FLUKA Rechnungen für das CBM Experiment an FAIR Anna Senger FAIR@GSI, CBM Detektoren

Outlook FLUKA tool and radiation environment predictions The CBM experiment FLUKA calculations for the CBM detector development Conclusions FLUKA "The FLUKA code: Description and benchmarking" G. Battistoni, S. Muraro, P.R. Sala, F. Cerutti, A. Ferrari, S. Roesler, A. Fasso`, J. Ranft, Proceedings of the Hadronic Shower Simulation Workshop 2006, Fermilab 6--8 September 2006, M. Albrow, R. Raja eds., AIP Conference Proceeding 896, 31-49, (2007) "FLUKA: a multi-particle transport code" A. Fasso`, A. Ferrari, J. Ranft, and P.R. Sala, CERN-2005-10 (2005), INFN/TC_05/11, SLAC-R-773 FLAIR V.Vlachoudis "FLAIR: A Powerful But User Friendly Graphical Interface For FLUKA“ Proc. Int. Conf. on Mathematics, Computational Methods & Reactor Physics (M&C 2009), Saratoga Springs, New York, 2009

FLUKA www.fluka.org FLUKA is a general purpose tool for calculations of particle transport and interactions with matter, covering an extended range of applications spanning from proton and electron accelerator shielding to target design, calorimetry, activation, dosimetry, detector design, Accelerator Driven Systems, cosmic rays, neutrino physics, radiotherapy etc. Transport limits: Secondary particles Primary particles charged hadrons 1 keV-20 TeV * 100 keV-20 TeV * ** neutrons thermal-20 TeV * thermal-20 TeV * antineutrons 1 keV-20 TeV * 10 MeV-20 TeV * muons 1 keV-1000 TeV 100 keV-1000 TeV ** electrons 1 keV-1000 TeV 70 keV-1000 TeV (low-Z materials) ** 150 keV-1000 TeV (high-Z materials) ** photons 100 eV-1000 TeV 1 keV-10000 TeV heavy ions <10000 TeV/n <10000 TeV/n * upper limit 10 PeV with the DPMJET interface ** lower limit 10 keV in single scattering mode thermal ~ 10-5 eV

MATERIAL CAUSE RADIATION EFFECT Radiation Effects MATERIAL CAUSE RADIATION EFFECT Semiconductors Electron-hole pair dose ionization Photon interaction photon absorption Lattice displacement nuclear collision Polymers Main and side chain rupture dose ionization cross-linking degradation dose ionization gas evolution, radical production dose rate Ceramics Lattice displacements nuclear collision trapped charge carriers dose ionization color centers dose ionization Metals Lattice displacements nuclear collision nuclear reactions producing clusters nuclear collision voids and bubbles nuclear collision

Radiation environment during the experiments Dose in shielded areas (where the electronics is usually located) is mainly due to neutrons (and associated photons) Dose and neutron fluxes have a very close correlation Cumulative damage comes from Energy deposition (ionizing dose) Lattice displacement (1-MeV n equivalent particle fluxes) Stochastic failures can occur (SEU) and are mostly due to “high” energy hadrons (“E>20 MeV”) No safe limit exists, only a risk level can be determined Risk level for commercial electronics is poorly known and varies by orders of magnitude between different devices and series Only a combination of the following can assure safe operation: Simulation studies of related radiation levels (Dose, 1MeV, 20MeV) Careful selection and testing of required electronics Shielding and displacement considerations

Radiation Effects microscopic effect (detectors) Displacement Damage. Hadrons can interact and cause significant damage to the crystal lattice. The amount and type of damage depends on the particle type and energy. The damage is usually quantified by the amount of Non-Ionizing Energy Loss Ionizing Radiation is of high energy, capable to penetrate in the matter, to produce ionization of the atoms and to break chemical bonds. macroscopic effect (electronics)

CBM experiment @ FAIR STS MuCh TRD ToF PSD MVD + STS RICH TRD ToF ECAL Experimental tasks and detector systems tracking, momentum determination, vertex reconstruction: silicon pixel/strip detectors (MVD+STS) in a magnetic dipole field hadron identification: Time-of-Flight (ToF) measurements lepton identification: Muon detection system, RICH, TRD and ECAL for electrons (alternative measurements) determination of collision centrality and event plane: projectile spectator detector (PSD) high speed DAQ and online event selection STS MuCh TRD ToF PSD MVD + STS RICH TRD ToF ECAL PSD Experimental and technical challenges high multiplicities (up to 1000 particles per reaction) high reaction rates (up to 10 MHz)

FLUKA CBM geometry CBM @ SIS300 full setup CBM @ SIS100 start version side view TRD ToF CBM @ SIS300 full setup vacuum beam pipe MVD + STS PSD RICH FLAIR side view CBM @ SIS100 start version ToF TRD MVD + STS PSD He bags RICH FLAIR

CAVE Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 vacuum CBM @ SIS100: Au+Au @ 10 GeV/u, 109 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 109 Au/s Non-Ionizing Energy Loss (NIEL) neq/cm2/2months side view vacuum beam pipe CBM @ SIS300 side view CBM @ SIS100 He bags

CAVE Ionizing dose CBM @ SIS300 CBM @ SIS100 vacuum beam pipe He bags CBM @ SIS100: Au+Au @ 10 GeV/u, 109 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 109 Au/s Ionizing dose Gy/2months side view vacuum beam pipe CBM @ SIS300 side view CBM @ SIS100 He bags

MVD Ionizing dose CBM @ SIS300 CBM @ SIS100 5 cm 10 cm 15 cm CBM @ SIS100: Au+Au @ 10 GeV/u, 107 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 107 Au/s Ionizing dose 5 cm 10 cm 15 cm Gy/2months CBM @ SIS300  10 cm  18.6 cm  22.8 cm CBM @ SIS100

MVD Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 5 cm CBM @ SIS100: Au+Au @ 10 GeV/u, 107 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 107 Au/s Non-Ionizing Energy Loss (NIEL) 5 cm 10 cm 15 cm neq/cm2/2months CBM @ SIS300  10 cm  18.6 cm  22.8 cm CBM @ SIS100

STS Ionizing dose CBM @ SIS300 CBM @ SIS100 30 cm 100 cm CBM @ SIS100: Au+Au @ 10 GeV/u, 107 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 107 Au/s Ionizing dose 30 cm 100 cm Gy/2months CBM @ SIS300 48  40 cm2 96  100 cm2 CBM @ SIS100 electronics

STS Non-Ionizing Energy Loss (NIEL) CBM @ SIS300 CBM @ SIS100 30 cm CBM @ SIS100: Au+Au @ 10 GeV/u, 107 Au/s CBM @ SIS300: Au+Au @ 35 GeV/u, 107 Au/s Non-Ionizing Energy Loss (NIEL) 30 cm 100 cm neq/cm2/2months CBM @ SIS300 48  40 cm2 96  100 cm2 CBM @ SIS100 electronics

Detector damages 1014 n/cm2 104 Gy

live time without/mild damages Conclusions estimated CBM detector live time (only for hot regions) detectors beam intensity (s-1) live time without/mild damages MVD 107 6 months * STS 109 10 months * RICH 2 years ** MuCh 6 months ** TRD ToF PSD 108 1 year ** * sensitive to the NIEL ** sensitive to the ionizing dose