Coherent X-ray Imaging Instrument WBS 1.3 Sébastien Boutet CXI Instrument Scientist April 21, 2009

Coherent Diffractive Imaging of Biomolecules One pulse, one measurement Particle injection LCLS pulse Wavefront sensor or second detector Noisy diffraction pattern Combine many measurements into 3D dataset Data Frames Combined Data Set Reconstruction

CXI Instrument Goals/Requirements Perform imaging of single particles at highest spatial resolution achievable using single LCLS pulses Image biological nanoparticles beyond the classical damage limit using single LCLS pulses Global Requirements (SP-391-000-19) Tailor and characterize X-ray beam parameters Spatial Profile Intensity Repetition rate Deliver the sample to the beam and control its environment Key Performance Parameters 4-20 keV energy range Using the fundamental and third harmonic Set by LCLS beam Particle Injector 50-500 nm size range

CXI Instrument Location Near Experimental Hall AMO SXR X-ray Transport Tunnel XPP CXI Endstation XCS Source to Sample distance : ~ 440 m Far Experimental Hall

Far Experimental Hall CXI Control Room Coherent X-ray Imaging Lab Area XCS Control Room Hutch #6 X-ray Correlation Spectroscopy Instrument Coherent X-ray Imaging Instrument

CXI Instrument Overview Guard Slits Requirement Device Remove X-ray beam halo X-ray Guard Slits Tailor X-ray intensity Attenuators Tailor X-ray repetition rate Pulse Picker Characterize X-ray pulse intensity Intensity Monitor Characterize X-ray spatial profile Profile Monitor Characterize X-ray focus Wavefront Monitor Align experiment without X-ray beam Reference Laser Maximize X-ray flux on sample Tailor focal spot size to the sample 1 micron Kirkpatrick-Baez Mirrors 0.1 micron Kirkpatrick-Baez Mirrors Minimize air scatter and background Position sample and final apertures Sample environment Position sample environment Instrument Stand Deliver particles to the X-ray beam in Particle Injector Measure X-ray scattering pattern 2D X-ray Detector (Utilizing the LCLS Detector) Position X-ray area detector Detector Stage Analysis of sample fragments after Coulomb explosion Ion Time-of-Flight Diagnostics XRT Photon Shutter Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS FEH Hutch 5 Detector Stage Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

CXI with 1 micron and Unfocused Beam Optics & Diagnostics Optics & Diagnostics Diagnostics & Wavefront Monitor 1 micron Sample Environment 1 micron KB Reference Laser

CXI with 0.1 micron Beam Optics, Diagnostics and Wavefront Monitor 0.1 micron KB & Sample Environment Reference Laser

CXI Instrument Overview Particle injector LCLS Beam Sample Chamber Precision Instrument Stand Detector Stage

(available in 2012 or before) Scope Early Science Scope (available 2011) CD 4 (available in 2012 or before) 1 micron KB System 0.1 micron KB System 1 micron Sample Chamber 0.1 micron Sample Chamber 1 micron Instrument Stand 0.1 micron Instrument Stand Detector Stage Particle Injector Reference Laser Ion TOF X-ray Slits X-ray Attenuator/Pulse Picker X-ray Diagnostics X-ray Optics and Diagnostics Support Stands Vacuum System Controls & Data Systems Hutch Facilities X-ray Detector System