1. North America Automated Test Equipment Committee
Liaison Report
June 2011

2. Current Committee Structure
Automated Test Equipment Committee
C: Ajay Khoche / Consultant
Standard Test Data Format (STDF) TF
L: Ajay Khoche / Consultant
Test Cell Communications TF
L: Len van Eck / LTX Credence L: Mark Roos / Roos Instruments
June 2011
NA ATE Committee

3. Leadership Committee Co-chairs Ajay Khoche (Consultant) June 2011
NA ATE Committee

4. Meeting Information Last meeting Next meeting
July 14, 2010 at SEMICON West San Francisco, California
Next meeting
July 13, 2011 at SEMICON West San Francisco, California
June 2011
NA ATE Committee

5. Task Force Updates Standard Test Data Format (STDF) TF
Ballot #4782B was submitted for the Cycle 3, 2011 voting period and achieved the 60% return rate
Both ballots #4782 and #4782A previously failed to reach the 60% return rate requirement
Ballot #4782B will be adjudicated at SEMICON West 2011
Teradyne has granted a world-wide royalty-free license of STDF and any intellectual property rights, to SEMI to use, distribute, modify and support STDF
June 2011
NA ATE Committee

6. Task Force Updates Test Cell Communications TF
No recent Standards activities
June 2011
NA ATE Committee

7. NA ATE Standards due for Five-Year Review
SEMI
Document Title
Status
G79
Specification for Overall Digital Timing Accuracy
Two NA ATE committee members volunteered to review and determine whether this standard needs to be revised.
Update: No responses have been received by SEMI staff to date. Committee to discuss next step/action for G79 and G80 at SEMICON West.
G80
Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
G84
Specification for Strip Map Protocol
NA ATE allowed G84 and G85 to go into inactive status.
G85
Specification for Map Data Format
G78
Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific Measurements
Ballot 5011A was submitted for the Cycle 3 voting period and achieved the 60% return rate requirement. Ballot 5011A will be adjudicated at SEMICON West.
June 2011
NA ATE Committee

8. Thank You!
For more information or participate in any NA ATE activities, please contact Paul Trio at SEMI
June 2011
NA ATE Committee

9. Back-up
June 2011
NA ATE Committee

10. NA ATE Standards due for Five-Year Review
SEMI
Document Title
Status
G79
Specification for Overall Digital Timing Accuracy
Two NA ATE committee members volunteered to review and determine whether this standard needs to be revised.
G80
Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
G84
Specification for Strip Map Protocol
NA ATE suggested to contact Dave Huntley, Sort Map TF leader, for inputs. Dave Huntley recommended that G84 and G85 be allowed to go into inactive status since E142 offers clear and preferred alternative. Also recommended for G81 to go into inactive status. NA ATE to determine course of action at SEMICON West meeting.
G85
Specification for Map Data Format
G78
Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific Measurements
NA ATE suggested to contact PIC and I&C Committees to determine whether there is interest in updating this document. If there is no interest, the committee suggested to withdraw this standard.
June 2011
NA ATE Committee

11. Task Force Updates Standard Test Data Format (STDF) TF
TF Leader: Ajay Khoche (Consultant)
Charter:
Extend the Standard Test Data Format to enable a new fail datalog standard for storing Structural test fail datalog for yield enhancements
June 2011
NA ATE Committee

12. Task Force Updates Standard Test Data Format (STDF) TF (cont’d) Scope:
Definition:
Complete the definition and review of Memory fail datalog
Facilitate maintenance and evolution of the format with emerging needs
Validation:
Validation test case generation
Facilitating validation of the standard through beta sites
Deployment
Development of standard API for Reading/Writing STDF V records
Development of reference flow specification
Development of tools for interoperability certification of readers and writers
Optimization:
Development of Benchmarks and tools for interoperability certification of readers and writers
Enabling information generation and propagation through the diagnosis loop for optimal flow enablement using STDF
June 2011
NA ATE Committee

13. NA ATE Committee Meeting
February 23 TC Meeting Highlights:
Approved formation of the Test Cell Communications Task Force
Standard Test Data Format (STDF) Task Force Updates
Discussed NA ATE documents due for Five-Year Review
Japan ATE Committee Updates
Staff Report
June 2011
NA ATE Committee

14. New NA ATE Task Force Test Cell Communications Task Force Charter:
To develop and define standard communications methods with in the test cell
Scope:
The task force will examine existing methods of communication, define data sources and data consumers within the test cell with the intent to streamline and standardize the way equipment creates and shares data
Initial activity will include the examination of the following documents:
For the low level comm (ethernet): SEMI E37 and E37.
For message format: SEMI E5
For message content: SEMI E39
For the model: SEMI E30,E122
Leadership:
Len van Eck (LTX)
Mark Roos (Roos Instruments)
June 2011
NA ATE Committee

15. NA ATE Meeting at SEMICON West 2009
Attendance: 10
Discussion topics included:
Overview of the SEMI Standards process
Overview of the SEMI Special Interest Group (CAST) and its role in SEMI Standards
Background information on its working groups and current activities
Formation of the Standard Test Data Formation (STDF) Task Force and approval of Memory STDF activity (SNARF #4782)
New standard proposal on ATE Test Programs Management
Staff and liaison reports
June 2011
NA ATE Committee