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October RRB G. Darbo & H. Pernegger RRB – October 2010 o October RRB Slides for Marzio’s RRB talk CERN, October, 11 th 2010 G. Darbo & H. Pernegger.

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Presentation on theme: "October RRB G. Darbo & H. Pernegger RRB – October 2010 o October RRB Slides for Marzio’s RRB talk CERN, October, 11 th 2010 G. Darbo & H. Pernegger."— Presentation transcript:

1 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 o IBL @ October RRB Slides for Marzio’s RRB talk CERN, October, 11 th 2010 G. Darbo & H. Pernegger

2 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 2 Material from Raphael/Neal The Insertable B-Layer (IBL) is a fourth layer added to the present Pixel detector between a new beam pipe and the current inner Pixel layer (B-layer). IST IBL Support Tube Alignment wires PP1 Collar IBL Detector IBL Staves Sealing service ring IBL key Specs / Params 14 staves, = 33.25 mm CO 2 cooling, T < -15ºC @ 0.2 W/cm 2 X/X 0 < 1.5 % (B-layer is 2.7 %) 50 µm x 250 µm pixels 1.8º overlap in ϕ, <2% gaps in Z 32/16 single/double FE-I4 modules per stave Radiation tolerance 5x10 15 n eq /cm 2 IBL key Specs / Params 14 staves, = 33.25 mm CO 2 cooling, T < -15ºC @ 0.2 W/cm 2 X/X 0 < 1.5 % (B-layer is 2.7 %) 50 µm x 250 µm pixels 1.8º overlap in ϕ, <2% gaps in Z 32/16 single/double FE-I4 modules per stave Radiation tolerance 5x10 15 n eq /cm 2

3 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 3 IBL Layout Beam-pipe reduction: Inner R: 29  25 mm Very tight clearance: “Hermetic” to straight tracks in Φ (1.8º overlap) No overlap in Z: minimize gap between sensor active area. Material budget: IBL Layer (with IST): 1.5 % of X 0 Other Pixel layers: ~2.7 % of X 0 Beam-pipe (BP) extracted by cutting the flange on one side and sliding (guiding tube inside). IBL Support Tube (IST) inserted. IBL with smaller BP inserted in the IST

4 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 4 IBL Technical Design Report ATLAS TDR includes: Overview and motivation for the project Study of the physics performance Technical description of the project with baseline and options for critical issues Three sensor technologies. Beam-pipe, extraction/insertion, installation, ALARA. Organization of the project and resources Editorial team: M. Capeans (technical editor), G. Darbo, K. Einsweiller, M. Elsing, T. Flick, M. Garcia-Sciveres, C. Gemme, H. Pernegger, O. Rohne and R. Vuillermet. Approved by the ATLAS Collaboration Board (October 2010 ATLAS Week) 43 Institutions and 300 people in IBL CERN-LHCC-2010-13, ATLAS TDR 19

5 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 5 Physics Performance b-tagging performance crucial for: New Physics (3 rd generation !) observation of H → bb through boosted WH production Main conclusions of IBL performance Task Force: performance at 2x10 34 with IBL is equal to or better than present ATLAS without pile-up w/o IBL and 10% B-layer inefficiency: b-tagging ~ 3 times worse at 2x10 34 than today b-tagging with pile-up & inefficiencies b-tagging with pile-up 2 jets of 500 GeV event with 2 x 10 34 pile-up Same event w/o pile-up IBL IBL Physics & Performance Task Force – M. Elsing et al.

6 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 6 The New Front-end Chip (FE-I4) 18 160 FE-I3 (Pixel) FE-I4 (IBL) 80 columns 336 rows 19 mm 20.2 mm 60 KGD / Wafer

7 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 7 Sensor Technologies for IBL Planar sensors (3 producers) slim edge n-in-n & n-in-p require the lowest temperature and high bias voltage. have very well understood manufacturing sources, mechanical properties, relatively low cost, and high yield. ATLAS Pixel FE-I3 diamond module IBL FE-I4 diamond sensors Thin n-in-p Planar Sensor 3D Sensor 450 µm n-in-n slim edge IBL layout 3D column 11 µm 3D sensors (3 producers) Active edge, single/double side require the lowest bias voltage, intermediate operating temperature, and achieve the highest acceptance due to active edges. their manufacturability with high yield and good uniformity must be demonstrated. Diamond sensors (2 producers) polycrystalline CVD (pCVD) require the least cooling and have similar bias voltage requirements to planar sensors. their manufacturability with high yield, moderate cost, and good uniformity must all be demonstrated. Selection in summer 2011 Three candidate sensor technologies address the IBL requirements with different trade-offs: Prototyping with FE-I4 – qualification with irradiation (5x10 15 n eq /cm 2 ) and test beam – production yield

