1. Front end Hybrid Industrial Tester UCL Louvain (L. Bonnet, V. Lemaître, X. Rouby) vincent. lemaitre@fynu.ucl.ac.be Vincent Lemaitre tracker week 29.01.03 http://www.fynu.ucl.ac.be/themes/he/cms/activities/tracker/hybrids.html In collaboration with RWTH Aachen (M. Axer, F. Beissel, T. Franke, J. Mnich) IRES Strasbourg (JD. Berst, P. Graehling, P.Juillot, C. Maazouzi)

2. Current measurements Comparisons between FHIT & ARC & CMS-like : FHIT ARC This problem is solved : FEH needs more current when triggered FHIT does not send triggers while measuring current consumption whereas ARC and CMS-like system do

3. Electrical Test: limits These limits can be resized with a multiplicative parameter, common for all limit values (available in configuration file). I 125 one APV biasedV min [42 ; 78 ] mA V nom [48 ; 84 ] mA V max [52 ; 88 ] mA I 250 one APV biasedV min [220 ; 320 ] mA V nom [300 ; 400 ] mA V max [320 ; 420 ] mA From statistics on FHIT measurements intervals = [m-3s; m+3s] where m is the mean of distribution and s the RMS

4. Functional Test: limits Mux testmaximal height255.0 ADC (Mux output signal height) minimal height200.0 ADC minimal difference5.0 ADC Pedestal testnumber of events1000 cut window (20 % around the mean) 20.0 ADC Noise testnumber of eventsSame data as pedestal test cut window (around the mean) 20.0 ADC minimal noise cut0.2 ADC maximal noise cut1.5 ADC Gain testminimal threshold20.0 ADC These are the ARCS parameter All these limits are accessible in the configuration file

5. FHITS 1.3 New : version 1.3 (updated interface, as asked by industry) Display the # of good and bad hybrids of the current day All part-numbers accepted 1663  1674 (new firmware)

6. Conversion to XML conversion to XML : direct contact with CERN people to fit to their wishes C – routine being written in Louvain ; not necessary @ industry proposed scenario production and tests @ industry ( logfile creation ) delivery @ CERN of hybrids and logfiles (on CD-R) 1 delivery = # FEH + 1 CD (+ copies) tests @ CERN (with FHIT  logfile creation) creation of XML files (by running the C – routine) @ CERN transfer to database

7. Number of FHIT set-ups Laboratory Presently In Addition With ARC in CERN 1 mono-FHITYes Industry 1 (CT) 1 dual-FHITNo Industry 2 (1 dual-FHIT) Yes Strasbourg 1 mono + 1 dual Yes Aachen 1 mono-FHITYes Louvain 1 mono + 1 dualYes Spares 2 dual-FHITYes/No TOTAL 5 boxes + 8 PCBs 3 add. ARC boards

8. Test procedure NAISNAIS NAISNAIS ERNIERNI ERNIERNI SAMTECSAMTEC SAMTECSAMTEC FHIT To be tested @ Industry @ CERN Industry 1:Naked hybrids (w/o APVs) Industry 2:Hybrids Before bonding pitch adapter  LINK to DB (XML) Test setup

9. Mechanics New mechanics :- Easier to handle -Insure thermal contact (“cooling”) -Probe for test of bias return line Cooling contact Fine positioning plugs Hybrid Heavy cover with auto-retractile probe Pad on hybrid for test of bias return line

10. Summary Difference between set-ups for Current Measurement is understood First estimate of Limits for ET and FT have been evaluate (to be continued) Most recent release of software distributed (FHITS 1.3) -improved display -all part number included (firmware) Agreed procedure for loading FHIT data into DB (almost operational) Proposal for the number of FHIT set up Test procedure including thermal contact of hybrid and test of bias return line.