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ELEC 7770 Advanced VLSI Design Spring 2016 Power and Ground

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Presentation on theme: "ELEC 7770 Advanced VLSI Design Spring 2016 Power and Ground"— Presentation transcript:

1 ELEC 7770 Advanced VLSI Design Spring 2016 Power and Ground
Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

2 ELEC 7770: Advanced VLSI Design (Agrawal)
References Q. K. Zhu, Power Distribution Network Design for VLSI, Hoboken, New Jersey: Wiley, 2004. M. Popovich, A. Mezhiba and E. G. Friedman, Power Distribution Networks with On-Chip Decoupling Capacitors, Springer, 2008. C.-K. Koh, J. Jain and S. F. Cauley, “Synthesis of Clock and Power/Ground Network,” Chapter 13, L.-T. Wang, Y.-W. Chang and K.-T. Cheng (Editors), Electronic Design Automation, Morgan-Kaufmann, pp J. Fu, Z. Luo, X. Hong, Y. Cai, S. X.-D. Tan, Z. Pan, “VLSI On-Chip Power/Ground Network Optimization Considering Decap Leakage Currents,” Proc. Asia and South Pacific Design Automation Conf., 2005 , pp Decoupling Capacitors, Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

3 ELEC 7770: Advanced VLSI Design (Agrawal)
Supply Voltage 3.0 2.5 2.0 1.5 1.0 0.5 0.0 Supply voltage (V) Minimum feature size (μm) Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

4 ELEC 7770: Advanced VLSI Design (Agrawal)
Gate Oxide Thickness 60 50 40 30 20 10 Gate oxide thickness (A) High gate leakage Minimum feature size (μm) Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

5 ELEC 7770: Advanced VLSI Design (Agrawal)
Power Supply Noise Transient behavior of supply voltage and ground level. Caused by transient currents: Power droop Ground bounce Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

6 ELEC 7770: Advanced VLSI Design (Agrawal)
Power Supply V(t) Gate 2 Rg + R C R C VDD Gate 1 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

7 ELEC 7770: Advanced VLSI Design (Agrawal)
Switching Transients Only Gate 1 switches (turns on): V(t) = VDD – Rg VDD exp[– t/{C(R+Rg)}]/(R+Rg) VDD VDD[1 – Rg/(R+Rg)] V(t) 0 time, t Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

8 Multiple Gates Switching
VDD 1 2 3 Gate output voltage Number of gates switching many 0 time, t Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

9 ELEC 7770: Advanced VLSI Design (Agrawal)
Decoupling Capacitor A capacitor to isolate two electrical circuits. Illustration: An approximate model: i(t) VL(t) t=0 a Rg VDD = 1 t=0 t + Rd Cd IL Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

10 Approximate Load Current, IL
0, t < 0 at, t < tp IL = a(2tp – t), t < 2tp 0, t > 2tp Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

11 Transient Load Voltage
VL(t) = 1 – a Rg [ t – Cd Rg (1 – e – t/T) ], 0 < t < tp T = Cd (Rg + Rd) Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

12 Realizing Decoupling Capacitor
VDD VDD OR S B D S B D GND GND Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

13 ELEC 7770: Advanced VLSI Design (Agrawal)
Capacitance Cd = γ×WL×ε×ε0/Tox ≈ 0.26fF, for 70nm BSIM L = 38nm, W = 200nm γ = ε = 4 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

14 ELEC 7770: Advanced VLSI Design (Agrawal)
Leakage Resistance Igate = α × e – βTox ×W where α and β are technology parameters. Rd = VL(t)/Igate Because V(t) is a function of time, Rd is difficult to estimate. The decoupling capacitance is simulated in spice. Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

15 ELEC 7770: Advanced VLSI Design (Agrawal)
Power-Ground Layout Solder bump pads Vss Vss Vdd M5 Vdd/Vss supply Vdd/Vss equalization M4 Via Vss Vdd Vdd Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

16 ELEC 7770: Advanced VLSI Design (Agrawal)
Power Grid + Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

17 ELEC 7770: Advanced VLSI Design (Agrawal)
Nodal Analysis V2 g2 g1 g3 Vi V1 V3 g4 Ci Apply KCL to node i: 4 ∑ (Vk – Vi) gk – Ci ∂Vi/∂t = Bi k=1 Bi V4 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

18 ELEC 7770: Advanced VLSI Design (Agrawal)
Nodal Analysis G V – C V’ = B Where G is conductance matrix V is nodal voltage vector C is capacitance matrix B is vector of currents V(t) is a function of time, V(0) = VDD B(t) is a function of time, B(0) ≈ 0 or leakage current Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

