1 CPC2-CPR2 Assemblies Testing Status Charge Amplifiers –Attempts to make them work Best voltage single channel 2MHz Cluster finding first.

Slides:

Advertisements

Similar presentations

Digital to Analog and Analog to Digital Conversion

Advertisements

Analog Comparator Positive input chooses bet. PB2 and Bandgap Reference. Negative input chooses bet. PB3 and the 8 inputs of the A/D. ACME= Analog Comparator.

Analogue to Digital Conversion

TileCal Electronics A Status Report J. Pilcher 17-Sept-1998.

1 VLPC system and Cosmic Ray test results M. Ellis Daresbury Tracker Meeting 30 th August 2005.

Status of Oxford Setup Matthew Chalk, Erik Devetak, Johan Fopma, Brian Hawes, Ben Jeffery, Nikhil Kundu, Andrei Nomerotski University of Oxford ( 18 August.

Jianchun (JC) Wang, 08/21/99 RICH Electronics and DAQ Chip Carrier Short Cable Transition Board Long Cable Data Board Crate J.C.Wang Syracuse University.

PH4705/ET4305: A/D: Analogue to Digital Conversion

ECAL electronics Guido Haefeli, Lausanne PEBS meeting 10.Jan

ITOP carrier amplifier test at Indiana University G. Visser 4/27/2015 (latest update) I use the recently (here) characterized JT0947 ch3 as input source.

Low Cost TDC Using FPGA Logic Cell Delay Jinyuan Wu, Z. Shi For CKM Collaboration Jan

Performance of SPIROC chips in SKIROC mode

Mark Raymond /10/051 Trip-t testing brief status report test setup description - hardware and software some very early results.

12/Dec/2012SBS-Meeting1 of 24 Status of the Front Tracker GEM and INFN Electronics 2013 – Feb – 20 SBS Weekly Meeting GEM Assembling SRS – INFN Electronics.

Digital to Analogue Converter

SIGMA-DELTA ADC SD16_A Sigma-Delta ADC Shruthi Sujendra.

AIDA FEE64 development report August 2010 Progress after Texas CAD work Manufacturing 25th August

Updates on GEMs characterization with APV electronics K. Gnanvo, N. Liyanage, K. Saenboonruang.

7 Nov 2007Paul Dauncey1 Test results from Imperial Basic tests Source tests Firmware status Jamie Ballin, Paul Dauncey, Anne-Marie Magnan, Matt Noy Imperial.

AHCAL electronics. Status and Outlook Peter Göttlicher for the AHCAL developers CALICE meeting UT Arlington, March 11th, 2010.

1 CPC2-CPR2 Assemblies Testing Status Tim Woolliscroft.

SCT Week -CERN- September 23, Defective ASIC’s A. Ciocio - LBNL.

Development of an ASIC for reading out CCDS at the vertex detector of the International Linear Collider Presenter: Peter Murray ASIC Design Group Science.

Preliminary Results of the Beetle Readout for the MaPMTs  Part 1: as presented on  Achievements since last LHCb week  Common Mode correction.

Calorimeter upgrade meeting – Phone Conference– May 5 th 2010 First prototyping run Upgrade of the front end electronics of the LHCb calorimeter.

1 Konstantin Stefanov, CCLRC Rutherford Appleton Laboratory 1 ECFA 2006, Valencia LCFI Status Report: Vertex Detector R&D Konstantin Stefanov CCLRC Rutherford.

July 19, 2006VLCW-06 Vancouver1 Scint/MAPMT Muon Prototype Operation Robert Abrams Indiana University.

NUMI Off Axis NUMI Off Axis Workshop Workshop Argonne Meeting Electronics for RPCs Gary Drake, Charlie Nelson Apr. 25, 2003 p. 1.

FPCCD option Yasuhiro Sugimoto 2012/5/24 ILD 1.

MOKE RESULTS JM micron square pads 50nm Ni/ C10-dithiol / 20nm Co Line scan across Pad

LCFI meeting 19 th August 2008 TESTING OF CPR2A Mirek Havranek, Peter Murray, Konstantin Stefanov, Stephen Thomas.

NIKHEF –D0 meeting, June 6, 2001 Freya Blekman, NIKHEF Amsterdam SMT pedestal management Weekly NIKHEF – NIJMEGEN – D0 meeting June 6, 2001 Freya Blekman.

Noise and Cosmics in the DHCAL José Repond Argonne National Laboratory CALICE Collaboration Meeting University Hassan II Casablanca, Morocco September.

ASIC Activities for the PANDA GSI Peter Wieczorek.

LC Power Distribution & Pulsing Workshop, May 2011 Super-ALTRO Demonstrator Test Results LC Power Distribution & Pulsing Workshop, May nd November.

A. Dorokhov, IPHC, Strasbourg, France 1 Description of pixel designs in Mimosa22 Andrei Dorokhov Institut Pluridisciplinaire Hubert Curien (IPHC) Strasbourg,

Quality control for large volume production GEM detectors Christopher Armaingaud On behalf of the collaboration GEMs for CMS.

