1. An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets Abhijit Jas, Kartik Mohanram, and Nur A. Touba Eighth Asian Test Symposium, 1999. (ATS '99), Page(s): 275 -280 Presented by Kao, Chung-Fu

2. What’s the Problem ? How to reduce the core testing time ? How to use a very small number of test vectors ? If it’s necessary to modify a core, does it compatible with ordinary core ?

3. Introduction The difficulty and cost of testing SOC are escalating rapidly. The idea is to create a DFHTC (Design for High Test Compression) core – Can be tested with a small number of test vectors compared to the ordinary core

4. Introduction (cont’d) Internally, the actual number of test vectors that are applied to the core is much larger. – Compress test vectors outside This methodology uses PRPG (Pseudo Random Pattern Generators) mechanism.

5. It’s different from BIST The disadvantages of BIST – Non-trivial to achieve high fault coverage – Should insert some test points – Pure BIST required long test lengths The advantages of DFHTC core – Compatible with scan chain design – Achieves a high fault coverage

6. Architecture Overview Serial In Parallel Out Shift register

7. Action 1. Initial Seed 2. Serial input 3. Scan finish 4. Parallel input to all PRPGs and locks the First PRPG

8. Example of Test Vectors The highlighted (red) portions of the test vectors have been shifted into the core from outside, and the PRPG has been locked. T11111 1000 0011 T20111 0100 0001 0011 0010 1000 0001 1001 0100 1000 1100 0010 1000 0110 1001 1000 1011 1100 1000 0101 0110 1000 1010 1011 1000 1010 0101 1000 1010 1010 T121000 1010 1101 T131000 1010 1110

9. Constructing a Highly Compressed Scan Vector Assume that we have a CUT with bN inputs – N PRPGs each b bits wide ATPG – target some undetected fault

10. Experimental Results

11. Conclusion A DFHTC core reduces test time and tester memory requirements. The DFHTC mechanism is compatible with ordinary cores – Has the same test I/O pins, can use the same tester program A DFHTC core will reduce test costs for system integrator.