19 Wire Width Considerations
Increase wire width to reduce resistance: Control voltage drop for given current Reduce resistive loss Reduce wire width to reduce wiring area. Minimum width restricted to avoid metal migration (reliability consideration). Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

20 A Minimization Problem
Minimize total metal area: n n A = ∑ wi si = ∑ | ρ Ci si2 | / xi i=1 i=1 Where n = number of branches in power network wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch Subject to several conditions. Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

21 Condition 1: Voltage Drop
Voltage drop on path Pk: ∑ xi ≤ Δvk i ε Pk Where Δvk = maximum allowable voltage drop on kth path Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

22 Condition 2: Minimum Width
Minimum width allowed by fabrication process: wi = ρ Ci si / xi ≥ W Where wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch W = minimum line width Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

23 Condition 3: Metal Migration
Do not exceed maximum current to wire-width ratio: Ci / wi = xi /(ρ si) ≤ σi Where wi = metal width of ith branch si = length of ith branch ρ = metal resistivity Ci = maximum current in ith branch xi = voltage drop in ith branch σi = maximum allowable current density across ith branch Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

24 Decoupling Capacitance
Rg VDD + Cd I(t) Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

25 Decoupling Capacitance
Initial charge on Cd, Q0 = Cd VDD I(t): current waveform at a node T: duration of current Total charge supplied to load: T Q = ∫ I(t) dt Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

26 Decoupling Capacitance
Assume that charge is completely supplied by Cd. Remaining charge on Cd = Cd VDD – Q Voltage of supply node = VDD – Q/Cd For a maximum supply noise ΔVDDmax, VDD – (VDD – Q/Cd) ≤ ΔVDDmax Or Cd ≥ Q / ΔVDDmax Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

27 A High-Voltage On-Chip Power Distribution Network
Master’s Thesis Mustafa M. Shihab Auburn University ECE Department June 2013 June 28, 2013 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

28 On-Chip Power Distribution Network
Power Distribution ‘Grid’: Source: N. Weste et al., CMOS VLSI design: A Circuits and Systems Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

29 ELEC 7770: Advanced VLSI Design (Agrawal)
I2R Power Loss Take Away: For a 100 mile long line carrying 1000 MW of energy @ 138 kV power loss = % @ 345 kV power loss = 4.2% @ 765 kV power loss = 1.1% to 0.5% Source: “American Electric Power Transmission Facts “, Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

30 I2R Power Loss on a Chip I2R Loss in On-Chip Power Distribution Network: Increasing Current Density Increasing Wire Resistivity Increasing I2R Loss Technology Scaling Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

31 ELEC 7770: Advanced VLSI Design (Agrawal)
Problem Statement Propose a scheme for delivering power to different parts of a large integrated circuit, such as cores on a system-on-chip (SoC), at a higher than the regular (VDD) voltage. The increase in voltage will lower the current on the grid, and thereby reduces the I2R loss in the on-chip power distribution network. Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

32 Typical Power Distribution Network
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

33 ELEC 7770: Advanced VLSI Design (Agrawal)
Proposed Power Distribution Network Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

34 Present Distribution Scheme
Example: Low-Voltage (VDD) Power Grid with 9 loads Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

35 Proposed Distribution Scheme
Example: High-Voltage (3V) Power Grid with 9 loads Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

36 Result: Low Voltage Distribution
Supply Voltage: 1V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) Number of Loads Load Power (W) Grid Power Total Power Efficiency (%) 1 0.13 1.13 88.50 4 0.67 4.67 85.65 9 1.69 10.69 84.19 16 3.57 19.57 81.76 25 7.02 32.02 78.08 64 23.76 87.76 72.93 100 49.32 149.32 66.97 256 169.4 425.4 60.18 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

37 Low Voltage PDN Power Transfer
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

38 Low Voltage PDN Efficiency
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

39 Result: High Voltage Distribution
Supply Voltage: 3 V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) DC-DC Converter: LTC 3411-A Linear Technology, 100% Efficiency Number of Loads Load Power (W) Grid Power (W) Total Power (W) H-V PDN Efficiency (%) 1 0.01 1.01 98.58 4 0.07 4.07 98.17 9 0.19 9.19 97.96 16 0.40 16.40 97.58 25 0.78 25.78 96.97 64 2.64 66.64 96.04 100 5.48 105.48 94.80 256 18.82 274.82 93.15 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

