General detectors. CCDs Charge Coupled Devices invented in the 1970s Sensitive to light from optical to X-rays In practice, best use in optical and X-rays.

Slides:



Advertisements
Similar presentations
Activity 1 : Introduction to CCDs.
Advertisements

6.1 Transistor Operation 6.2 The Junction FET
LECTURE- 5 CONTENTS  PHOTOCONDUCTING MATERIALS  CONSTRUCTION OF PHOTOCONDUCTING MATERIALS  APPLICATIONS OF PHOTOCONDUCTING MATERIALS.
Kamera CCD Astronomi (2) AS3100 Lab. Astronomi Dasar I Prodi Astronomi 2007/2008 B. Dermawan.
Spectral properties of array sensors Achim Gandorfer Tel. 397 room: S 2.82
Physics of Semiconductor Devices. Formation of PN - Junction When a P-type Semiconductor is joined together with an N-type Semiconductor a PN junction.
Cell and module construction. Photovoltaic effect and basic solar cell parameters To obtain a potential difference that may be used as a source of electrical.
Semiconductor Light Detectors ISAT 300 Foundations of Instrumentation and Measurement D. J. Lawrence Spring 1999.
Smart Grid Management CLIL4U LLP DK-KA2-KA2MP 1.
Energy Band View of Semiconductors Conductors, semiconductors, insulators: Why is it that when individual atoms get close together to form a solid – such.
Solar Cell Operation Key aim is to generate power by:
Photodiodes Photons incident on the depletion layer induce a current.
1 CCD RAIN (PHOTONS) BUCKETS (PIXELS) VERTICAL CONVEYOR BELTS (CCD COLUMNS) HORIZONTAL CONVEYOR BELT ( SERIAL REGISTER ) MEASURING CYLINDER (OUTPUT AMPLIFIER)
Transducers Converts one type of energy into another.
Imaging Science Fundamentals
Charge Coupled Device (CCD)
06/02/2008CCDs1 Charge Coupled Device M.Umar Javed M.Umar Javed.
Photomultiplier Tube m = k 8–19 dynodes (9-10 is most common).
1 Detectors RIT Course Number Lecture Single Element Detectors.
Photodiodes Ingle and Crouch, Spectrochemical Analysis Photons incident on the depletion layer induce a current. In most cases, best response in the NIR.
Basic Principles of CCD Imaging in Astronomy Based on Slides by Simon Tulloch available from
Chapter 4. MOS Systems Total 3 hours.. The Adventure of Carriers The description must now borrow a picture from the classical books of adventure. To place.
P and n type semiconductors. Semiconductors Semiconductors are also referred to as metalloids. Metalloids occur at the division between metals and non-metals.
Main detector types Scintillation Detector Spectrum.
April 23, 2008 Astro 890 Detectors Wide, High, Deep, and Sensitive.
PV Panels and P N Junctions How PV Panels work Or An Introduction to the World of Microelctronics.
Putting Electrons to Work Doping and Semiconductor Devices.
Unit-II Physics of Semiconductor Devices. Formation of PN Junction and working of PN junction. Energy Diagram of PN Diode, I-V Characteristics of PN Junction,
Electrochemistry for Engineers LECTURE 11 Lecturer: Dr. Brian Rosen Office: 128 Wolfson Office Hours: Sun 16:00.
1D or 2D array of photosensors can record optical images projected onto it by lens system. Individual photosensor in an imaging array is called pixel.
Lesson 23: Introduction to Solar Energy and Photo Cells ET 332a Dc Motors, Generators and Energy Conversion Devices 1Lesson a.pptx.
How CCDs work and why we do
Chapter 4 Photonic Sources.
Lecture 25: Semiconductors
Solar Cells 3 generations of solar cells:
1 Astronomical Observational Techniques and Instrumentation RIT Course Number Professor Don Figer CCDs.
Photon detection Visible or near-visible wavelengths
