TOPIC : Fault detection and fault redundancy UNIT 2 : Fault modeling Module 2.3 Fault redundancy and Fault collapsing.

Slides:



Advertisements
Similar presentations
IC TESTING.
Advertisements

Automatic Test Generation and Logic Optimization.
Chapter 3 Fault Modeling
Based on text by S. Mourad "Priciples of Electronic Systems" Digital Testing: Design Representation and Fault Detection
Fault Equivalence Number of fault sites in a Boolean gate circuit is = #PI + #gates + # (fanout branches) Fault equivalence: Two faults f1.
LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 Basic test concepts J. M. Martins.
TOPIC : Backtracking Methodology UNIT 3 : VLSI Testing Module 3.2: Arriving at Input Test Vector.
Partial Implications, etc.
Logic Simulation 4 Outline –Fault Simulation –Fault Models –Parallel Fault Simulation –Concurrent Fault Simulation Goal –Understand fault simulation problem.
6/11/2015A Fault-Independent etc…1 A Fault-Independent Transitive Closure Algorithm for Redundancy Identification Vishal J. Mehta Kunal K. Dave Vishwani.
Modern VLSI Design 2e: Chapter 4 Copyright  1998 Prentice Hall PTR Topics n Switch networks. n Combinational testing.
Dominance Fault Collapsing - Alok Doshi ELEC 7250 Spring 2004.
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 61 Design for Testability Theory and Practice Lecture 6: Combinational ATPG n ATPG problem n Example.
4/20/2006ELEC7250: Alexander 1 LOGIC SIMULATION AND FAULT DIAGNOSIS BY JINS DAVIS ALEXANDER ELEC 7250 PRESENTATION.
Logic Synthesis 5 Outline –Multi-Level Logic Optimization –Recursive Learning - HANNIBAL Goal –Understand recursive learning –Understand HANNIBAL algorithms.
Lecture 5 Fault Modeling
1 Lecture 10 Redundancy Removal Using ATPG n Redundancy identification n Redundancy removal Original slides copyright by Mike Bushnell and Vishwani Agrawal.
Leonardo da Vinci ALLEGRO © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 Basic test concepts J. M. Martins Ferreira FEUP / DEEC - Rua Dr.
Prof. John Nestor ECE Department Lafayette College Easton, Pennsylvania ECE VLSI Circuit Design Lecture 14 - Testing.
Sequential Testing Two choices n Make all flip-flops observable by putting them into a scan chain and using scan latches o Becomes combinational testing.
EE2174: Digital Logic and Lab Professor Shiyan Hu Department of Electrical and Computer Engineering Michigan Technological University CHAPTER 4 Technology.
TOPIC : Truth tables and Primitive Cubes
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 101 Lecture 10 Combinational ATPG and Logic Redundancy n Redundancy identification n Redundancy removal.
Silicon Programming--Physical Testing 1 Testing--physical faults: yield; s-a-0 and s-a-1 faults; justify and propagate.
Unit 8 Combinational Circuit Design and Simulation Using Gates Ku-Yaw Chang Assistant Professor, Department of Computer Science.
Boolean Algebra Dr. Bernard Chen Ph.D. University of Central Arkansas Spring 2009.
Software Testing Sudipto Ghosh CS 406 Fall 99 November 9, 1999.
Unit II Test Generation
VLSI Testing Lecture 7: Combinational ATPG
Modern VLSI Design 4e: Chapter 4 Copyright  2008 Wayne Wolf Topics n Switch networks. n Combinational testing.
Modern VLSI Design 3e: Chapter 5,6 Copyright  2002 Prentice Hall PTR Adapted by Yunsi Fei Topics n Sequential machine (§5.2, §5.3) n FSM construction.
Chapter 7. Testing of a digital circuit
False Path. Timing analysis problems We want to determine the true critical paths of a circuit in order to: –To determine the minimum cycle time that.
SiLab presentation on Reliable Computing Combinational Logic Soft Error Analysis and Protection Ali Ahmadi May 2008.
TOPIC : Introduction to Compression Techniques UNIT 5 : BIST and BIST Architectures Module 5.4 Compression Techniques.
Page 1EL/CCUT T.-C. Huang Mar TCH CCUT Introduction to IC Test Tsung-Chu Huang ( 黃宗柱 ) Department of Electronic Eng. Chong Chou Institute of Tech.
LOGIC GATES & BOOLEAN ALGEBRA
1 EG 32 Digital Electronics Thought for the day You learn from your mistakes..... So make as many as you can and you will eventually know everything.
KFUPM COE 202: Digital Logic Design Combinational Logic Part 1 Courtesy of Dr. Ahmad Almulhem.
EE434 ASIC & Digital Systems Partha Pande School of EECS Washington State University
An introduction to Fault Detection in Logic Circuits By Dr. Amin Danial Asham.
TOPIC : Controllability and Observability
TOPIC : Bridging faults
Testing of Synchronous Sequential Circuits By Dr. Amin Danial Asham.
Manufacture Testing of Digital Circuits
Jan. 26, 2001VLSI Test: Bushnell-Agrawal/Lecture 51 Lecture 5 Fault Modeling n Why model faults? n Some real defects in VLSI and PCB n Common fault models.
TOPIC : Introduction to Faults UNIT 2: Modeling and Simulation Module 1 : Logical faults due to physical faults.
Arithmetic-Logic Units. Logic Gates AND gate OR gate NOT gate.
ECE DIGITAL LOGIC LECTURE 8: BOOLEAN FUNCTIONS Assistant Prof. Fareena Saqib Florida Institute of Technology Spring 2016, 02/11/2016.
ECE 171 Digital Circuits Chapter 9 Hazards Herbert G. Mayer, PSU Status 2/21/2016 Copied with Permission from prof. Mark PSU ECE.
Boolean Algebra. BOOLEAN ALGEBRA Formal logic: In formal logic, a statement (proposition) is a declarative sentence that is either true(1) or false (0).
VLSI Testing Class Fault Modeling 李昆忠 Kuen-Jong Lee Dept. of Electrical Engineering National Cheng-Kung University Tainan, Taiwan.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 51 Lecture 5 Fault Modeling n Why model faults? n Some real defects in VLSI and PCB n Common fault.
TOPIC : Introduction to Sequential Circuits UNIT 1: Modeling and Simulation Module 4 : Modeling Sequential Circuits.
©2010 Cengage Learning SLIDES FOR CHAPTER 8 COMBINATIONAL CIRCUIT DESIGN AND SIMULATION USING GATES Click the mouse to move to the next page. Use the ESC.
Boolean Algebra.
Gate Circuits and Boolean Equations
Lecture 8 Combinational Network Design and Issues
Testing of Synchronous Sequential Circuits
Algorithms and representations Structural vs. functional test
VLSI Testing Lecture 7: Combinational ATPG
Automatic Test Generation for Combinational Circuits
CPE/EE 428, CPE 528 Testing Combinational Logic (2)
Fault Models, Fault Simulation and Test Generation
CPE/EE 428, CPE 528 Testing Combinational Logic (3)
VLSI Testing Lecture 7: Combinational ATPG
Automatic Test Pattern Generation
Topics Switch networks. Combinational testing..
ECE 352 Digital System Fundamentals
ELEC Digital Logic Circuits Fall 2015 Logic Testing (Chapter 12)
Presentation transcript:

