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3E7_05151 wafer 11 IV curve Noise ~122e Source scans bad and

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Presentation on theme: "3E7_05151 wafer 11 IV curve Noise ~122e Source scans bad and"— Presentation transcript:

1

2 3E7_05151 wafer 11 IV curve Noise ~122e Source scans bad and
independent on HV (10,20,30V): Only few pixels work with the correct charge collection

3 noise Noise is too low for almost all the pixels.
The few that have higher noise than behave correctly in the source scan (see next) . To be checked systematically…

4 some pixels have the average at 30ToT Others to 5Tot
Average ToT per pixel some pixels have the average at 30ToT Others to 5Tot Many do not respond

5 A good channel… A bad one

6 It is not noise Only few pixels have hits and the spectra
is different.

7 In terms of charge

8 Very similar results for another device on the same wafer
Noise is completely independent on the HV (always 127e) See next for correlation noise/good channels

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10 3E7_06152 wafer 15 IV curve HV= 10V Noise ~230e

11 Noise Average noise 230 Distribution is reasonable

12 Hit map is more uniform

13 Average ToT Per pixel

14 And charge Pixel average (top) All hit entries bottom
(higher peak to be better understood if due to single pixels or not)

15 Another chip: 3e11_07152 wafer 15 10 V V


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