8 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 8 SPARE SLIDES

9 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 9 History of IBL Project - Time Line 1998: Pixel TDR B-layer designed to be substituted every 3 years of nominal LHC (300 fb -1 ): due to then available radiation hard sensor and electronic technologies. 2002: B-layer replacement became part of ATLAS planning and was put into the M&O budget to RRB. 2008: B-layer taskforce B-layer replacement cannot be done – Engineering changes to fulfil delayed on- detector electronics (FE-I3, MCC) made it impossible even in a long shut down. Best (only viable) solution: “make a new smaller radius B-layer insertion using technology being developed for HL-LHC prototypes”. This became the IBL. 2009: ATLAS started IBL project: February: endorsed IBL PL and TC April: IBL organization in place (Endorsed by the ATLAS EB) 2010: TDR and interim-MoU TDR is under approval in ATLAS Interim-MoU is collecting last signatures.

10 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 10 Interim-MoU - Institutions There are 43 institutions in the IBL project Large interest for the sensor (22 Institutions) Full effort and funding requirements are covered 300 people have expressed their interest to contribute to the project many have already started to work. In most cases institutes contribute with money where also there is contribution with manpower.

11 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 11 Management Board (MB) Module WG (2 cordinators) FE-I4 Sensors Bump-Bonding Modules Procurement & QC Irradiation & Test Beam Module WG (2 cordinators) FE-I4 Sensors Bump-Bonding Modules Procurement & QC Irradiation & Test Beam Stave WG (1 Phys + 1 Eng.) Staves Cooling Design & Stave TM HDI (Flex Hybrid) Internal services Loaded stave Procurement & QC Stave WG (1 Phys + 1 Eng.) Staves Cooling Design & Stave TM HDI (Flex Hybrid) Internal services Loaded stave Procurement & QC Integration & Installation WG (2 Eng.) Stave Integration Global Supports BP procurement Ext. services inst. BP extraction IBL+BP Installation Cooling Plant Integration & Installation WG (2 Eng.) Stave Integration Global Supports BP procurement Ext. services inst. BP extraction IBL+BP Installation Cooling Plant Off-detector (1 Phys + 1 E.Eng.) BOC/ROD Power chain & PP2 DCS & interlocks Opto-link Ext. serv.design/proc. Procurement & QC System Test Off-detector (1 Phys + 1 E.Eng.) BOC/ROD Power chain & PP2 DCS & interlocks Opto-link Ext. serv.design/proc. Procurement & QC System Test IBL Management Board (MB) Membership: IBL PL + IBL TC 2 cordinators from each WG Plus “extra” members IBL Management Board (MB) Membership: IBL PL + IBL TC 2 cordinators from each WG Plus “extra” members MB ad-interim membership IBL Project Leader: G. Darbo IBL Technical Coordinator: H. Pernegger “Module” WG (2 Physicists): F. Hügging & M. Garcia- Sciveres “Stave” WG (1 Phy. + 1 M.E.): O. Rohne + D. Giugni “IBL Assembly & Installation” WG (2 M.E. initially, a Phy. Later): F. Cadoux + R. Vuillermet “Off-detector” WG (1 Phy. + 1 E.E.): T. Flick + S. Débieux “Extra” members: IBL/Pixel “liaison”: Off-line SW: A. Andreazza, DAQ: P. Morettini, DCS: S. Kersten Ex officio: Upgrade Coordinator (N. Hessey), PO Chair (M. Nessi), Pixel PL (B. Di Girolamo), ID PL (P. Wells), IB Chair (C. Gößling)

12 IBL @ October RRB G. Darbo & H. Pernegger RRB – October 2010 12 FE-I4 Table FE-I3FE-I4 Pixel size [µm 2 ]50x40050x250 Pixel array18x16080x336 Chip size [mm 2 ]7.6x10.820.2x19.0 No. of transistors [millions]3.587 Active fraction74%89% Analog/digital current [µA/pix]26 / 1710 / 10 Digital current [µA/pix]1710 Analog/digital voltage [V]1.6 / 2.01.5 / 1.2


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