Kirk T McDonald, Princeton. M. Palm, CERN1 Hipot test of solenoid.

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Presentation transcript:

Kirk T McDonald, Princeton. M. Palm, CERN1 Hipot test of solenoid

Kirk T McDonald, Princeton. M. Palm, CERN 2 Description Measure resistance between different points (I/V measurement). Slight bending of the middle coil might cause leakage current. Equipment:  Power supply: Caen N470 Current monitor at μA accuracy  Current meter: Keithley 2001 Tens of nA Coil #1Coil #2Coil #3 “Shorting cable”Contact points

Kirk T McDonald, Princeton. M. Palm, CERN 3 Results With the “shorting cable” connected, a resistance of ~400 MOhm was measured at 800 V, compared to 0.4 Ohm for the coils. (Using the CAEN current monitor) Not alarmingly low (one billionth of the current leaks away), but: Removing the shorting cable and separating each coil by removing the jumpers gave significantly higher resistance: 30 GOhm or more. (The displayed values for Coil #1 are a lower limit.)

Kirk T McDonald, Princeton. M. Palm, CERN 4 Conclusions No significant leakage current detected in any isolated coil. Replace present shorting cable in final configuration. The maximum voltage used with the shorting cable disconnected was 250 V (Keithley restriction). A change in resistance might occur when increasing it, although these measurements show no decreasing trend towards higher voltage.