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Micro and Nano Characterization Facility

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Presentation on theme: "Micro and Nano Characterization Facility"— Presentation transcript:

1 Micro and Nano Characterization Facility
Girish Kunte January 28th 2014

2 Agenda Equipment Usage Statistics MNCF – Updates

3 Instrument Usage Statistics – Electrical Lab

4 Instrument Usage Statistics – Mechanical Lab

5 Instrument Usage Statistics – Materials Lab

6 Instrument Usage Statistics – Optical Lab

7 MNCF – Updates Bruker AFM is working again and available for booking in both office & non-office hours Users to be monitored to ensure safe handling of AFM scanner head Engineer from Bruker to demonstrate various modes today and Wednesday Agilent 5500 Demo Instrument installed and open for booking Low-temperature probe station installed D33 Meter Installation scheduled for 3rd March 2014

8 Thank You!


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