© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics ECE 340 Lecture 35 MOS Field-Effect Transistor (MOSFET) The MOSFET is an MOS capacitor with Source/Drain.

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Presentation transcript:

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics ECE 340 Lecture 35 MOS Field-Effect Transistor (MOSFET) The MOSFET is an MOS capacitor with Source/Drain terminals How does it work?  Gate voltage (V GS ) controls mobile charge sheet under _______________  Source-drain voltage (V DS ) sweeps the mobile charge away, creating ____________ (I D ) Desired characteristics (remember water faucet analogy):  “On” current __________________  “Off” current___________________ 1

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics First MOSFET patents: Julius Lilienfeld (early 1930s) This invalidated most of Bardeen, Brattain and Shockley’s transistor patent claims in the late 1940s! But the MOSFET did not work in practice until the 1960s. Why? 2

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics A modern “n-type” MOSFET (N-MOSFET): How does it work?  If V G = 0, any current between source-drain (I D )?  If V G > 0 what happens (assume source grounded, V S = 0)  If V GS >> 0 and V DS > 0 what happens? 3

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Typical 2-D cross-section view of the N-MOSFET: Note direction of carrier flow, and of current flow Gate voltage (V GS ) controls Source-to-Drain current (I D ) “Source” terminal refers to source of _____________ 4 IDID V GS IDID

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Theory of the MOSFET (*here N-MOSFET):  When V GS < V T the channel is _________________  When V GS > V T the channel is _________________  If small drain voltage (V DS > 0) is applied __________ Will charge sheet move by drift or diffusion? Current ≈ width X charge sheet X velocity What is the inversion charge: |Q inv | ≈ What is the drift velocity: v ≈ 5

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics At low V DS, the inversion layer essentially acts like a resistor! What about higher drain voltages V DS ? Must take into account variation of potential along channel, 0 < V x < V DS. So inversion layer charge at any point is |Q inv (x)| = C i (V GS – V T – V x ) And the current is: I DS,lin = Still linear in V GS voltage! This is the linear region. When V DS = V GS – V T the channel becomes _____________ 6

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics When V DS > V GS - V T the un-inverted (drain depletion) region increases, as does the ____________________ Any increase in V DS :  Reduces the amount of inversion charge, but…  Increases the lateral field (charge velocity) The two effects cancel each other out, so at high V DS the drain current is no longer a function of V DS ! The current saturates to a value only dependent on V GS (i.e. charge). Putting in V DS = V GS – V T (the pinch-off, i.e. saturation condition) in the previous equation: 7

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Plot and label an example N-MOSFET: What about I DS vs. V GS ? 8 Z d ox VTVT

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Back to the physical picture, why does I D vs. V DS saturate? Why is this desirable?  Voltage gain, dV DS /dI D because small changes in I D cause large swings in V DS 9

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics What is the “effective mobility” μ eff in the MOSFET channel? Can we look it up in the bulk-silicon charts? Scattering mechanisms affecting mobility in channel:  Charged impurity (Coulomb) scattering  Lattice vibration (phonon) scattering  Surface roughness scattering 10

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Analog applications: Small-Signal MOSFET model Of all elements in the model… C GS ~ C i and g m (transconductance dI D /dV GS ) are essential, the rest are parasitics which must be reduced Note that a lot of elements are voltage-dependent, e.g. depletion capacitances vary with depletion widths and voltage 11 ECE 340 Lecture 36 MOSFET Analog Amplifier and Digital Inverter

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Drain current: Conductance parameters: See ECE 342, ECE output conductance transconductance At low frequency At high frequency

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Cutoff frequency f max = frequency where MOSFET no longer amplifies input (gate) signal Obtained by considering high-freq. small-signal model with output shorted, finding freq. where |i out /i in | = 1 Something we already knew qualitatively  higher MOSFET operating frequency achieved by decreasing channel length L, increasing mobility μ eff Smaller = faster for devices (though parasitics play a big role in realistic circuits) 13

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Logic applications: CMOS inverter Key property: signal regeneration – returns logic outputs (0 or 1=V + =V DD ) even in presence of noise Complementary MOS (CMOS) inverter

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics Qualitative operation:  When V in = 0  V out = NFET is ________ PFET is __________  When V in = V DD  V out = NFET is ________ PFET is __________ Other key property of CMOS inverter: no power consumption while idling in either logic state (only while switching) Consider PFET as “load” to NFET: Note “rail-to-rail” logic levels 0 and V DD Want transition voltage V DD /2, but usually L p = L n which means choose Z p /Z n ≈ 2 because μ n ≈ 2μ p (for Si) * 15 *what about other materials?

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics A quick look at CMOS power dissipation Energy consumed while charging capacitive load: E P = _______ C L is discharged through NFET  E N = _________ Total energy dissipated per clock cycle: E = C L V DD 2 Frequency f cycles per second  active power P = fC L V DD 2 This is very important: fundamental trade-off between speed (f) and power dissipation. Reducing voltage and parasitic C’s is a must to keep power low at higher speeds. 16

© 2012 Eric Pop, UIUCECE 340: Semiconductor Electronics In reality, there is also passive power (leakage) dissipated by the FETs supposed to be “off”: P off = I leak V DD I off ~ I on /1000 in modern technology per transistor But this can become a headache when you have 100s of millions of “sleeping” transistors (i.e. “passive power” vs. “active power”)! 17 Ex: see IBM journal of Research & Dev.