A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved LM80 Reliability data for STW8Q2PA

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 2 1. Number of LED Light Sources tested 20ea per test 2. Description of LED light sources PKG tested: TOP 5630 Series Part No. STW8Q2PA 3. Description of auxiliary equipment STW8Q2PA of the 5630 series are soldered to reliability board that can accommodate up to 20 devices. STW8Q2PA LEDs are connected in series strings of up to 20 devices and driven by constant current sources of three. Reliability boards are mounted in a reliability chamber that maintain constant thermal surrounding. The test boards are cyclically removed from the chamber for testing. Tester: integrating Cylinder, a computer-controlled x-y table, programmable current-source meter, and relay switching-matrix. STW8Q2PA is positioned next to the cylinder and driven by a constant current source. IV, forward current, chromaticity is measured for each TOP LEDs. 4. Operating cycle LEDs are driven with a constant DC Voltage. 5. Ambient conditions including airflow, temperature and relative humidity The case temperature within the chamber with minimal airflow was characterized by several thermocouples connecting to reliability board. Ambient temperature and the relative humidity was also characterized in the specified chambers. All test data were read after condition reached thermal equilibrium.

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 3 6. Case temperature (test point temperature) The thermal characterization results are summarized in the table below. 7. Drive Current of the LED light source during lifetime 8. Lumen maintenance data and forward current along with average value, standard deviation minimum and maximum lumen maintenance value for all of the LED light sources. See table. Required LM80 test temperature (Ts) Forward CurrentActual T a 25 ℃ 100 mA 13 ℃ 55 ℃ 100 mA 37 ℃ 85 ℃ 100 mA 71 ℃

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 4 Stress condition: Ts 25 ℃, 100mA Voltage data Stress condition: Ts 25 ℃, 100mA IV data Stress condition: Ts 25 ℃, 100mA Normalized IV data 0hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 5 Stress condition: Ts 55 ℃, 100mA Voltage data Stress condition: Ts 55 ℃, 100mA IV data Stress condition: Ts 55 ℃, 100mA Normalized IV data 0hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 6 Stress condition: Ts 85 ℃, 100mA Voltage data Stress condition: Ts 85 ℃, 100mA IV data Stress condition: Ts 85 ℃, 100mA Normalized IV data 0hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min hr1000hr2000hr3000hr4000hr5000hr6000hr Max Avg Min

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 7 9. Observation of LED light source failures including the failure conditions and time of failure. No failures occurred during these tests. 10. LED light source monitoring interval Tested at 0, 1000, 2000, 3000, 4000, 5000, 6000hr 11. Chromaticity shift reported over the measurement time. Stress condition: Ts 25 ℃, 100mA Chromaticity data 0 hr1000 hr2000 hr3000 hr4000 hr5000 hr6000 hr Initial ᇫ u' Max Avg Min Initial ᇫ v' Max Avg Min

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 8 Stress condition: Ts 55 ℃, 100mA Chromaticity data Stress condition: Ts 85 ℃, 100mA Chromaticity data 0 hr1000 hr2000 hr3000 hr4000 hr5000 hr6000 hr Initial ᇫ u' Max Avg Min Initial ᇫ v' Max Avg Min hr1000 hr2000 hr3000 hr4000 hr5000 hr6000 hr Initial ᇫ u' Max Avg Min v' ᇫ v' Max Avg Min