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LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 Basic test concepts J. M. Martins.

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Presentation on theme: "LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 Basic test concepts J. M. Martins."— Presentation transcript:

1 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)1 Basic test concepts J. M. Martins Ferreira FEUP / DEEC - Rua dos Bragas 4050-123 Porto - PORTUGAL Tel. 351-22-2041748 / Fax: 351-22-2003610 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf)

2 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)2 Objectives To emphasise the importance of testing in the overall product development cycle To introduce the basic concepts in testing and design for testability To prepare the student to understand in detail the standard boundary scan test architecture

3 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)3 Outline Fault modeling and ss@ faults Controllability, observability and testability Test vector generation for combinational circuits Testability and test generation in sequential circuits Testability improvement via ad hoc solutions Structured approaches to design for testability

4 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)4 The importance of testing No testing, no manufacturing Cost of testing is very high, but the cost of defective testing strategies is even higher Available test standards A brief historical perspective

5 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)5 Why fault models? Possible physical defects are too many and defect spectrum too wide Effective test strategies require that the complexity of considering possible malfunction causes is reduced to an acceptable level Fault models are an abstract representation of defective circuit conditions (a fault is at logic level, a defect is at physical level)

6 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)6 Attributes of a good fault model Simplicity, to allow efficient test vector generation procedures Defect coverage, to guarantee that the percentage of defective components escaping detection is acceptably low

7 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)7 The single stuck-at fault model A structural fault model assuming that –Only one node at a time is faulty –Only two types of faults: s@0 and s@1 Experience has shown that the ss@ fault model has excellent characteristics concerning the attributes previously referred

8 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)8 Controllability of a node

9 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)9 Problems due to low controllability Low controllability leads to difficult test vector generation, since: –Our first step to detect a given s@ fault in a node consists of driving it to a logic value that is the opposite of the fault –In an IC, the value at any node can only be controlled from the input pins (the primary inputs of the circuit) Low observability, as we shall see, has a similar effect

10 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)10 Observability of a node

11 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)11 Testability Testability is a combined measure of controllability and observability High testability facilitates test vector generation and leads to better test effectiveness So, why aren’t all circuits highly testable?

12 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)12 The D-notation Used in the test vector generation D-algorithm, introduced by Paul Roth in the mid-60s D is a composite logic value that results from driving a s@0 node to 1 (and /D its dual)

13 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)13 The D-algorithm Drive the node to a logic value that is the opposite of the fault ( 0 if s@1 and 1 if s@0) Propagate the error signal (D or /D) to a primary output Justify (backwards) the values that enable the propagation path, until a necessary combination at the primary inputs (a test vector) is found

14 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)14 A test generation example

15 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)15 The case of undetectable faults

16 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)16 Backtracking

17 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)17 Test generation for sequential circuits Direct application of the D-algorithm leads to the combinational block inputs and outputs, not necessarily to primary inputs or outputs

18 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)18 Test generation - step 1

19 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)19 Test generation - step 2

20 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)20 Test generation - step 3

21 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)21 The complexity of the general case is however much higher, because... The D-algorithm does not necessarily lead to circuit primary inputs and outputs Knowledge of the circuit state transition diagram is required The fault may indeed affect the state transition diagram, in which case the determination of the required sequence at the circuit primary inputs becomes even more difficult

22 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)22 Take the example of Y s@0...

23 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)23 Ad hoc testability improvements Design rules or amendments to avoid or minimise test vector generation problems Major drawbacks: –Not always reusable –Testability depends largely on the type of circuit

24 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)24 Some ad hoc testability rules Split counters to avoid high numbers of clock cycles until the required output combination is achieved Include reset and preset lines (synchronous or asynchronous) Partition large circuits and add extra inputs and outputs for direct controllability and observability of internal nodes

25 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)25 Structured Design for Testability (DfT) methodologies The objective of structured DfT methodologies is to enable a simple way to drive the circuit to any given state in a fixed (and short ) number of clock cycles Does structured DfT have drawbacks? –Design rules (or rather a design style ) have to accepted –Additional silicon area, more pins and higher propagation delays… but is this an additional cost?

26 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)26 The scan design principle The scan design principle consists of inserting a 2:1 multiplexer between the input of every D flip-flop and its driving logic

27 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)27 Advantages of scan design (1) Problem : Part of the combinational circuitry inputs are not directly controllable, since they come from the D-FF outputs (these nodes define the circuit present state) Solution : The scan flip-flops shown in figure 1.9 enable direct controllability of the D-FF outputs through a simple procedure with a fixed number of clock cycles

28 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)28 Better controllability through scan design (1)

29 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)29 Better controllability through scan design (2)

30 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)30 Better controllability through scan design (3)

31 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)31 Better controllability through scan design (4)

32 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)32 Better controllability through scan design (5)

33 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)33 Advantages of scan design (2) Problem : Part of the combinational circuitry outputs are not directly observable, since they go to the D-FF inputs (these nodes define the circuit next state) Solution : The scan flip-flops shown in figure 1.9 enable direct observability of the D-FF inputs through a simple procedure with a fixed number of clock cycles

34 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)34 Better observability through scan design (1)

35 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)35 Better observability through scan design (2)

36 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)36 Better observability through scan design (3)

37 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)37 Better observability through scan design (4)

38 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)38 Better observability through scan design (5)

39 LEONARDO INSIGHT II / TAP-MM ASTEP - Basic Test Concepts © J. M. Martins Ferreira - University of Porto (FEUP / DEEC)39 DfT: Eventually an overhead The 2:1 multiplexers increase the propagation delay and required additional silicon area and more pins, but this does not necessarily mean higher cost Benefits due to easier test vector generation and application are difficult to quantify Design freedom was traded for higher testability, but partial scan design might be a preferred intermediate solution

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