1 Electronics Status Trigger and DAQ run successfully in RUN2006 for the first time Trigger communication to DRS boards via trigger bus Trigger firmware.

F Don Lincoln, Fermilab f Fermilab/Boeing Test Results for HiSTE-VI Don Lincoln Fermi National Accelerator Laboratory.

11 October 2002Paul Dauncey - CDR Introduction1 CDR Introduction and Overview Paul Dauncey Imperial College London.

The InGaAs IR Array of Chunghwa Telecom Laboratory Chueh-Jen Lin and Shiang-Yu Wang, Optics and Infrared Laboratory In 2006, Advanced Technology Laboratory.

SuperKEKB 3nd open meeting July 7-9, 2009 Hans-Günther Moser MPI für Physik Sensor and ASIC R&D Sensor Prototype Production: running, ASICs: Switcher,

Status of MAPMT FEE Electronics Boards Connector board – have 5 boards, 1 assembled Readout board (“MUX” board) – layout completed 12/2, but unfortunately.

AIDA: test plots Davide Braga Steve Thomas ASIC Design Group 22 September 2009.

1 Konstantin Stefanov, Rutherford Appleton Laboratory 1 LCWS2007 Progress with the CPCCD and the ISIS Konstantin Stefanov Rutherford Appleton Laboratory.

1 Konstantin Stefanov, STFC Rutherford Appleton Laboratory 1 Vertex 2007, Lake Placid A CCD Based Vertex Detector Konstantin Stefanov STFC Rutherford Appleton.

ASIC Development for Vertex Detector ’07 6/14 Y. Takubo (Tohoku university)

STATUS OF TESTING CPR2A Mirek Havranek, Peter Murray, Konstantin Stefanov, Steve Thomas LCFI meeting 20 th June 2008.

G.F. Tassielli - SuperB Workshop XI LNF1/11 02/12/2009 Status report on CLUster COUnting activities G. F. Tassielli on behalf of CLUCOU group SuperB Workshop.

Laser Measurements (as comparison to test beam data) Florian Lütticke University of Bonn 9 th VXD Belle 2 Workshop Valencia,

LECC2003: The 96 Chann FED Tester: Greg Iles30 September The 96 channel FED Tester Outline: (1) Background (2) Requirements of the FED Tester (3)

PHOTOTUBE SCANNING SETUP AT THE UNIVERSITY OF MARYLAND Doug Roberts U of Maryland, College Park.

Clear Performance and Demonstration of a novel Clear Concept for DEPFET Active Pixel Sensors Stefan Rummel Max-Planck-Institut für Physik – Halbleiterlabor.

Andrei Nomerotski 1 Andrei Nomerotski, University of Oxford for LCFI collaboration LCWS2008, 17 November 2008 Column Parallel CCD and Raw Charge Storage.

1 Run on 25. October. 2 Full-size DCD Price: at least 32 k€ Return: April 201  Less test possibilities Full-size chip Wire-bondable DCD Price: 6.75 k€

Analog Comparator An analog comparator is available on pins PE2(AIN0), PE3(AIN1) The comparator operates like any other comparator. -when (+) exceeds (-)

Functional diagram of the ASD

R&D activity dedicated to the VFE of the Si-W Ecal

First Testbeam results

LCFI Status Report: Sensors for the ILC

Muon Recording Studies and Progress for the MICE Tracker

Status of the Front Tracker GEM

VELO readout On detector electronics Off detector electronics to DAQ

Status of n-XYTER read-out chain at GSI

STATUS OF SKIROC and ECAL FE PCB

University of California Los Angeles

Status of Phase Feedforward Tests

BESIII EMC electronics

The CMS Tracking Readout and Front End Driver Testing

Verify chip performance

Presentation transcript:

1 CPC2-CPR2 Assemblies Testing Status Charge Amplifiers –Attempts to make them work Best voltage single channel 2MHz Cluster finding first results Planning

2 Charge Amps No success yet Spent hours with Steve and Peter on Thursday –Setup system so hits are clearly visible on voltage channel analogue output –Monitor charge channel analogue output –Some noise due ADC code conversion, can be removed. –Change in noise patterns with variation of the relative chip grounds, still no signals –Still some behaviour to be understood, some explained Keep thinking and trying –Only one channel of one device tested, statistics are low.

3 Best 2MHz Noise in e- stays similar until signal is half that of the edge. Gain dependant on position in the array, noise is amplified too. Slight reduction in noise when cluster finder clocks are off. (No plot sorry) ADC 240 ADC 197

4 Cluster finder tests Its possible to test cluster finder! Although some channels always flag data for readout, multiplexer only visits them once each cycle. Its possible to “sneak” data through from good channels, if careful with occupancy. Junk data is hidden (due to garbled timestamp) Edge of chip Fe55 Peak Noise Peak

5 Examples

6

7

8

9 Accumulated data

10 Remove channel pedestals

11 Plans One more week of testing with MB4.4s –Second assembly –Go fast as possible (commercial driver limited) –Sort out charge channels –Improve some results, lots of data! Make way for MB5.0 –Come back high speed testing when driver chip can be used