1. OPENING NEW FRONTIERS FOR TEST SM Galaxy Examinator: GEX The ultra fast, easy to use solution for: Data analysis Characterization Yield optimization Test Data Report Generation …over 1,000 happy users worldwide!

2. OPENING NEW FRONTIERS FOR TEST SM What users say about GEX! Speed –I'm amazed of its speed –What used to take me up to 10 hours, I was able to gather, analyze, and put together in 20 minutes! Ease of use –Performs correlation studies the most easily –Does data conversion in the most universal format: HTML, which is great for communication purposes Quality standards, Support –It’s more robust than a $45K SPC package we've evaluated! –Excellent support, excellent solution Cost –Pricing is a real treat!

3. OPENING NEW FRONTIERS FOR TEST SM Why Users love GEX ? NO training required Using a Web style interface, users click links and navigate…no menus! You’ll wonder why only Galaxy makes software that easy to use! One click…one HTML report, easily integrate to PowerPoint or Word! GEX makes you save time! No database query or complex setup: you tell which data to process (STDF, ATDF, WAT,…), and GEX generates a complete HTML report organized in sections, ready to email/share. Your time is valuable, GEX boosts your productivity. Ultra fast Time is money, we make you work faster and better. It only takes seconds to process your data and give you the HTML report you need. A complete report with test statistics, histograms and wafer maps takes 10 seconds if not less! Unbeatable pricing policy GEX typically costs less than $3 / day…yes you can smile!

4. OPENING NEW FRONTIERS FOR TEST SM GEX vs. other solutions Check the market…this is what you’ll learn about other solutions: They are Expensive They are Complex to master, require training…and you’ll never remember all its menus and options. They are slow…or very slow They require a database which makes data sharing with other companies / groups more difficult

5. OPENING NEW FRONTIERS FOR TEST SM Typical GEX reports Only GEX gives you that much…in a mouse click: Statistics tables Histograms to check process drifts Pareto for root cause analysis Trend charts Correlation analysis, wafer maps And much more…

6. OPENING NEW FRONTIERS FOR TEST SM GEX fact sheet Overall : Software supports: Windows, Sun Solaris and HP-UX Instant Reports in HTML or Excel (CSV) formats Ultra fast data analysis engine: forget your coffee break! No database size limitation: supports any size of test data (STDF, ATDF,WAT…) Available in Standalone (CPU license) and Server (floating license) modes. Reports you can create: Global information: tester, lot, operator information,… Yield information: good parts, failing parts, parts retested, rejected,… Test summary: Cp,Cpk, mean, sigma, drifts,… Test histogram, Wafer map (see all dies tested, time info,... ) Parametric test wafer map (see test gradient, ideal for analyzing process problems) Parametric Trend charts, Correlation reports and charts! Pareto reports: Cp,Cpk of tests, test failures, binning Datalog (raw test results) Interactive data analysis: Guard banding of test limits is now a snap! Scripting language available…And much more. Get your 10 days free evaluation today! Visit: www.galaxysemi.com