Diodes Diodes are components that allow current to flow in only one direction. They have a positive side and a negative side. The negative leg of a diode.
Image Area Edge of Silicon Serial Register Bus wires
Why silicon detectors? Main characteristics of silicon detectors: Small band gap (E g = 1.12 V)  good resolution in the deposited energy  3.6 eV of deposited.
1 Semiconductor Detectors  It may be that when this class is taught 10 years on, we may only study semiconductor detectors  In general, silicon provides.
CCDs : Current Developments Part 1 : Deep Depletion CCDs Improving the red response of CCDs. Part 2 : Low Light Level CCDs (LLLCCD) A new idea from Marconi.
Low Light Level CCDs (LLLCCD) A new idea from Marconi (EEV) to reduce or eliminate CCD read-out noise.
Basic Electronics By Asst Professor : Dhruba Shankar Ray For B.Sc. Electronics Ist Year 1.
Introduction to Optical Detectors: Plates, PMTs and CCDs Matt A. Wood Florida Institute of Technology Dept of Physics and Space Sciences.
Where have we been, what have we learned, what questions still prevail, where are we going? Review material, make lists, comment, isolate questions that.
10/26/20151 Observational Astrophysics I Astronomical detectors Kitchin pp
Detectors (UV-Vis) 1. Phototube 2. Photomultiplier Tube (PMT) 3. Si Photodiode 4. Photodiode Array (PDA) 5. Charge Coupled Device (CCD) 6. Charge Injection.
ECE 4339 L. Trombetta ECE 4339: Physical Principles of Solid State Devices Len Trombetta Summer 2007 Chapters 16-17: MOS Introduction and MOSFET Basics.
Development of CCDs for the SXI We have developed 2 different types of CCDs for the SXI in parallel.. *Advantage =>They are successfully employed for current.
ELECTRONIC PROPERTIES OF MATTER - Semi-conductors and the p-n junction -
1 Detectors RIT Course Number Lecture N: Lecture Title.
Sounds of Old Technology IB Assessment Statements Topic 14.2., Data Capture and Digital Imaging Using Charge-Coupled Devices (CCDs) Define capacitance.
Putting Electrons to Work Doping and Semiconductor Devices.
Introduction to Semiconductors
MOS Device Physics and Designs Chap. 3 Instructor: Pei-Wen Li Dept. of E. E. NCU 1 Chap 3. P-N junction  P-N junction Formation  Step PN Junction  Fermi.
Schottky Barrier Diode One semiconductor region of the pn junction diode can be replaced by a non-ohmic rectifying metal contact.A Schottky.
Optoelectronics.
1 Semiconductor Devices  Metal-semiconductor junction  Rectifier (Schottky contact or Schottky barrier)  Ohmic contact  p – n rectifier  Zener diode.
Metal-oxide-semiconductor field-effect transistors (MOSFETs) allow high density and low power dissipation. To reduce system cost and increase portability,
Cameras For Microscopy Ryan McGorty 26 March 2013.
The MOS capacitor. (a) Physical structure of an n+-Si/SiO2/p-Si MOS capacitor, and (b) cross section (c) The energy band diagram under charge neutrality.
Issued: May 5, 2010 Due: May 12, 2010 (at the start of class) Suggested reading: Kasap, Chapter 5, Sections Problems: Stanford University MatSci.
Band Theory of Electronic Structure in Solids
검출기 눈, 사진, Photoelectric device, Photomultipliers, Image intensifiers, Charged Coupled Device,
INTRODUCTION TO SEMICONDUCTORS
3/2003 Rev 1 II.3.5 – slide 1 of 23 IAEA Post Graduate Educational Course Radiation Protection and Safe Use of Radiation Sources Session II.3.5 Part IIQuantities.
Physics of Semiconductor Devices
Nonvolatile memories:
Physics of Semiconductor Devices Mr. Zeeshan Ali, Asst. Professor
Presentation transcript:

