the Lists of Characteristics (LOC) ManufacturerCustomer Planning system Mainte- nance system Internet Sales system Purcha- sing system inquiry data further orders equip- ment data Deve- lopment system equip- ment data offer order decision After sales service equipment data shipping equipment data as build updates shipping

Hasso Drathen page 12 ARC Conference Orlando January 2004 General Data Model of the Device Specifications in the NE100 NE 100 Version 1.0 contains device specifications for 41 types of measuring equipment. Each device specification consists of two Lists of Characteristics (LOC): - the LOC requirements and - the LOC device Specification form (device specification) Data regarding location (LOC requirements): Design data (e.g. nominal size of connection flange) Characteristics of medium (e.g. viscosity) Environmental conditions (e.g. minimum ambient temperature) Quality and safety requirements (e.g. Ex zone) Data regarding equipment (LOC device): Design characteristics (e.g. material) Electric characteristics (e.g. load) Certificates (e.g. test certificate) Measuring accuracy (e.g. hysteresis) CAE data (e.g. connecting points) etc.

Hasso Drathen page 13 ARC Conference Orlando January 2004 PROLIST Working Groups Working groups 1.Data model 2.LV Switchgear 3.Sensors 4.Remote Operated Valves & Fittings 5.Signal Adjustment 6.Electric Drives 7.CAE Applications 8.Fieldbus

Hasso Drathen page 14 ARC Conference Orlando January 2004 NE 100 for International Standardisation The data model used in NE 100 corresponds to the most important standards in this area: IEC and ISO There exists a standard that describes how to arrange a technical description of a measuring device. This is the IEC/PAS The device descriptions of NE 100 using the LOCs will be arranged according to IEC/PAS , beginning with version 1.1. The device descriptions developed for other fields, as for remote-operated fittings, signal adjustment or electric drives will be proposed for incorporation into IEC standards.

Hasso Drathen page 15 ARC Conference Orlando January 2004 Main Task of the Project Group „Lists of Characteristics“ Development and maintenance of the device specifications (LOCs) Immediate availability of the lists of characteristics (by means both of the internal data base and NE 100) to the members of the project group (manufacturers and customers) for direct use Internationalisation of the device specifications by means of IEC standard Consideration of possibilities how to use the characteristics in order to optimise internal and external company processes

Hasso Drathen page 16 ARC Conference Orlando January 2004 Join the NAMUR Activities

Hasso Drathen page 17 ARC Conference Orlando January 2004 Thank you