40 High Voltage PDN Power Transfer
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

41 High Voltage PDN Efficiency
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

42 Result: High Voltage Distribution
Supply Voltage: 3 V, Load: 1W Grid Resistances: 0.5 Ω (ITRS 2012) DC-DC Converter: LTC 3411-A Linear Technology, 80% Efficiency Number of Loads Load Power (W) Grid Power (W) Total Power (W) Efficiency (%) 1 0.02 1.02 98.04 4 0.11 4.11 97.32 9 0.39 9.39 95.85 16 1.21 17.21 92.97 25 2.68 27.68 90.32 64 9.12 73.12 87.53 100 18.97 118.97 84.05 256 63.3 319.3 80.18 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

43 High Voltage PDN Power Transfer
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

44 High Voltage PDN Efficiency
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

45 Comparing Grid Power Loss
Number of Loads Load Power (W) PDN Grid Power Loss (W) Low-Voltage PDN High-Voltage (100% Eff. Converter) (80% Eff. Converter) 1 0.13 0.01 0.02 4 0.67 0.07 0.11 9 1.69 0.19 0.39 16 3.57 0.40 1.21 25 7.02 0.78 2.68 64 23.76 2.64 9.12 100 49.32 5.48 18.97 256 169.40 18.82 63.3 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

46 Comparing Grid Power Loss
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

47 Comparing PDN Efficiency
Number of Loads Grid Efficiency (%) Low-Voltage PDN High-Voltage PDN (100% Eff. Converter) (80% Eff. Converter) 1 88.50 98.58 98.04 4 85.65 98.17 97.32 9 84.19 97.96 95.85 16 81.76 97.58 92.97 25 78.08 96.97 90.32 64 72.93 96.04 87.53 100 66.97 94.80 84.05 256 60.18 93.15 80.18 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

48 Comparing PDN Efficiencies
Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

49 ELEC 7770: Advanced VLSI Design (Agrawal)
Challenges DC-DC Converter Design: Efficiency Power Area Output Drive Capacity Fabrication Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

50 Reported Developments
Input Voltage: 3.3 V Output Voltage: 1.3 V – 1.6 V Output Drive Current: 26 mA Efficiency: 75% - 87% Input Voltage: 3.6 V & 5.4 V Output Voltage: 0.9 V Output Drive Current: 250 mA Efficiency: 87.8% & 79.6% Sources: B. Maity et al., Journal of Low Power Electronics 2012 V. Kursun et al., Multi-voltage CMOS Circuit Design. Wiley, 2006 Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

51 ELEC 7770: Advanced VLSI Design (Agrawal)
Future Work Have the capability of driving output loads of reasonable size Have power efficiency of 90% or higher Meet the tight area requirements of modern high-density ICs Be fabricated on chip as a part of the SoC Have ‘regulator’ capability to convert a range of input voltage to the designated output voltage DC-DC Converters Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)

52 ELEC 7770: Advanced VLSI Design (Agrawal)
References D. Chinnery and K. Keutzer, Closing the Power Gap Between ASIC and Custom: Tools and Techniques for Low Power Design. Springer, 2007. M. Keating, D. Flynn, R. Aitken, A. Gibbons, and K. Shi, Low Power Methodology Manual for System-on-Chip Design. Springer, 2007. V. Kursun and E. Friedman, Multivoltage CMOS Circuit Design. Wiley, 2006. C. Neau and K. Roy, "Optimal Body Bias Selection for Leakage Improvement and Process Compensation Over Different Technology Generations," Proc. International Symp. Low Power Electronics and Design, 2003, pp B. C. Paul, A. Agarwal, and K. Roy, "Low-Power Design Techniques for Scaled Technologies,“ Integration, the VLSI Journal, vol. 39, no. 2, pp , 2006. "Linear Technology: LT3411A DC-DC Converter Demo Nov M. Pedram and J. M. Rabaey, Power Aware Design Methodologies. Springer, 2002. M. Popovich, E. G. Friedman, M. Sotman, and A. Kolodny, “On-Chip Power Distribution Grids with Multiple Supply Voltages for High-Performance Integrated Circuits," IEEE Trans. Very Large Scale Integration (VLSI) Systems, vol. 16, no. 7, pp , 2008. Q. K. Zhu, Power Distribution Network Design for VLSI. Wiley-Interscience, 2004. Spring 2016, Mar ELEC 7770: Advanced VLSI Design (Agrawal)


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