1. Status Update of IEEE CS Test Technology Technical Council
Yervant Zorian
TTTC Senior Leadership Board

2. Objectives Source of state of the art test technology
Emerging test standards
Novel information sharing forums
Network of design & test professionals
Address next test technology challenges
All activities concentrate in a single community and a single organization

3. TTTC Chair 1st Vice-Chair Technical Meetings Group
Technical Activities Group
Asia & Pacific Group
Tutorials & Education Group
Standards Group
Communi-cation Group
Standing Committee Group
2nd Vice-Chair
Europe Group
Past Chair
Technical Meeting Review
Committee
TAC # 1
Programs
IEEE
Booth
Awards
TAC # 2
New initiatives
IEEE P1149.4
Database & Member.
Bylaws
Senior Leadership
TM # 1
Latin America Group
ITC Gen Chair
Organiza-tion
IEEE P1149.5
Electronic Broadcast
History
TM # 2
IEEE
1450
Marketing
Nomina-tion
D&T EIC
North America Group
IEEE
1500
Planner
Students
Secretary
TAC # 13
News-letters
Finance
TAC # 14
TM # n
Social Media

4. Technical Meeting Group
Portfolio of different Technical Meetings developed over many years by dedicated volunteers worldwide
Addresses range of industrial challenges
Generally – successful and viable
Technically, Financially , Culturally and geographically
Different types of technical meetings
Regional/Geographical (wide topics) – ATS, ETS, LATW
Topical (focused technical topic or small group of topics) - Board Test Workshop
Wide-scoped (technical and geographical) --- ITC, VTS
Maturity
Range of maturities
Range from several decades to born this year!

5. TTTC Technical Meetings
EWDTS
DDECS
ETS
IDT
DELTA
ATS
LATW

6. Topical Proliferation
Product Life Cycle
Field
IOLT
Factory
DfM&Y
Design
HLDVT
Core
SoC
SiP
System
STD
1149
Die
Board
1149.1
btw
Levels of
Integration
Analog
Memory
MTDT
3DIC
Processor
MTV
Technology

7. Two Achievement Awards
TTTC Most Successful Technical Meeting Award
TTTC Most Populous Technical Meeting Award
Seventh time to be presented at VTS 2012

8. TTTC Sponsored Most Successful Technical Meeting
3D-Test (Anaheim, Nov. 2011)
2nd IEEE Int’l Workshop on Testing Three-Dimensional Stacked Integrated Circuits)
Chairs:
Yervant Zorian, Synopsys;
Erik Jan Marinissen, IMEC;
Said Hamdioui, Delft University

9. TTTC Sponsored Most Populous Technical Meeting
20th ATS (Asian Test Symposium 2011, New Delhi, India)
Chairs:
A. Chatterjee, Georgia Tech
A. Patra, IIT Kharagpur
S. Kundu, U Mass
S. Ravi, Texas Instruments

10. TTTC Best Doctoral Dissertation
Most impactful PhD thesis
Selected by panel of industrial judges
Award held at VTS for 5 years
Expand international participation
Two step selection process
Multi-site selection for semi-finalists
Single-site selection for finalist

11. TTTC Best Doctoral Dissertation
Award in honor of:
Prof. Edward J. McCluskey
Long time test educator
Director CRC Stanford Univ.
1st President of IEEE CS
2002 Recipient of TTTC Lifetime Contribution Award

12. Gerald W. Gordon Award
Award in honor of longtime ITC volunteer, Gerald Gordon
Award presented to student
with interest in test
who has done volunteer work for the test community
Sponsored by ITC, TTTC, IEEE Philadelphia Section

13. TTTC Lifetime Contribution Medal
Outstanding Technical Contribution
Fundamental Impact on Test Technology
Granted Annually
Presented at a Major TTTC Event
Featured in IEEE Design & Test
Call for Nominations (June 30, 2012)

14. Past Recipients E. Eichelberger A. d’Arbeloff E.J. McCluskey J. Mucha
R. Tulloss
P. H. Bardell
T.W. Williams
J. H. Arabian
M. Mahoney

15. Looking Forward Source of state of the art test technology
3D designs, nanoscale technology, ….
Emerging test standards
Modern network of test professionals
Novel information sharing forums
Contribute to its multitude of forums