Engr 1182.03 College of Engineering Engineering Education Innovation Center Engr 1182 Nano Pre-Lab Demolding Rev: 20XXMMDD, InitialsPresentation Short.

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Presentation transcript:

Engr College of Engineering Engineering Education Innovation Center Engr 1182 Nano Pre-Lab Demolding Rev: 20XXMMDD, InitialsPresentation Short Title1

Engr Micro/Nanotechnology Tools One of the challenges of nanotechnology is the limitation of tools available to allow us to “see” into this microscopic world. Rev: 20XXMMDD, InitialsPresentation Short Title2

Engr Wavelengths vs. Features Size Rev: 20XXMMDD, InitialsPresentation Short Title3 The wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats. The smaller the wavelength of the wave the higher the energy of the wave Wavelength in meters Nanotechnology

Engr Microscopes An optical microscope that uses visible light through lenses can magnify up to 1,500 times! A microscope that uses a beam of electrons instead of light can “magnify” millions of times! Why the difference? Rev: 20XXMMDD, InitialsPresentation Short Title4

Engr Resolution The resolution of an image is limited by the effects of diffraction (Bending of Light). A good rule of thumb: an imaging system is able to resolve features to approximately half the wavelength of “wave” used Therefore, the smaller the wavelength the higher the resolution of the microscope Rev: 20XXMMDD, InitialsPresentation Short Title5

Engr Microscopy using non-light wavelengths To obtain higher resolution than optical microscopes, imaging devices using other types of waves have been developed such as electron beam. Rev: 20XXMMDD, InitialsPresentation Short Title6

Engr Rev: 20XXMMDD, InitialsPresentation Short Title7 Scanning Electron Microscope An electron beam is focused and scanned across a specimen and then scattered electrons are detected. Those scattered electrons carry the image information. Resolution is ~ 5 nm Focusing Scanning Scattered electrons

Engr Cecropia Moth Rev: 20XXMMDD, InitialsPresentation Short Title8

Engr A close-up of the Cecropia Moth scale using a Scanning Electron Microscope – Note scale of 1 micron Rev: 20XXMMDD, InitialsPresentation Short Title9

Engr Scanning Probe Microscopes The family of scanning probe microscopes uses no lenses, but rather a probe that “interacts” with the sample surface. Some examples are: –Scanning Tunneling Microscope (STM) –Atomic Force Microscopy (AFM) Rev: 20XXMMDD, InitialsPresentation Short Title10