SEM monitors tests PSI February MeV protons

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Presentation transcript:

SEM monitors tests PSI 17..19 February 2006 62 MeV protons Previously irradiated standard SEM PSI New SEM with grounded plates around ceramics C II F type SEM with no ceramics between HV and SIGNAL F type

F type BLM_S

F type BLM_S

Ceram II (CII)

BLM_S Geant4 Simulation Secondary Emission Yield 0. 057 e-/primary @ 1 BLM_S Geant4 Simulation Secondary Emission Yield 0.057 e-/primary @ 1.3GeV

SEM Foil Geant4 Simulation Secondary Emission Yield 0 SEM Foil Geant4 Simulation Secondary Emission Yield 0.017 e-/primary @ 1.3GeV From Calibration: 0.036! e-/primary @ 450 GeV

HV scan F Type Transverse with 1cm collimator 7e8p+/s/cm2

BLM_S Linearity from May 06 in PSB (1 point per bunch)

Simultaneous measurement with SEM and ACEM (SEM directly in the beam)

Transient effect when changing HV in transverse position – effect on the CERAMICS?

19 FEB 2006 F SEM COLLIMATOR position scan

19 FEB 2006 F SEM HV scan with Cu collimator

Ceram II Beam on Connectors shielding removed

F Type Beam on connectors HV Beam I Beam II F Type Beam on connectors 80pA/cm2 16pA/cm2

Attempt to calculate SEY from Bethe Bloch