MNCF: Monthly Management Meeting Dr. Vijay Mishra 30 th Aug 2011.

Slides:



Advertisements
Similar presentations
ELECTRICAL, THERMAL AND MECHANICAL PROPERTIES OF RANDOM MIXTURES MATERIALS RESEARCH CENTRE DEPARTMENT OF MECHANICAL ENGINEERING UNIVERSITY OF BATH, UK.
Advertisements

Czech Technical University in Prague Faculty of Mechanical Engineering Department of Machining, Process Planning and Metrology prof. Ing. Jan Mádl, CSc.
Northwestern University H. D. Espinosa ME 495 Testing of MEMS Materials Using Thermal Actuation, AFM Image Correlation and Capacitance Measurement Students:
Submicron Probing Techniques Based on AFM Technology
Demonstration of Semiconducting Polymers for Microsprings Lilit Abramyan IMSURE Fellow Mentors: John LaRue (MAE) Richard Nelson (EECS)
SUGAR Tool for system-level MEMS simulation Goal: Be SPICE to the MEMS world Analyzes static, dynamic, and linearized steady-state behavior Challenges:
Computer Science, Software Engineering & Robotics Workshop, FGCU, April 27-28, 2012 Bayesian Belief Networks in Anomaly Detection, Fault Diagnosis & Failure.
1 Mobile Phone Testing using Impedance Tuners Roman Meierer and Steve Dudkiewicz Your Complete Measurement & Modeling Solutions Partner.
Micro and Nano Characterization Facility
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8363B.
Debabrata Goswami Chemistry & Center for Laser Technology IIT Kanpur
MNCF Equipment Usage Statistics Vijay 29 th November 2011.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - 1/f Noise Measurement Diagram GPIB.
Troubleshooting Tools Cable Performance Testers Voltage Event Recorders Butt Set Crossover Cable Tone Generator & Locator Multimeter Cable Continuity Tester.
1 MICE RF Daresbury Laboratory Support Joe Orrett - ASTeC.
Copyright © 2009 by Amatrol, Inc.
Noise Reduction Of Si x Ge 1-x and Si x Ge 1-x O y Bolometers by Forming Gas Passivation Mukti Rana and Donald Butler University of Texas at Arlington.
INTO DEEP ICE What does the future hold for Earth’s ice? (IEEE Spectrum | December 2005| NA) ECE 695 Alkesh Patel & Hemant Patel.
Journal Club 13 July 2011 Tuğrul Çağrı CİNKARA. MIT, mechanical engineering.
Slide # 1 ELCT 774: Advanced Semiconductor Characterization Dr. Goutam Koley Room 3A12, , Lecture Hours: Mon.
Generating Electricity. What Is Energy? Energy has many different forms. When an object is able to change its environment, we say the object has energy.
Slide # 1 ELCT 774: Advanced Semiconductor Characterization Dr. Goutam Koley Room 3A12, , Lecture Hours: Mon.
Current Electricity - Symbols Draw the symbol for each electrical device.
Micro and Nano Characterization Facility Girish Kunte June 10 th 2013.
Network Analyzers From Small Signal To Large Signal Measurements
MST-11 Class 100/10,000 Cleanroom User Facility Catherine Mombourquette Brian Crone
Micro and Nano Characterization Facility Girish Kunte July 1 st 2014.
NVNA Applications Loren Betts Component Test Division.
Micro and Nano Characterization Facility Girish Kunte October 28 th 2014.
AFM Analysis of Gallid Herpesvirus 1
Advances in rf Contactless Measurements in Pulsed Magnetic Field. Moaz Altarawneh FSU, NHMFL, LANL. Moaz Altarawneh FSU, NHMFL, LANL. Chuck Mielke LANL.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8364B.
Prof R T KennedyEMC & COMPLIANCE ENGINEERING 1 EET 422 EMC & COMPLIANCE ENGINEERING.
