ScECAL Fermilab Beam Test analysis ScECAL Group Meeting Kyungpook National University, Daegu, Republic of Korea, August 6 th, 2010 Adil Khan, Satoru Uozumi,

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Presentation transcript:

ScECAL Fermilab Beam Test analysis ScECAL Group Meeting Kyungpook National University, Daegu, Republic of Korea, August 6 th, 2010 Adil Khan, Satoru Uozumi, DongHee Kim

MIP Calibration MIP Calibration Constant DataEntriesMeanRMS Low Temp Runs High Temp Runs Mip Const

Mip Response MappingMip constant Correlation

Mean value of each Energy Point Run#Energy PointMeanSigma GeV GeV GeV GeV GeV GeV

Energy Vs Correlated Temperature 3Gev6Gev12Gev 16Gev 25Gev 32Gev

Xprofile of Correlated Temp vs Energy 3Gev6Gev 12Gev16Gev 25Gev32Gev P0: P1: P0: P1: P0: P1: P0: P1: P0: P1: P0: P1:

BackUp

Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run Run list for Moun 32 Gev 2009 data Only the circled one are good runs Bad Runs LowTemp Runs HighTemp Runs

9 Fitting all the channels Using Gaussian Convoluted-Landau Function MuonRun 32GeV, Layer1 Mip Distribution of High Temp Runs Mip Distribution of Low Temp Runs

10 Chi2/NDF Result from Fitting Chi2/ndf of High Temp Runs Chi2/ndf of Low Temp Runs

MIP Selection Muon Event Recorded in Online Monitor Strip =j Layer x !=i Event selection Example: For X-Layer i, Strip j →Check a hit of the strip j on other X-layers excepting i.(total 14 layers)‏ MIP event Hit Definition: ADC >ADC ped + 3σ ped Fitting MIP Distribution Gaussian convoluted landau distribution function