Sensors irradiated Calibration and Measurement at Genova A.Rovani, C.Gemme, A. Micelli 3D Irst test in Genova – June 30,2010 1

test pre-Irradiation Single chip tuned to have Threshold ~ 3200 e TOT(Q=20ke) = 60 BC Am Source scan to verify ToT tuning (0.5 Mhits, ~250 entries per pixel) Noise scan vs HV ID on WaferID FE-I3 Sensor TypeV_bd Irraggia mento Test after IRRAD E603 10e E-Genova E-1 10e15X E651 10e15X – TB, X E603 10e15X E605 10e E251 10e15X E603 10e15X – TB, X E655 10e15 A.Rovani, C.Gemme, A. Micelli – 3D Irst test in Genova – June 25,2010 2

Test after irradiation Test T ~ -20° C IV scan V nominal (Higher than before irradiaton) Threshold ~ 3200 e TOT(Q=20ke) = 60 BC Standard V nominal : Xtalk, Threshold, Monleak, ToT calib, Am Source scan Standard calibration repeated for a couple of other voltages settings Noise scan vs HV 3

General comments The bias Voltage required is obviously changed FE-I3 works fine also after the irradiation re-tuning is required The noisy pixels are so noisy that is necessary to disable the HIT bus and the preamplifier to run the source SCAN 4

Preliminary results: few examples 5 18 (2E – 1*10e15) 7 (3E – 1*10e15) IV SCAN before and after irradiation (T ~ -20°C)

6 3 (2E – 3*10e15) 16 (4E – 5*10e15) IV SCAN before and after irradiation (T ~ -20°C) Preliminary results: few examples

Noise increases after irradiation: Difference before and after irradiation Pixel masked 7

Preliminary results: few examples ToT calibration before and after irradiation: Calibration with Clow and Chigh differs a lot after irrad. 9 (3E – 3*10e15 - even if ToT re-tuning after irrad) 8 After irradPre irrad

Preliminary results: few examples ToT spectrum before and after irradiation 9 (3E – 3*10e15) 9 After irradPre irrad

Preliminary results: few examples 10 7 (3E – 1*10e15) 14 (4E – 3*10e15) Source SCAN after irradiation (TB sensors) After irrad

Preliminary results: few examples 11 3 (2E – 3*10e15) Noise vs HV after irradiation