1. Production Status 39 modules produced
28 of which have been tested at both 250 & 550 V
Of those 28 modules, 10 modules have entire chips with >2x regular noise
All have a larger bias current than expected from sensor probing
The four modules that have been visually scanned have no obvious sensor damage.
To reduce the noise of chip to normal values, 9-15 wire bonds have to be removed.
666

2. Module 869
Module 869
Modules with as little as 2 mA extra bias current relative to sensor probing data have exhibited extremely large noise.
Module 869 shows increased noise on first chip at ~425 V. Other chips have had increasing noise starting at V.

3. Noise Vs. Voltage
~1-2 channels per module have increasing noise with bias voltage
In most cases, sensor flaws can be seen optically
We are concerned that these channels may be less extreme examples of same problem
It is NOT clear how these modules will change with time, radiation damage, and temperature.