FNI 2A Tools1 Tools of Nanoscience Microscopy  Optical  Electron SEM TEM  Scanning Probe STM AFM NSOM Spectroscopy  Electromagnetic  Mass  Electron.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8361A.
1 ME 381R Lecture Semiconductor Devices and Thermal Issues Dr. Li Shi Department of Mechanical Engineering The University of Texas at Austin Austin,
Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.
CLIC workshop 2015 EXTRACTION KICKER STRIPLINE MEASUREMENTS C. Belver-Aguilar (IFIC) On behalf of: A. Faus-Golfe (IFIC), F. Toral (CIEMAT), M.J. Barnes.
MNCF: Monthly Management Meeting Dr. Vijay Mishra 26 th July 2011.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) GPIB.
FIELDS iPDR – RFS Analog Dennis N. Seitz 1 Solar Probe Plus FIELDS Instrument PDR Radio Frequency Spectrometer Analog Dennis N. Seitz UC Berkeley SSL
© ENGR-43_Prob_14-32_OpAmp_OutPut_Current.pptx 1 Bruce Mayer, PE Engineering-43 Electrical Circuits & Devices Bruce Mayer, PE.
LER workshop 2014 Update on the Extraction Kicker for CLIC DRs: Calibration Tests C. Belver-Aguilar (IFIC) On behalf of: A. Faus-Golfe (IFIC), F. Toral.
RECONFIGURABLE ANTENNA
Sections 3.1 and 3.2 DEVICES AND SYSTEMS THAT CONVERT ENERGY.
The Next Evolution In AFM Nanonics produces AFM/SPM systems with unique design for overcoming limitations of standard SPM system. Nanonics offers unique.
IC-CAP Modeling Configuration Agilent Technologies November 01, 2005 Page 1 Agilent IC-CAP Modeling Configuration - Block Diagram ( GHz) E8364B.
Presentation on. Presented by  The current which flows in only one direction is called DC current  Direct current is produced by such sources as batteries,
UOP ECT 246 Week 1 iLab Power Supplies Check this A+ tutorial guideline at supplies For.
9/6/2017 2:01 PM9/6/2017 2:01 PM9/6/2017 2:01 PM1 Restaurant Service A student in.
ESRDC Overview for Load Management
Graphene for Use in Energy Storage Systems
Electric Grid Technology Energy Storage Technology
E-beam Lithography for Optical Gratings and Waveguides
WaveJet 300A Series Manufacturers Test Equipment Components Trade-ins
Introduction to Electronics
Agilent IC-CAP Modeling Configuration - CV Measurement Block Diagram
COMPLEX ELECTRON ENERGY DISTRIBUTIONS IN ASYMMETRIC RF-DC DISCHARGES
Instrumentation Development Lab: facilities/resources
Antony D. Han Chem 750/7530 Feb 28th, 06
3D silicon package structure
רובוט 4X4 בעל עבירות גבוהה עם יכולת כיסוי שטח יעיל
9-4 Operations with Functions
آشکارسازهای مادون قرمز بر پایه گرافن سمینار درس کوانتوم الکترونیک
Device test stations Multi-probe electrical DC injection and optical input/output Near-field measurement Analogue characteristics 1) 50GHz Network analyzer,
Use your Journal to Name the Transformations
9-4 Operations with Functions
Energy.
Power Electronics: cooking up group IV semiconductor materials.
Types of Energy Chemical Solar.
Presentation transcript:

MNCF: Monthly Management Meeting Dr. Vijay Mishra 30 th Aug 2011

Electrical

Mechanical

Tools Update (any Issues) DC Probe Station 1 (PM5 with Thermal Chuck, Agilent Device Analyzer B1500A) DC Probe Station 2 (PM5, Agilent Device Analyzer B1500A with pulsed source 5 MHz) DC Probe Station 3 (PM8, Agilent Sem. Parametric Analyzer 4155C with pulsed source 1 MHz, 4284A for LFCV) DC Probe Station 4 (PM5, Agilent Impedence Analyzer 4294A for HFCV, 110 Mhz ) RF Probe Station and Network Analyzer AFM Agilent MSA-500 optical Profilometer FTIR_Nicolet 6700 – NXRFT Raman & PL (PSU coming back as replacements) Solar Simulator, QE measurement