Lecture #17 (cont’d from #16)

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Presentation transcript:

Lecture #17 (cont’d from #16) OUTLINE MOSFET ID vs. VGS characteristic Circuit models for the MOSFET resistive switch model small-signal model Reading Rabaey et al.: Chapter 3.3.2 Hambley: Chapter 12 (through 12.5)

MOSFET ID vs. VGS Characteristic Typically, VDS is fixed when ID is plotted as a function of VGS Long-channel MOSFET VDS = 2.5 V > VDSAT Short-channel MOSFET VDS = 2.5 V > VDSAT

MOSFET VT Measurement VT can be determined by plotting ID vs. VGS, using a low value of VDS : ID (A) VGS (V) VT

Subthreshold Conduction (Leakage Current) The transition from the ON state to the OFF state is gradual. This can be seen more clearly when ID is plotted on a logarithmic scale: In the subthreshold (VGS < VT) region, This is essentially the channel- source pn junction current. (Some electrons diffuse from the source into the channel, if this pn junction is forward biased.) VDS > 0

Qualitative Explanation for Subthreshold Leakage The channel Vc (at the Si surface) is capacitively coupled to the gate voltage VG: DEVICE CIRCUIT MODEL Using the capacitive voltage divider formula: VG VG VD n+ poly-Si Cox + Vc – n+ n+ Cdep The forward bias on the channel-source pn junction increases with VG scaled by the factor Cox / (Cox+Cdep) Wdep depletion region p-type Si

Slope Factor (or Subthreshold Swing) S S is defined to be the inverse slope of the log (ID) vs. VGS characteristic in the subthreshold region: VDS > 0 Units: Volts per decade Note that S ≥ 60 mV/dec at room temperature: 1/S is the slope

VT Design Trade-Off (Important consideration for digital-circuit applications) Low VT is desirable for high ON current IDSAT  (VDD - VT) 1 <  < 2 where VDD is the power-supply voltage …but high VT is needed for low OFF current log IDS Low VT High VT IOFF,low VT IOFF,high VT VGS

The MOSFET as a Resistive Switch For digital circuit applications, the MOSFET is either OFF (VGS < VT) or ON (VGS = VDD). Thus, we only need to consider two ID vs. VDS curves: the curve for VGS < VT the curve for VGS = VDD ID VGS = VDD (closed switch) Req VDS VGS < VT (open switch)

Equivalent Resistance Req In a digital circuit, an n-channel MOSFET in the ON state is typically used to discharge a capacitor connected to its drain terminal: gate voltage VG = VDD source voltage VS = 0 V drain voltage VD initially at VDD, discharging toward 0 V The value of Req should be set to the value which gives the correct propagation delay (time required for output to fall to ½VDD): Cload

Typical MOSFET Parameter Values For a given MOSFET fabrication process technology, the following parameters are known: VT (~0.5 V) Cox and k (<0.001 A/V2) VDSAT ( 1 V) l ( 0.1 V-1) Example Req values for 0.25 mm technology (W = L): How can Req be decreased?

P-Channel MOSFET Example In a digital circuit, a p-channel MOSFET in the ON state is typically used to charge a capacitor connected to its drain terminal: gate voltage VG = 0 V source voltage VS = VDD (power-supply voltage) drain voltage VD initially at 0 V, charging toward VDD VDD 0 V iD Cload

Common-Source (CS) Amplifier The input voltage vs causes vGS to vary with time, which in turn causes iD to vary. The changing voltage drop across RD causes an amplified (and inverted) version of the input signal to appear at the drain terminal. VDD RD iD vs + vOUT = vDS   + + vIN = vGS  VBIAS + –

Notation Subscript convention: Double-subscripts denote DC sources: VDS  VD – VS , VGS  VG – VS , etc. Double-subscripts denote DC sources: VDD , VCC , ISS , etc. To distinguish between DC and incremental components of an electrical quantity, the following convention is used: DC quantity: upper-case letter with upper-case subscript ID , VDS , etc. Incremental quantity: lower-case letter with lower-case subscript id , vds , etc. Total (DC + incremental) quantity: lower-case letter with upper-case subscript iD , vDS , etc.

Load-Line Analysis of CS Amplifier The operating point of the circuit can be determined by finding the intersection of the appropriate MOSFET iD vs. vDS characteristic and the load line: iD (mA) load-line equation: vGS (V) vDS (V)

Voltage Transfer Function vOUT Goal: Operate the amplifier in the high-gain region, so that small changes in vIN result in large changes in vOUT vIN (1): transistor biased in cutoff region (2): vIN > VT ; transistor biased in saturation region (3): transistor biased in saturation region (4): transistor biased in “resistive” or “triode” region

Quiescent Operating Point The operating point of the amplifier for zero input signal (vs = 0) is often referred to as the quiescent operating point. (Another word: bias.) The bias point should be chosen so that the output voltage is approximately centered between VDD and 0 V. vs varies the input voltage around the input bias point. Note: The relationship between vOUT and vIN is not linear; this can result in a distorted output voltage signal. If the input signal amplitude is very small, however, we can have amplification with negligible distortion.

Bias Circuit Example VDD RD R1 R2

Rules for Small-Signal Analysis A DC supply voltage source acts as a short circuit Even if AC current flows through the DC voltage source, the AC voltage across it is zero. A DC supply current source acts as an open circuit Even if AC voltage is applied across the current source, the AC current through it is zero.

NMOSFET Small-Signal Model + vgs  id + vds  gmvgs ro S S transconductance output conductance

Small-Signal Equivalent Circuit D + vin  + vgs  + vout  R1 R2 gmvgs ro RD S S voltage gain