1. Front end Hybrid Industrial Tester
UCL Louvain (L. Bonnet, V. Lemaître, X. Rouby)
In collaboration with
RWTH Aachen (M. Axer, F. Beissel, T. Franke, J. Mnich)
IRES Strasbourg (JD. Berst, P. Graehling, P.Juillot, C. Maazouzi)
Vincent Lemaitre tracker week

2. Current measurements ARC FHIT
Comparisons between FHIT & ARC & CMS-like :
FHIT does not send triggers while measuring current consumption whereas ARC and CMS-like system do
ARC
FHIT
This problem is solved : FEH needs more current when triggered

3. Electrical Test: limits
From statistics on FHIT measurements
intervals = [m-3s; m+3s] where m is the mean of distribution and s the RMS
I125 one APV biased
Vmin
[42 ; 78 ] mA
Vnom
[48 ; 84 ] mA
Vmax
[52 ; 88 ] mA
I250 one APV biased
[220 ; 320 ] mA
[300 ; 400 ] mA
[320 ; 420 ] mA
These limits can be resized with a multiplicative parameter, common for all limit values (available in configuration file).

4. Functional Test: limits
Mux test
maximal height
255.0 ADC
(Mux output signal height)
minimal height
200.0 ADC
minimal difference
5.0 ADC
Pedestal test
number of events
1000
cut window (20 % around the mean)
20.0 ADC
Noise test
Same data as pedestal test
cut window (around the mean)
minimal noise cut
0.2 ADC
maximal noise cut
1.5 ADC
Gain test
minimal threshold
These are the ARCS parameter
All these limits are accessible in the configuration file

5. FHITS 1.3 New : version 1.3 (updated interface, as asked by industry)
Display the # of good and bad hybrids of the current day
All part-numbers accepted 1663  1674 (new firmware)

6. Conversion to XML
conversion to XML : direct contact with CERN people to fit to their wishes
C – routine being written in Louvain ; not industry
proposed scenario
production and industry ( logfile creation )
CERN of hybrids and logfiles (on CD-R)
1 delivery = # FEH + 1 CD (+ copies)
CERN (with FHIT  logfile creation)
creation of XML files (by running the C – CERN
transfer to database

7. Number of FHIT set-ups Laboratory Presently In Addition With ARC in
CERN
1 mono-FHIT
Yes
Industry 1 (CT)
1 dual-FHIT No
Industry 2
(1 dual-FHIT)
Strasbourg
1 mono + 1 dual
Aachen
Louvain
Spares
2 dual-FHIT
Yes/No
TOTAL
5 boxes + 8 PCBs
3 add. ARC boards

8. Test procedure @ Industry @ CERN To be tested Test setupA M T E C S A M T E C N A I S N A I S E R N I E R N I
FHIT
To be tested
Test setup
Industry 1: Naked hybrids (w/o APVs)
Industry 2: Hybrids
Before bonding pitch adapter  LINK to DB (XML)
@ Industry
@ CERN

9. Mechanics New mechanics : -Easier to handle
-Insure thermal contact (“cooling”)
-Probe for test of bias return line
Heavy cover with auto-retractile probe
Pad on hybrid for test of bias return line
Hybrid
Fine positioning plugs
Cooling contact

10. Summary
Difference between set-ups for Current Measurement is understood
First estimate of Limits for ET and FT have been evaluate (to be continued)
Most recent release of software distributed (FHITS 1.3) -improved display -all part number included (firmware)
Agreed procedure for loading FHIT data into DB (almost operational)
Proposal for the number of FHIT set up
Test procedure including thermal contact of hybrid and test of bias return line.