November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 1 Noise studies DESY + CERN TB overview Anne-Marie Magnan Imperial College London.

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Presentation transcript:

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 1 Noise studies DESY + CERN TB overview Anne-Marie Magnan Imperial College London

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 2 Method and Variables definition Will now look at, and per chip, and per PCB And then average per PCB in function of run number (= time dependance) Channel 0 Channel 1 Channel 0 Channel 1 Pedestal vs time Difference between 2 channels RMS = 8.44 Standard deviation for each channel pairs in x direction Standard deviation for each channel pairs in y direction RMS = 7.67 Difference between 2 channels Correct noise High noise “NORMAL” channel “NOISY” channel

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 3 Conclusion for DESY Roughly stable noise, with some stable noisy layers (from 1 to 30) : –Layer 5, PCB 8_C : ±3 ADC = ± 0.06 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. –Layer 7, PCB 4_C : ±3 ADC = ± 0.06 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. –Layer 8, PCB 5_C : ±6 ADC = ± 0.12 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. –Layer 10, PCB 12_C : ±1.5 ADC = ± 0.03 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. Added in digisim. Feedback welcome by the way !!

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 4 Results for CERN : August period Relatively stable in time, a few noisy layers as well, same or different from DESY one’s : –Layer 2, PCB 12_C : ±2.5 ADC = ± 0.05 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. –Layer 3, PCB 4_C : ±3 ADC = ± 0.06 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise. –Layer 15, PCB 18_C : ±3 ADC = ± 0.06 MIP correlated noise added to the standard 6 ADC = 0.12 MIP noise.

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 5 Results for CERN : October period Confused !! And really unstable in time st observation : more variations channel by channel 2nd observation : more variations between chips 3rd observation : the most important effect : pedestal unstabilities of up to ADC counts  > 0.5 MIP nEvt (25/bin) Ped vs Time, Run , slot 17, FE 5 (PCB 4_C, layer 2), chip 0

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 6 Results channel by channel

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 7 Average noise per run, over Aug and Oct data Layer 30 Layer 26 Layer 28 Layer 25 Layer 27 Layer 29 Layer 9 X-axis : run number (300XXX) Y-axis : noise (0-10)

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 8 Average noise per run, over Aug and Oct data (2) Layer 2 Layer 4 Layer 6 Layer 8 Layer 10 Layer12 Layer 14 Layer 16 X-axis : run number (300XXX) Y-axis : noise (0-10)

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 9 Average noise per run, over Aug and Oct data (3) Layer 18 Layer 20 Layer 22 Layer 24 Layer 1 Layer3 Layer 5 Layer 7 X-axis : run number (300XXX) Y-axis : noise (0-10) (0-40)

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 10 Average noise per run, over Aug and Oct data (4) Layer 11 Layer 13 Layer 15 Layer 17Layer19 Layer 21 Layer 23 X-axis : run number (300XXX) Y-axis : noise (0-10) (0-40)

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 11 Already corrected by Goetz ?? Goetz procedure as I understand it, currently in the Reco : 500 Pedestal events Pedestal per channel Signal events 1- substract pedestal previously calculated 2- Event by event : look at ADC values 3- Cut on S/N to discard signal cells 5- iterate until the mean is stable and the RMS is ~6 ADC counts on the negative side. 4- Calculate mean and RMS of the remaining events  This only works if there is enough channels without significant signal !!!

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 12 Preliminary conclusion Error finally from this procedure, due to rounding apparently (need to be check !) ~4%MIP Apply these 4%MIP remaining correlated noise to the MC, on top of the standard noise of ~6 ADC counts Need to study precisely the impact on MC And the real value in the data !!! Because if the correction is inducing that big an error, we should apply it only on the bad PCBs... It’s currently applied everywhere... Preliminary digisim steering files : will soon be released in CVS calice repositery, with the correlated noise before Goetz’s corrections. To compare with actual reconstructed data files : need to test with or without adding a 4%MIP correlated noise everywhere instead of the values of the correlated noise put by default in the steering files ??!? Note : digisim doesn’t release the position, as it’s not linked to the database.... Another good reason to have a common reconstruction code for DATA and MC ASAP !!!!!!!!!!!!!!!!!

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 13 MC impact of correlated noise

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 14 Layer 13

November 3rd, 2006 CALICE-UK, Manchester - A.-M. Magnan - 15 Layer 25