General detectors

CCDs Charge Coupled Devices invented in the 1970s Sensitive to light from optical to X-rays In practice, best use in optical and X-rays CCDs make use of silicon chips The CCD consists of (1) a p-type doped silicon substrate, (2) the charge storage (depletion) layer, which is covered by (3) a SiO2 insulating layer; upon this is (4) an array of closely spaced electrodes, which can be set to pre-defined voltage value

Si array p-type Si array n-type Also Sb,P Also Al,Ga

Electrons in a lattice do not have discrete energies. They form energy bands: Valence band Conduction band For semi-conductors, the Fermi level is just in the middle of the conduction and valence bands. At finite temperature, some electrons of the valence band can jump into the conduction band (current noise) E G (Si)=1.1 eV (IR), E G (Ge)=0.72 eV E G (C)=5.5 eV (insulator) Reminder of solid state physics photon Hole Electron (From

The pn junction

Forward-biased pn junction Reverse-biased pn junction

Transverse cut of CCD with buried channel Blecha (cours instrumentation) 4.1 eV 2.5 eV 1.8 eV 1.2 eV

The electrode has positive potential to attract the generated photoelectrons in a potential well The above MOS capacitor is 1 pixel

Front-illuminated CCDs p Incoming photons 625  m n They have a low Quantum Efficiency due to the reflection and absorption of light in the surface electrodes. Very poor blue response. The electrode structure prevents the use of an anti-reflective coating that would otherwise boost performance. Incoming photons 15  m n p Anti-reflective coating The QE can approach 100%. These thinned CCDs become transparent to near infra-red light and the red response is poor. Response can be boosted by the application of an anti- reflective coating on the thinned rear-side. These coatings do not work so well for front- illuminated CCDs due to the surface bumps created by the surface electrodes Courtesy of S. Tulloch

Quantum Efficiency Comparison The graph below compares the quantum of efficiency of a thick frontside illuminated CCD and a thin backside illuminated CCD. Courtesy of S. Tulloch

Back-illuminated CCDs Thinner deadlayers  higher low-E QE Thinner active region  lower high-E QE Increased noise, charge transfer inefficiency  higher FWHM BI CCD FI CCD From C. Grant, X-ray Astronomy School 2007

Structure of a CCD One pixel Channel stops to define the columns of the image Transparent horizontal electrodes to define the pixels vertically. Also used to transfer the charge during readout Plan View Cross section The diagram shows a small section (a few pixels) of the image area of a CCD. This pattern is reapeated. Electrode Insulating oxide n-type silicon p-type silicon Every third electrode is connected together. Bus wires running down the edge of the chip make the connection. The channel stops are formed from high concentrations of Boron in the silicon. Courtesy of S. Tulloch

RAIN (PHOTONS) BUCKETS (PIXELS) VERTICAL CONVEYOR BELTS (CCD COLUMNS) HORIZONTAL CONVEYOR BELT ( SERIAL REGISTER ) MEASURING CYLINDER (OUTPUT AMPLIFIER) CCD Analogy Courtesy of S. Tulloch

Exposure finished, buckets now contain samples of rain. Courtesy of S. Tulloch

Conveyor belt starts turning and transfers buckets. Rain collected on the vertical conveyor is tipped into buckets on the horizontal conveyor. Courtesy of S. Tulloch

Vertical conveyor stops. Horizontal conveyor starts up and tips each bucket in turn into the measuring cylinder. Courtesy of S. Tulloch

` After each bucket has been measured, the measuring cylinder is emptied, ready for the next bucket load. Courtesy of S. Tulloch

A new set of empty buckets is set up on the horizontal conveyor and the process is repeated. Courtesy of S. Tulloch

Eventually all the buckets have been measured, the CCD has been read out. Courtesy of S. Tulloch

pixel boundary Charge packet p-type silicon n-type silicon SiO2 Insulating layer Electrode Structure pixel boundary incoming photons Charge Collection in a CCD. Photons entering the CCD create electron-hole pairs. The electrons are then attracted towards the most positive potential in the device where they create ‘charge packets’. Each packet corresponds to one pixel Courtesy of S. Tulloch

Charge Transfer in a CCD 1. In the following few slides, the implementation of the ‘conveyor belts’ as actual electronic structures is explained. The charge is moved along these conveyor belts by modulating the voltages on the electrodes positioned on the surface of the CCD. In the following illustrations, electrodes colour coded red are held at a positive potential, those coloured black are held at a negative potential Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Time-slice shown in diagram Charge Transfer in a CCD 2. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 3. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 4. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 5. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 6. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 7. Charge packet from subsequent pixel enters from left as first pixel exits to the right. Courtesy of S. Tulloch

V 0V -5V +5V 0V -5V +5V 0V -5V Charge Transfer in a CCD 8. Courtesy of S. Tulloch

Photomultipliers Gain of From Bruker-AXS

Semi-conductor detectors See introduction on semiconductors in previous slides (conduction/valence bands) Gamma-ray interaction produces secondary electrons; they produce electron-hole pairs in the conduction/valence bands Electric field separates the pairs before recombination, drifting electrons to anode and holes to cathode. Charge is collected, which is proportional to energy deposited in detector Energy required to generate electron-hole pair is  =(14/5)E g +c, where 0.5≤c≤ eV Common detectors made of Ge (e.g., Integral SPI; E g =0.74 eV,  =2.98 eV), Si (  =3.61 eV), CdTe (Integral ISGRI; E g =1.6eV,  =4.43 eV)

Bolometer principles Sensitive to energy Not sensitive to ‘color’ Suited for almost ANY wavelength Particularly suited for IR and FIR to sub-mm (but cooling to mK required)

Bolometer priciples

Bolometers