AP-EMC in Singapore MAY 19-22, 2008 – - IC-EMC a Demonstration Freeware for Predicting Electromagnetic Compatibility of Integrated Circuits Alexandre BOYER, Etienne SICARD Asia-Pacific EMC-Week in Singapore, May 2008

AP-EMC in Singapore MAY 19-22, 2008 – - Credits  European project MEDEA+ “Parachute” ( )  European project PIDEA+ “EMCPack” ( )  National project EPEA (2007 – 2010)

AP-EMC in Singapore MAY 19-22, 2008 – EMC of IC issues 2. What is IC-EMC 3. IBIS interface 4. Emission Prediction 5. Near Field Prediction 6. Susceptibility Prediction 7. Conclusion Summary

AP-EMC in Singapore MAY 19-22, 2008 – DESIGN Architectural Design Design Entry Design Architect FABRICATION EMC compliant EMC Simulations Compliance ? GO NO GO Design Guidelines Tools Training 1. EMC of IC Issues IC-EMC EMC validated before fabrication

AP-EMC in Singapore MAY 19-22, 2008 – -  Developed within projects like MEDEA+ “Parachute” ( ), PIDEA+ EMCPack ( ), EPEA ( )  Promotes and defends the “European” vision of EMC of ICs  Trainings in industry and university Why is it free? Why is it non-confidential?  Standard-based tool : IBIS (IEC ), ICEM ( IEC ), ICIM (IEC ),  Integrated Circuit parameters & models from ITRS roadmap  Demonstrator for industrial 2. What is IC-EMC

AP-EMC in Singapore MAY 19-22, 2008 – -  A simple tool dedicated to predict EMC of ICs An electric circuit schematic editor An interface to WinSpice analog simulator A set of post-processing tools  A library of EMC/IC elements  A set of EMC-related goodies A demonstrator for predicting EMC of integrated circuits 2. What is IC-EMC

AP-EMC in Singapore MAY 19-22, 2008 – - IC, package and PCB model Basic symbols 2. What is IC-EMC Main analysis Spice Simulation Spectrum analysis Impedance simulation Near-field simulation Immunity simulation IBIS interface Post-processing tools Electric circuit schematic editor

AP-EMC in Singapore MAY 19-22, 2008 – IBIS Interface IBIS file editor Very important for :  I/O emission prediction  I/O immunity prediction Very important for :  I/O emission prediction  I/O immunity prediction I/O model display Package viewer I/O Buffer Information Specification file editor

AP-EMC in Singapore MAY 19-22, 2008 – IBIS Interface Package parasitic evaluation R, L, C extraction

AP-EMC in Singapore MAY 19-22, 2008 – -  Predict conducted mode, radiated and near-field emission  Non-confidential and based on standards (ICEM model – IEC )  Targeted range : 1 MHz – 10 GHz  Mature handling of emission prediction in IC-EMC Radiated emission GTEM Conducted emission 1/150  Near-field emission 4. Emission Prediction Target measurement methods (IEC 61967)

AP-EMC in Singapore MAY 19-22, 2008 – - Core Model Package Model Probe Model Test board Model Analog Time Domain Simulation Fourier Transform Compare dBµV vs. Frequency Fourier Transform Time-domain measure Frequency measurements 4. Emission Prediction Emission spectrum prediction Simulation Measurements

AP-EMC in Singapore MAY 19-22, 2008 – Emission Prediction ICEM model dBµV MHz Emission spectrum measurement simulation Emission spectrum analysis

AP-EMC in Singapore MAY 19-22, 2008 – - Lead Placement Core noise Model (ICEM) Package RLC R,L,C Time domain Simulation WinSPICE 5. Near-field Prediction Electrical schematic Fourier Transform of I(t) H[x,y,z] of I(f) IC-EMC Lead inductances IC size Pin location IBIS Measurements Near field scan at a given frequency and altitude Scan Measurement/Simulation Tuning

AP-EMC in Singapore MAY 19-22, 2008 – - ICEM model 5. Near-field Prediction 16 bit microcontroller Simulation Measurement

AP-EMC in Singapore MAY 19-22, 2008 – Susceptibility Prediction  Only for harmonic disturbances, not for transient immunity  Predict conducted, radiated mode and near-field susceptibility  Non-confidential and based on standards (IBIS, ICIM)  Targeted range : 1 MHz – 10 GHz Direct Power Injection Near-field Immunity Radiated immunity in GTEM Target measurement methods (IEC 62132)

AP-EMC in Singapore MAY 19-22, 2008 – Susceptibility Prediction Aggressed IC Model ( ICEM ) Package and IO model ( IBIS ) RFI and coupling path model ( Z(f) ) Set RFI frequency IC-EMC Increase V aggressor Time domain simulation WinSPICE Criterion analysis Extract forward power IC-EMC Increase RFI frequency Susceptibility threshold simulation Susceptibility simulation flow

AP-EMC in Singapore MAY 19-22, 2008 – - DPI on IO model 6. Susceptibility Prediction 16 bit microcontroller Susceptibility threshold simulation measurement simulation

AP-EMC in Singapore MAY 19-22, 2008 – -  An environment for EMC prediction at IC level and trainings has been developed  The tool is free and is based on standard  Conducted and radiated emission successfully predicted on several ICs  Conducted susceptibility successfully predicted on several ICs  Positive feedback from trainees concerning the tool usage for the illustration of EMC concepts (80 – 90 % satisfaction rate)  The demonstration tool and manual are online at 7. Conclusion

AP-EMC in Singapore MAY 19-22, 2008 – - Publications E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11, September-November 2005, Pages S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, Dec. 2005, E. Sicard, G. Peres "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits", proceedings of EMC Compo 05, Munich, Nov , 2005 E. Sicard, "IC-EMC, a software for analysing EMC of integrated circuits", 2005 IEEE EMC Symposium, 8-12 Navy Pier in Chicago, Computer demonstration session. A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor Susceptibility to Near-Field Aggression”, proceedings of the IEEE International Symposium on EMC, Hawaii, Jul A. Boyer, M. Fer, L. courau, E. Sicard, “Modeling of the Susceptibility of 90 nm Input Output Buffer”, Asia Pacific EMC Week in Singapore, May 2008