1. 1 Carleton/Montreal Electronics development J.-P Martin (Montreal) Shengli Liu & M. Dixit (Carleton) LC TPC Meeting DESY Hamburg, 4 June 2007

2. 2 Development based on KOPIO VF48 prototype readout card 48 differential inputs Low pass filters FADC drivers Baseline offset (48 channels) LVDS LINK (RJ45) 10 bit FADCs 25 - 65 Ms/sec. 6 octal chips, 48 channels Front end FPGAs (6) Latency and raw data event buffers. Pulse shape analysis: time vernier, uncalibrated charge Output serializer Collector FPGA (1) Sub event builder. VME A24D32 interface LVDS Link interface Parameters protocol VME bus Local system clock System clock selector DownCLK 25 MHz VME serCLK, for one crate test system VME Local LVDS,200 Mbauds 25 MHz Down Link (200 Mbauds) Up CLK (25 MHz) UP Link (200 Mbauds) serDAT (SPILL) From preamps NIM L0 trigger

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4. 4 General specifications Input: 48 differential pairs, 100 position connector, fine pitch flat cable. (now 3 X 34 position normal pitch connectors) Analog conditioning: - fixed gain (1x to 20x practical) - low pass filter (Nyquist) FADC: 10 bits, +- 0.5Volts full scale. Trigger window: 0 to 100 microseconds Hit detector pulse shape segments: 0 to 4 microseconds, retriggable Firmware digital filters/shapers VME A32D64 interface

5. 5 New TPC readout cards being developed, will be more closely related to the LTPC requirements. New generation of 12-bit 50MS/sec FADCs (the one with LVDS serial output at 600 MHz). A small 16-channel prototype with an USB interface to study the problems related to 600 MHZ serial readout of new FADCs has been designed Test cards fabricated Presently being assembled Will incorporate power pulsing in next generation Combine tests of new electronics with proposed 2008 Fermilab TPC tests in 1-2 T magnet with ILC beam structure.