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A Digitization Scheme of Sub-uA Current Using a Commercial Comparator with Hysteresis and FPGA-based Wave Union TDC Wu, Jinyuan Fermilab Sept. 2012.

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Presentation on theme: "A Digitization Scheme of Sub-uA Current Using a Commercial Comparator with Hysteresis and FPGA-based Wave Union TDC Wu, Jinyuan Fermilab Sept. 2012."— Presentation transcript:

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2 A Digitization Scheme of Sub-uA Current Using a Commercial Comparator with Hysteresis and FPGA-based Wave Union TDC Wu, Jinyuan Fermilab Sept. 2012

3 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 2 Introduction A current-to-frequency converting oscillator built with an ADCMP605+2R+C. Small current input can be directly interfaced without pre-amplifier. Variations of current are translated into output frequency. FPGA Wave Union TDC with measurement resolution 25-30 ps can be used to measure times of comparator output logic transitions.

4 The Current to Frequency Converting Oscillator Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 3

5 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 4 The Current to Frequency Converting Oscillator The input to the hysteresis causes variation to the high and low thresholds of the comparator. The oscillation frequency changes accordingly. The input waveform can be reconstructed from the logic transition times. -+-+ HYS -+-+ In Vout Vo+ In Vo-

6 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 5 The Comparator Devices ADCMP601 and ADCMP605 are comparators with hysteresis input. Small variations of input current in HYS pin translated into hysteresis voltage changes. The fully differential topology with ADCMP605 was used in our test.

7 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 6 The Input Current and the Output Frequency When input current changes, out oscillating frequency deviating from nominal oscillating frequency. The input amplitude used here is significantly larger than normal operation for demo purpose.

8 The Wave Union TDC Implemented in FPGA Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 7

9 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 8 TDC Using FPGA Logic Chain Delay This scheme uses current FPGA technology Low cost chip family can be used. (e.g. EP2C8T144C6 $31.68) Fine TDC precision can be implemented in slow devices (e.g., 60 ps in a 400 MHz chip). IN CLK

10 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 9 Two Major Issues In an FPGA TDC 1. Widths of bins are different and varies with supply voltage and temperature. 2. Some bins are ultra-wide due to LAB boundary crossing

11 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 10 Wave Union Launcher A In CLK 1: Unleash0: Hold Wave Union Launcher A Regular TDC records only one transition Wave Union TDC records multiple transitions.

12 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 11 Wave Union Launcher A: 2 Measurements/hit 1: Unleash

13 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 12 Output Raw Data and Typical Delta T Histogram Between Two Channels RMS of this histogram is 25 ps. 00003C C064A6 F064B8 C07CA4 F07CB4 C094A0 F094B0 C0AC9C F0ACAC C0C497 F0C4A8 C0DC91 F0DCA2

14 Bench-top Tests Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 13

15 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 14 Test Hardware An ADCMP605 + 2R, 1C are used to build a current controlled oscillator. The output and oscillator network are fully differential. Nominal sampling rate: 50-60 M samples/s.

16 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 15 Waveform Digitization Result Times of oscillating transition edges are measured. Both periods between positive and negative edges are calculated and their deviations from the nominal period are converted to current. The input pulse is a single cycle sine wave with peak current 200 nA and base width 2x200 ns. Charge movement of the pulse: +-200 nA x 200 ns x 0.64 = +- 25 fC.

17 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 16 Measurement Resolution For DC input current, the oscillator timing jitters for transition edges are measured. Pulse width RMS jitter: 280 ps. Period RMS jitter: 470 ps. The FPGA TDC’s with measurement resolution better than 25 ps fulfill the requirements easily.

18 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 17 Trade-off Between Sampling Rate and Resolutions Consider time interval T(n) between edge 0 and edge n. Sensitivity:  T(n)/  I ~ n Timing jitter:  (T(n)) ~ sqrt(n) Faster sampling rate: Coarser  (I) Finer  (Q) Slower sampling rate: Finer  (I) Coarser  (Q) The users can choose post process to suit their application.  I=250nA  I=30nA  t=1000ns  t=16ns

19 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 18 Resolutions and Sensitivities of Different Transitions Each band of the M1 plot represents the transition time. Vertical axis scale of M1: 2 us (the full scale of the left screen shot) Slower sampling rates make current measurements with better resolutions. FYI: M1 = CH1*AND(CH3>1.24,CH3<1.26) (Note: CH3 and CH4 50% level = 1.25V) 2us

20 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 19 Performance of a Test Sampling rate53 M samples/s C urrent-to-time conversion ratio 5.9 ns/uA Timing jitter of the pulse width (RMS)281 ps Current measurement resolution at 53 M samples/s (RMS)47 nA Current measurement resolution at 1 M samples/s (RMS)6.5 nA (Estimate) Product of 3-sigma current * sampling period2.7 fC Power consumption (Oscillator)37 mW/channel Power consumption (TDC)27 mW/channel This is only a preliminary test. Not every drop of oil is squeezed out. Rooms for improvements and optimization are clearly available. Colleagues are encouraged to try different configurations.