TOPIC : Fault detection and fault redundancy UNIT 2 : Fault modeling Module 2.3 Fault redundancy and Fault collapsing

Fault detection Definition: A test vector ‘t’ detects a fault iff Z f (t) ≠ Z(t) Z(x) is the logic function of the healthy circuit and Z f (x) is the logic function of the faulty circuit. ‘x’ is the input vector. The circuit is tested by applying a sequence of test vectors T (t 1,t 2,…,t m ) and then comparing the output responses Z(t 1 ), Z(t 2 ), …,Z(t m ) with the expected output response i.e. output of the healthy circuit. Note: we will deal with combinational circuits only.

Contd … Assume OR bridging fault between B & C signal lines. In the healthy circuit ◦ Z1 = (A+B) ◦ Z2 = (B.C)’

Contd … In the faulty circuit ◦ Z1 f = A + (B+C) = (A+B+C) ◦ Z2 f = {(B+C).(B+C)}’ = (B+C)’ The test t(101) can detect this fault. For test t(101) ◦ Z1= 1, Z2 = 1 ◦ Z1 f = 1, Z2 f = 0 It can be observed that the output vector Z is 11 in the healthy circuit and is 10 in the faulty circuit. Since the outputs are different, this test vector can detect the above fault. Check whether the vectors 101, 110, 011, 111 can be used as test vectors.

Representing faulty value in the circuit At every node V/V f is noted down, where V is the value of the signal in the healthy circuit and V f is in the faulty circuit. At the faulty node, V and V f should be different to detect the fault In the previous example for test vector 101, the representation is:

Necessities to detect a fault To detect a fault with the given test ‘t’ ◦ Fault effect (fault generation), and ◦ Fault propagation, are necessary. Fault effect: At the site of fault, the test ‘t’ should create different V and V f values i.e. the test should generate an error. Fault propagation: The fault generated should be propagated to one of the primary outputs through at least one path between the fault site and primary output.

Fault Sensitization The test should be designed in such a way that it creates different V and V f values at the fault site and it propagates to one of the primary outputs. A line whose value in the test ‘t’ changes in the presence of the fault ‘f’ is said to be sensitized to the fault ‘f’ by test ‘t’. A path composed of sensitized lines is called a sensitized path.

Undetectable fault A fault ‘f’ is said to be undetectable if there exists no test ‘t’ that can detect the fault ‘f’. In this case Z f (x) = Z(x) and no test can activate ‘f’ and create a sensitized path to any primary output. A fault is said to be detectable if there exists a test that can detect the given fault. A complete test set may not be sufficient to detect all the detectable faults if an undetectable fault is present in the circuit.

Example Assume OR bridging fault between signal lines ‘y’ and ‘x’ Z = xy + x’z Z f = xy + yz + z’x = xy + zx’ => Z f = Z

How undetectable fault affects other faults Because of the undetectable stuck-at-1 at node ‘a’, fault stuck-at-0 at node ‘b’ cant be detected.

Redundancy A combinational circuit with an undetectable fault can be simplified by removing at least a gate or that gate input. For example, suppose if a stuck-at-1 fault at an input of n-input AND gate is undetectable, then that input can be removed. The circuit now reduces to (n-1) input AND gate. Similarly if a stuck-at-0 fault at an input of AND gate is undetectable, the gate can be replaced with a constant signal ‘0’.

Contd … A combinational circuit with an undetectable fault can be redundant. Redundancy is also possible, when a set of K lines are cut and M<K lines connect such that the output response function does not change. A combinational circuit in which all the faults are detectable is said to be irredundant circuit.

Triple Modular Redundancy(TMR) It is a fault tolerant design. Input is given to all the three systems and their outputs are given to the majority voter circuit M whose output response is the primary output. If any one of the three systems is faulty, the other two systems can mask it by using majority voter circuit M.

Need of un-wanted gates Output = ab + bc + a’c, which can be simplified to ab+a’c, which implies gate Y can be removed. If gate Y is removed, there will be a hazard when the input changes from 111 to 011, for an instance 0-pulse will appear. Note: The fault n stuck-at-0 is undetectable.