21 Open-Loop Gain vs. Deep Negative Feedback Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 20

22 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 21 Deep Negative Feedback Analog electronics has been based on deep negative feedback. We subconsciously apply deep negative feedback when we design analog circuits. Amplification ability is traded-off for better gain stability, linearity and flat bandwidth. -+-+

23 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 22 ADC w/ Comparators: Taking Advantage of Open-Loop Gain In digitization tasks, the primary requirement is to translate analog input into logic levels before it is contaminated by the noise. All nonlinearity, gain variation etc. can be calibrated in digital domain. In this example, the input voltage is compared with a known ramping reference voltage. When reference voltage passes through the input level, the comparator amplifies the voltage difference with its open-loop gain. -+-+ In Vout

24 A Collection of Examples Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 23

25 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 24 Ramp-Compare (Single Slope) ADC The input voltage is compared with a known ramping reference voltage. The input is sampled at fixed rate and the waveform can be reconstructed from the logic transition times of the comparator output. Both single-ended and differential versions are available. The FPGA LVDS input buffers can be used as the comparators and multi-channel ADC’s can be implemented with minimum external components. (4 resistors/CH for differential version.) -+-+ -+-+ In Vout Vo+ In+ Vo- In- 7-bit @ 62.5 MHz

26 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 25 The Duty Cycle Modulation Oscillator The pulse widths depend on the input voltage level. The oscillator circuit is self-contained without external supports and is suitable for remote operation. -+-+ HYS In Vout

27 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 26 Time Over Threshold (TOT) The leading edge time of the input pulse is accurately captured. Pulse width is correlated with the pulse charge. The FPGA LVDS input buffers can be used as the comparators. Multi-channel T&Q measurements can be implemented in FPGA without external components. -+-+ In Vout

28 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 27 Dynamic Time Over Threshold (DTOT, TODT) The leading edge time of the input pulse is accurately captured. The pulse width is nearly linearly correlated with total charge. Better signal to noise ration (S/N) is anticipated. -+-+ In Vout FF

29 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 28 Time Over Oscillating Threshold (TOOT) The leading edge time of the input pulse is accurately captured. The circuit is simpler than TODT. Multiple points are sampled on the pulse waveform. In Vout -+-+ HYS

30 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 29 Summary Tests are performed with ADCMP605 oscillator. Current measurement resolution of 47 nA (RMS) is achieved at 53 M sample/s, 6.5 nA (RMS) at 1 M samples/s is anticipated. At 53 M samples/s, the product of 3-sigma current x sampling period is 2.7 fC. Power consumptions for the oscillator and TDC are 37 mW and 27 mW/channel, respectively.

31 The End Thanks

32 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 31 Wave Union Launcher B Wave Union Launcher B In CLK 1: Oscillate0: Hold

33 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 32 Cell Delay-Based TDC + Wave Union Launcher Wave Union Launcher In CLK The wave union launcher creates multiple logic transitions after receiving a input logic step. The wave union launchers can be classified into two types: Finite Step Response (FSR) Infinite Step Response (ISR) This is similar as filter or other linear system classifications: Finite Impulse Response (FIR) Infinite Impulse Response (IIR)

34 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 33 Wave Union Launcher A 1: Unleash0: Hold In CLK

35 Wave Union? Photograph: Qi Ji, 2010 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov 34 A Sub-microampere Digitization Scheme

36 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 35 A Current to Frequency Converter The -+-+ HYS -+-+

37 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 36 Auto Calibration Using Histogram Method It provides a bin-by-bin calibration at certain temperature. It is a turn-key solution (bin in, ps out) It is semi-continuous (auto update LUT every 16K events) DNL Histogram In (bin) LUT  Out (ps) 16K Events

38 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 37 Good, However Auto calibration solved some problems However, it won’t eliminate the ultra-wide bins 

39 Sept. 2012, Wu Jinyuan, Fermilab jywu168@fnal.gov A Sub-microampere Digitization Scheme 38 Sub-dividing Ultra-wide Bins 1: Unleash 1 2 12 Device: EP2C8T144C6 Plain TDC:  Max. bin width: 160 ps.  Average bin width: 60 ps. Wave Union TDC A:  Max. bin width: 65 ps.  Average bin width: 30 ps.


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